General Electric Company

Sabic Innovative Plastics IP B.v.

Masako Yamada

Kevin Patrick Capaldo

Marshall Gordon Jones

John Frederick Graf

Dennis Joseph Coyle

Grant Hay

Steven Alfred Tysoe

Adel Fawzy Bastawros

Ashwit Dias

Bernard Patrick Bewlay

Xiao Bian

Shaopeng Liu

Colin James Parris

Karkala Arun Kumar

Emine Elif Gurel

Eugene George Olczak

Walter Vincent Dixon, Iii

Byron Andrew Pritchard

Mark Allen Cheverton

Sandip Maity

Feng Xue

Yan Liu

Michael John Davis

Scott Michael Miller

Abhijit Eknath Patil

Sameer Dinkar Vartak

Abhijit Vishwas Patil

Mark Richard Gilder

Todd Morris Loehr

Gheorghe Cojocariu

Micah Sakiestewa Sze

Chung-hei Simon Yeung

Rajesh Langoju

Elif Gurel

Peng Chu

Nitin Garg

Sameer Kirti Talsania

Peihong Zhu

Kevin P Capaldo

Marshall Gorden Jones

A method of inspecting a component includes storing at least one inspection image file in a memory and receiving a search request associated with the at least one inspection image file. The method also includes accessing a database including a plurality of image files, comparing the hash code of the at least one inspection image file to the hash code of each image file of the plurality of image files, and identifying a first subset of image files based on the hash code comparison. The method also includes comparing the feature data of the at least one inspection image file to the feature data of each image file of the first subset of image files and classifying a second subset of image files as relevant based on the feature data comparison. The method further includes generating search results based on the second subset of image files.

Inspection systems and methods including image retrieval module

A method of inspecting a component using an image inspection controller that includes a processor communicatively coupled to a memory includes classifying each sample image in a first database as a first sample or a second sample using a classification module, extracting at least one class generic feature from each first sample to generate a plurality of class generic features, and extracting at least one class specific feature from each second sample to generate a plurality of class specific features. The method further includes combining the class generic features and the class specific features to generate a plurality of supplemental images. The method further includes storing the sample images and the supplemental images in a second database, classifying each sample image and each supplemental image, capturing at least one image of the component using a camera, and identifying at least one feature of the component in the at least one image of the component using the classification module.

Inspection systems and methods including image classification module

A system for detecting an array of samples having detectable samples and at least one reference sample is provided. The system comprises an electromagnetic radiation source, a sensing surface comprising a plurality of sample fields, wherein the plurality of sample fields comprise at least one reference field, a phase difference generator configured to introduce differences in pathlengths of one or more samples in the array of samples, and an imaging spectrometer configured to image one or more samples in the array of samples.

Systems and methods for self-referenced detection and imaging of sample arrays

A light collimating and diffusing film and a method for making the film are provided. The film includes a plastic layer having a first side and a second side opposite the first side and at least a first peripheral edge. The first side has a first textured surface, wherein between 7 to 20 percent of slope angles on the first textured surface proximate a first axis has a value between zero and five degrees. The first axis is substantially parallel to the first peripheral edge. The plastic layer collimates light propagating therethrough.

Light collimating and diffusing film and system for making the film

In one embodiment a film can comprises a surface comprising a plurality of prism structures. Each prism structure has a lateral modulation in the w direction of less than or equal to &#xb1;20% of an average pitch of the prism structures. The plurality of prism structures can have a variation in the w direction of prism peak height that is discrete and/or continuous. In one embodiment, a method for making a film can comprise forming a plurality of prism structures on a surface. The plurality of prism structures can have a lateral modulation in the w direction of less than or equal to &#xb1;20% of an average pitch of the prism structures, and wherein the plurality of prism structures have a variation in the w direction of prism peak height that is discrete and/or continuous.

Film, backlight displays, and methods for making the same

A system for the inspection of and a process for the correction of defects in a microreplicated optical display film manufacturing process. The process steps of manufacturing a master, a plurality of shims from the master, and a multiplicity of display films from each shim are integrated with a systemic defect identification and correction process. Each primary manufacturing step has its own inspection system and correction process where defect information for that step of the process is fed back and analyzed; and from that analysis the subprocess is adjusted to eliminate or reduce the detected defect. The systemic defect is identified as to its source and then fed back and analyzed in the correction step of the respective subprocess in order to cure the root of the defect.

Integrated inspection system and defect correction method

Disclosed herein is a method comprising illuminating a microstructured prism, or linear array of prisms of a prism sheet with an incident beam. The method further comprises making measurements of the refracted image of the beam on a measuring device to measure the distance disposed on an opposing side of the prism sheet from the side that the light beam is incident upon. Measurement of two angles of the refracted images of the beam on the ruled scale, measured twice, illuminating the sample at different angles are used in an equation to simultaneously provide the apex angle, the skew angle and the refractive index of the prism sheet.

Method and apparatus for measuring prism characteristics

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Niskayuna, NY, United States of America

Masako Yamada