Sharp Kabushiki Kaisha Corporation

Masami Mori

Hideaki Sakaguchi

Toshio Watanabe

Hiroaki Fujino

Masayuki Ehiro

Shinsuke Anzai

Hirofumi Matsui

Yoshihiro Nakatani

Ren Uchida

Kohichi Hosokawa

A driving circuit of at least one embodiment includes: m output terminals; m+1 video signal output sections including m+1 output circuits, respectively; a decision section for determining the quality of each of the video signal output sections; and switches for switching connections between the output terminals and the video signal output sections in accordance with a result of determination made by the decision section. When the decision section has determined the ith (i being a natural number of m or less) video signal output section to be defective, the switches connect the jth (j being a natural number of i&#x2212;1 or less) video signal output section to the jth output terminal and connect the (k+1)th (k being a natural number of i or more to m or less) video signal output section to the kth output terminal. Thus provided is a driving circuit, capable of self-repairing a defective one of the video signal output sections, which has more simplified wires connected to the video signal output sections.

Drive circuit and display device

A test signal to be supplied to a driver section when the driver section is subjected to an operation test is generated by a test circuit. In the test circuit, the test signal can be generated by a burn-in control circuit in accordance with a clock signal TESTCK supplied from an outside source.

Semiconductor device, semiconductor device testing method, and probe card

A testing device for a semiconductor integrated circuit of the present invention includes a differential amplifier array module and tester which determine whether an output voltage of a liquid crystal driver LSI is at a proper level and an expected value voltage generator which generates an expected value voltage in accordance with expected value data to output it to the differential amplifier array module. The expected value voltage generator produces expected value data by interpolation in accordance with incoming expected value data fewer in number than the expected value voltage to be generated, so as to be equal in number to the expected value voltage. This makes it possible to carry out an extremely short time and highly accurate test for output voltages of a device under test (liquid crystal driver LSI).

Reference voltage generating device, semiconductor integrated circuit including the same, and testing device and method for semiconductor integrated circuit

A semiconductor testing apparatus and a semiconductor testing method are provided which permit an apparatus having an inexpensive configuration to perform, with precision, the acceptance-or-rejection determination and measurement test of a semiconductor integrated circuit having a large number of output terminals each for outputting a multi-gradation level output voltage. The semiconductor testing apparatus includes output voltage testing device and comparison voltage generation data inputting device. The output voltage testing device includes test voltage inputting device, comparison voltage generating device, a high level comparator, a low level comparator, and comparison result outputting device. The high level comparator and the low level comparator constitute comparing device for comparing a voltage to be tested, with a comparison voltage.

Growing community of inventors

Tenri, Japan

Masami Mori