Fujitsu Corporation

Masaki Tosaka

Makoto Suwada

Kazuhiko Tokuda

Jiro Yoneda

Megumi Nagata

Tatsuo Koizumi

Daita Tsubamoto

Shogo Fujimori

Hitoshi Yokemura

Yasuhiro Yamashita

Hikoyuki Kawata

Ryoji Yamada

Yoshiyuki Iwakura

Kumiko Teramae

Hiroyuki Orihara

Kazunari Gotou

Takashi Fukuda

Takashi Yamagajo

Noriyuki Matsui

Manabu Yamazaki

Toshiaki Sato

Tabito Tonooka

Kazunori Kasuga

Yuzo Usui

Toshiro Sato

Hisashi Aoyama

Yuji Suwa

Kazukiyo Ogawa

Hidenobu Shiihara

Kazuyoshi Kanei

Masao Matsuda

Takeshi Uemura

Toshio Karino

An information processing device include: a memory; and one or more processors which are coupled to the memory, wherein the one or more processors performs a process including verifying a quality of a signal waveform that is propagated through focused wiring on a substrate; and storing information which is used for the verification of the quality of the signal waveform, and wherein the verifying includes determining a relative permittivity of the substrate in a division position of a variation range of the relative permittivity of the substrate such that a variation range of a propagation delay time of the signal waveform corresponding to the variation range of the relative permittivity of the substrate is divided at even intervals; generating an analysis model corresponding to the relative permittivity of the substrate in the determined division position; and performing waveform analysis on the signal waveform using the generated analysis model.

Information processing device and waveform verification method

An information processing device includes a memory; and one or more processors which are coupled to the memory and configured to performs a process including verifying a quality of a signal waveform that is propagated through focused wiring on a substrate, and storing information which is used for the verification of the quality of the signal waveform, and wherein the verifying includes generating analysis models of a plurality of respective combinations of variations in a plurality of kinds of elements which have an influence on the quality of the signal waveform; calculating impulse-response-waveforms of the plurality of respective combinations using the generated analysis models; calculating the noise amount of the plurality of respective combinations based on the calculated impulse-response-waveforms; selecting a combination, in which the calculated noise amount is the largest, as a worst case in the plurality of combinations; and performing signal waveform-transition-analysis on the selected worst case.

An antenna designing method, performed by a computer, includes: inputting a first antenna characteristic of an antenna; creating an antenna model that includes the antenna and a matching circuit which is connected to the antenna and is formed by a matching element including parasitic reactance and loss resistance; calculating a second antenna characteristic of the created antenna model by using the first antenna characteristic; determining whether or not the calculated second antenna characteristic satisfies a desired standard value; and displaying a determined result.

Antenna designing method and apparatus

A semiconductor device includes: a terminal configured to input a signal from a signal source; a receiver configured to receive the signal from the signal source through the terminal; and a terminal circuit configured to be coupled between the terminal and an input end of the receiver, and to suppress reflected wave caused by signal reflection at the receiver, wherein impedance of a wire line connecting the terminal and the input end of the receiver, and direct-current impedance of a resistance component included in the terminal circuit are set lower than impedance of an external wire line connected to the terminal.

Electronic device with terminal circuits

An electronic component includes a driver that outputs a signal to a reception apparatus; a storage device storing therein reflection information related to a reflected wave that returns to the driver when the signal is reflected back by the reception apparatus; a reflected wave detector that based on the reflection information, determines a measurement period for measuring the reflected wave and that based on the measurement period, measures an arrival time and a peak amplitude of the reflected wave; and a controller that based on the arrival time and the peak amplitude, extracts reflected-wave cancelling information for inhibiting effects of the reflected wave from the reception apparatus and that sets the extracted reflected-wave cancelling information in the driver.

Electronic component and reflected-wave cancelling method

A printed circuit board includes a through hole constituted by a hole penetrating through the front and rear surfaces of the printed circuit board. A fabrication method of the printed circuit board, includes applying conductive material plating to the inner wall surface of the hole to form a through hole electrically connecting the front and rear surfaces of the printed circuit board, and removing the conductive material plated on the hole inner wall surface at least at a portion between the front and rear surfaces of the printed circuit board is carried out to thereby fabricate a printed circuit board having a through hole electrically isolates the front surface of the printed circuit board from the rear surface thereof.

Printed circuit board fabrication method

A center location of an eye pattern generated by superimposing waveform signal pieces cut out from a waveform signal generated by a simulator is calculated, and an arrangement of a mask as a quality evaluation criterion of the eye pattern on the center location is envisaged to calculate time coordinate values and voltage coordinate values of feature points included in the mask. First feature points not on a time axis is set as processing objects, and a margin in the voltage axis direction is calculated based on the voltage coordinate values of the first feature points and the voltage coordinate values of waveform signal piece parts associated with the first feature points. Second feature points on the time axis is set as processing objects, and a margin in the time axis direction is calculated based on the time coordinate values of the second feature points and the time coordinate values of waveform signal piece parts associated with the second feature points.

