Jeol Ltd.

Other

Tohoku University

Shimadzu Corporation

Japan Science and Technology Agency

National Institute for Materials Science

Japan Atomic Energy Agency

National Institutes for Quantum and Radiological Science and Technology

Masami Terauchi

Toshikazu Honda

Michiyoshi Tanaka

Hideyuki Takahashi

Katsushige Tsuno

Kenji Tsuda

Toshikatsu Kaneyama

Takanori Murano

Hiroyuki Sasai

Masato Koike

Nobuo Handa

Satoshi Kameoka

Takashi Imazono

An-Pang Tsai

Shogo Koshiya

To cover a wide wavelength bandwidth, a spectroscopic apparatus uses three varied line spacing concave diffraction gratings Gto G, the corresponding energy ranges for G, G, and Gbeing 50 to 200, 155 to 350, and 300 to 2200 eV, respectively. In the respective wavelength ranges, the diffraction conditions are satisfied. To provide a high throughput and a high resolution in the respective wavelength regions, the incident angles &#x3b1;to &#x3b1;for Gto Gmeasured from the normal line of the diffraction grating are specified to be &#x3b1;&#x3c;&#x3b1;&#x3c;&#x3b1;. Presupposing the normal lines of all diffraction gratings are superposed upon a common normal line, in order to meet &#x3b1;&#x3c;&#x3b1;&#x3c;&#x3b1;, the center positions &#x394;to &#x394;for Gto Gare set on the normal line (as &#x394;&#x3c;&#x394;&#x3c;&#x394;). From Gto G, one diffraction grating can be selected.

Spectroscopic apparatus

An X-ray detection system has an electron beam irradiation portion, a diffraction grating, a splitter for distributing the direction of propagation of the diffracted X-rays such that an imaging plane for the diffracted X-rays is assigned to plural positions spaced apart in a direction perpendicular to the direction of energy dispersion of the diffracted X-rays, and image sensors different in energy sensitivity disposed respectively at the positions to which the imaging plane is assigned.

X-ray detection system

A method of manufacturing a copper-based catalyst having high activity and superior heat resistance and a catalyst used for steam reforming of methanol has Al alloy particles each having an oxide surface layer containing fine copper oxide particles. The Al alloy particles are produced by leaching Al alloy particles with an aqueous solution. The Al alloy particles are prepared by pulverizing a bulky Al alloy having a quasicrystalline phase, the quasicrystalline phase being represented by the formula AlCuTM(where y is 10 to 30 atomic percent, z is 5 to 20 atomic percent, and TM indicates at least one of transition metals other than Cu). In the catalyst, the oxide surface layer containing fine copper oxide particles is formed by adjusting leaching conditions so as to form an oxide surface layer, which contains dispersed fine Cu particles and which is composed of an Al oxide and a transition metal oxide, on the surface of each of the Al alloy particles. The leached Al alloy particles are heat treated in an oxidizing atmosphere, whereby some or all of the fine Cu particles contained in the oxide surface layer are converted into the fine copper oxide particles.

Catalyst for use in reforming methanol with steam and method for preparation thereof

An electron microscope is offered which is fitted with an X-ray spectrometer having a compact optical system and high resolution. The spectrometer has a spectrometer chamber whose inside is evacuated by a vacuum pumping system. A diffraction grating having unequally spaced grooves is placed in the chamber. An X-ray detector is mounted to an end of the chamber. The X-ray spectrometer is mounted to the sidewall of the electron microscope via a gate valve. A specimen is irradiated with an electron beam and emits characteristic X-rays, which are made to impinge on the face of the grating at a large angle with respect to the normal line to the face. Diffracted X-rays from the grating reach the X-ray detector and are detected.

Electron microscope equipped with X-ray spectrometer

An omega energy filter capable of increasing energy dispersion while canceling out second-order aberrations. The energy filter is mirror-symmetric with respect to the center plane C. A beam enters a first nonuniform magnetic field produced by a first magnet, then enters a second nonuniform magnetic field region produced by a second magnet. The trajectory of the beam is curved by the field produced by the second magnet. Finally, the beam enters a third magnetic field region produced by the first magnet. The beam is deflected in this region and reaches an exit slit.

Energy filter

There is disclosed an energy filter capable of reducing the Boersch effect. Also, an electron microscope using this energy filter is disclosed. This energy filter is composed of a first-stage energy filter and a second-stage energy filter arranged along the optical axis of an electron beam. The length L of the first-stage filter is selected to be greater than the length L of the second-stage filter. An energy-selecting slit is positioned in the electron beam path within the free space between the first- and second-stage filters. Each of these two stages of filters is a Wien filter having mutually perpendicular electric and magnetic fields.

Energy filter and electron microscope using same

There is disclosed an imaging energy filter equipped with a distortion corrector. The energy filter is incorporated in an electron microscope and includes a spectrometer having magnets for producing magnetic fields. In this spectrometer, coils for exciting the magnets and potentiometers having variable resistors are connected in parallel. The variable resistors of the potentiometers are shifted to control the ratio of currents flowing into coils of shunting circuits.

Imaging energy filter equipped with distortion corrector

Growing community of inventors

Miyagi, Japan

Masami Terauchi