Other

High Energy Accelerator Research Organization

Masami Ando

Anton Maksimenko

Hiroshi Sugiyama

Tetsuya Yuasa

Non-destructive analysis is carried out by irradiating an object with X-rays, for example, so that the X-rays from the object are incident on an analyzer crystal. The analyzer crystal can be of a transmission-type or a reflection-type. A pre-crystal device is used to make the radiation monochromated and parallelized. Atomic lattice planes of the pre-crystal device are approximately parallel with the atomic lattice planes of the analyzer crystal so as to use the angular analysis capability of the analyzer crystal. The thickness of the analyzer crystal is fixed. For example, for a transmission-type analyzer crystal, the thickness is such that irradiation with monochromatic parallel X-rays in the absence of the object results in a condition in which either one of (a) X-rays along a forward diffraction direction and (b) X-rays along a diffraction direction obtained by dynamical diffraction by the transmission type analyzer crystal have an intensity of nearly zero as compared to the intensity of the other with respect to the monochromatic parallel X-rays. At least one or both of an X-ray dark-field image and an X-ray bright-field are obtained.

Nondestructive analysis method, nondestructive analysis device, and specific object analyzed by the method/device

A method and apparatus for constructing a 3-dimensional image of the internal organs invisible by the conventional method is provided. The apparatus comprises: generating means for generating a monochromatic and parallel X-ray beam from an X-ray beam; a reflection-type angle analyzer for reflecting the monochromatic and parallel X-ray beam at reflecting points on both slopes of a reflection curve of the reflection-type analyzer, angle information being extracted to a maximum extent at the reflecting points, the monochromatic and parallel X-ray beam including an X-ray beam which passed through the object when the object is positioned on a rotatable goniometer in the monochromatic and parallel X-ray beam and an X-ray beam from the generating means when the object is not positioned in the monochromatic and parallel X-ray beam; an imaging device for generating a refraction angle data by receiving the monochromic and parallel X-ray beam reflected on the reflection-type angle analyzer to detect the intensity thereof, and output a refraction angle data; and an arithmetic device for constructing the 3-dimensional image by carrying out au arithmetical operation for the refraction angle data from the imaging device.

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Ibaraki, Japan

Masami Ando