Apparatus and method for eye margin calculating, and computer-readable recording medium recording program therefof

In order to make it possible to automatically execute a wiring process which satisfies not only a design condition but also design quality relating to an electric characteristic, according to the embodiment, an automatic wiring apparatus includes a design condition changing section for changing a design condition in accordance with priority information regarding the design condition where a wiring process which satisfies the design condition cannot be carried out by a first wiring processing section, a quality allowability decision section for deciding whether or not quality of a wiring region can be allowed where a wiring process which satisfies the design condition after the changing can be executed by a second wiring processing section and an outputting section for outputting a result of the wiring process of the wiring region by the second wiring processing section if it is decided that the quality of the wiring region can be allowed.

Automatically wiring circuit by setting and changing reference to design quality relating to electric characteristic

An equalizer characteristics optimizing method includes acquiring a recovery clock timing from a reception signal; acquiring a predetermined sampling clock timing with respect to the recovery clock timing; latching the reception signal at the recovery clock timing; latching the reception signal at the sampling clock timing; comparing logic values obtained in the latching steps; collecting, after changing a characteristics setting of an equalizer, logic value comparison result data by repeating the recovery clock acquiring step, the acquiring of the sampling clock timing, the latching of the reception signal at the individual clock timings, and the comparing of the logic values, using the changed characteristics setting; and determining an optimum characteristics setting of an equalizer based on the collected logic value comparison result data.

Equalizer characteristics optimizing method and transmission system

A transmission characteristic adjustment device and the like that can carry out circuit adjustment before an error occurs, and has a transmission characteristic with high reliability without generating an error are provided. The device determines existence or non-existence of a difference with respect to confirmed data based on each phase of a multiphase clock, detects a window width in a time axis direction of receiving data based on a result of the determination and a phase of the multiphase clock, and evaluates a setting value of a circuit element of the transmission element or the reception element that has an influence on a receiving waveform based on a fluctuation of the detected window width, and changes the setting value of the circuit element of the transmission element or the reception element based on a result of the evaluation.

Transmission characteristic adjustment device, circuit substrate, and transmission characteristic adjustment method

A circuit simulator includes: a DC analysis section which analyses a static stable potential on a transmission circuit if a capacitor which blocks a DC current while allowing an AC current to pass therethrough is connected in series in the line of the transmission circuit; and an initial potential application section which applies, as an initial potential in the simulation, the stable potential obtained by the DC analysis section to an application position on the upstream side of the capacitor in the flow of the signal through the transmission circuit. The simulator also includes a circuit simulation section which performs the simulation of the transmission circuit under the initial potential applied by the initial potential application section.

Transmission circuit simulator and transmission circuit simulation program storage medium

A circuit analyzing apparatus for analyzing operation characteristics of a circuit unit in which, on a substrate, circuit devices are arranged, has a part for automatically obtaining a value of a substrate parameter concerning the substrate for an operating frequency, which value depends on the operating frequency; and a part for analyzing operation of the circuit unit based on the value of the substrate parameter for the operating frequency.

Circuit analyzing apparatus, circuit analyzing method and circuit analyzing program

A simulation method makes a noise analysis based on parameters including a conductor resistance which takes skin effect into consideration. The simulation method calculates a first resistance of one of conductors having a largest cross sectional area, obtains a predetermined pitch which saturates a diagonal component of a second resistance of a conductor with reference to the first resistance and makes the diagonal component approximately constant, by varying a pitch of the conductors, calculates the parameters for each pitch with respect to one of the pitches larger than or equal to the predetermined pitch and the pitches smaller than the predetermined pitch, and substitutes the parameters calculated for the one of the pitches with respect to the other of the pitches, and outputs calculation results.

Simulation method and apparatus, and computer-readable storage medium

A noise countermeasure determination method includes the step of obtaining an analyzing circuit judgement result by judging acceptability of the analyzing circuit based on a comparison of features of the analyzing circuit and transmission circuit topologies, and outputting an improvement proposal for making the analyzing circuit closer to one of basic types of the transmission circuit topologies depending on the analyzing circuit judgement result.

Noise countermeasure determination method and apparatus and storage medium

The apparatus comprises the syntax checking section that checks the syntax of a device model according to a check table showing the relation between the syntax of the device model showing electrical characteristics of a semiconductor device and an amendment when deviating from the syntax. The syntax error amendment creating section corrects the device model according to a corresponding amendment when a description deviating from the syntax is checked by the syntax checking section.

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Kawasaki, Japan

Masaki Tosaka