Omron Corporation

Shanghai Jiao Tong University

Masaki Suwa

Daisuke Mitsumoto

Yoshinobu Asokawa

Yasuhiro Ohnishi

Xingdou Fu

Masatoshi Kimachi

Shree Kumar Nayar

Kennosuke Hayashi

Yoshihisa Ijiri

Koichi Kinoshita

Kazuo Yamamoto

Hiroyuki Miyaura

Ryo Yonetani

Hitoshi Mukai

Masanao Yoshino

Hiroyoshi Koitabashi

Yuki Hasegawa

Feng Shen

Yuming Zhao

Jiapeng Liu

Yanfeng Xiao

Yoshiro Ito

Mohammadamin Barekatain

An inference apparatus provides target data to multiple inference models to cause the inference models each derived from local learning data obtained in a different environment to perform predetermined inference to obtain an inference result from each of the inference models. The inference apparatus determines the value of each combining parameter using environment data, weights the inference result from each of the inference models using the determined value of each combining parameter, and combines the weighted inference result from each inference model together to generate an inference result in a target environment.

Inference apparatus, inference method, and computer-readable storage medium storing an inference program

The purpose of the present invention is to provide a gaze detector with which it is possible to detect a gaze (start point and gaze direction) by a simple configuration. The gaze detector detects a person's gaze, wherein the gaze detector is provided with a camera unitfor imaging the face of the person, a projector unitfor projecting a prescribed pattern light to the face of the person, a control unitfor controlling the presence of projection of the pattern light by the camera unitand the projector unit, and a gaze detection processing unitfor detecting a gaze from the image of the face of the person imaged by the camera unit.

Gaze detector, method for controlling gaze detector, method for detecting corneal reflection image position, and storage medium

A control device assumes that observation light observed by an imaging device is composite light of primary reflection light and secondary reflection light. The control device acquires three or more samples of a brightness amplitude value of the observation light, calculates a phase error caused by the secondary reflection light using these samples, calculates a corrected phase value by correcting a phase value of the observation light using the phase error, and calculates a three-dimensional position of the measurement point on the measurement object based on the corrected phase value.

Three-dimensional shape measurement device, three-dimensional shape measurement method, and program

A three-dimensional measurement apparatus includes: projecting means for projecting, onto a measurement target, patterned light having a two-dimensionally coded pattern in which a plurality of types of words each having a different two-dimensional structure and being distinguishable from each other are two-dimensionally arranged; capturing means for capturing the measurement target onto which the patterned light is projected; and calculating means for calculating a three-dimensional position of a target pixel of the image from an image captured by the capturing means, and the two-dimensionally coded pattern is two-fold symmetrical. The two-dimensionally coded pattern is a pattern in which a predetermined word is repeated in the column direction for each column.

Three-dimensional measurement apparatus and three-dimensional measurement method

Three-dimensional measurement is performed by projecting patterned light having a hybrid pattern Ph onto a measurement target. The hybrid pattern Ph is a pattern in which a random pattern Pr is superimposed on a structured light pattern Ps, and is arranged in pattern such that the random pattern Pr and the structured light pattern Ps do not interfere mutually.

Three-dimensional measurement apparatus, three-dimensional measurement method and program

An observing apparatus includes a lighting device for irradiating a surface of a measuring target with light having a first light source distribution, and an imaging section for imaging the surface of the measuring target. Considering a first plane passing through a measurement point, the first light source distribution is set such that: (1) a radiance L(&#x3b8;) changes in a continuous or stepwise manner according to an angle &#x3b8;, and (2) the radiance L(&#x3b8;) is not zero in a local region of a predetermined range of &#xb1;&#x3c3; having a point located at a predetermined angle &#x3b8;c as a center on the first plane when viewed from the measurement point, and the following equation substantially holds for arbitrary a satisfying 0&#x3c;a&#x2266;&#x3c3;; L(&#x3b8;&#x2212;a)+L(&#x3b8;+a)=2&#xd7;L(&#x3b8;).

Profilometer, measuring apparatus, and observing apparatus

The present invention provides a digital image processing enhancing system and method with denoising function. The collected digital image is input; the obtained digital image is decomposed into an illumination image and a reflection image, and then the decomposed illumination image and the reflection image is processed, at last, the processed illumination image and the reflection image are composed into an output image, which is output to an output device. The present invention can improve the image quality, remove the noises of the image, remain details features of an object and obtain the natural visual effect.

Digital image processing and enhancing system and method with function of removing noise

A pattern generating apparatus includes a sequence generating unit and an image data generating unit. The sequence generating unit generates a sequence formed by terms having M-value numeric values. The image data generating unit generates the image data by converting each numeric value of the sequence into a gray-level value according to each numeric value, and the sequence is generated by the sequence generating unit. The sequence generating unit generates the sequence such that vectors expressed by sub-sequences have different directions for the sub-sequence constituting the generated sequence.

Method and apparatus for generating projecting pattern

An apparatus, method, and program for measuring the three-dimensional shape of an object by analyzing an optical pattern projected onto the object includes a line sensor and an image analysis unit. The line sensor reads the target object, onto which the optical pattern is projected. The image analysis unit analyzes the optical pattern in the image read by the line sensor based on a spatial fringe analysis method, and the image analysis unit computes the three-dimensional shape information on the target object. The phase of a pixel included in an image taken of the optical pattern is determined based on the brightness values of the pixel and at least one neighboring pixel in the image; thus the height information of the object can be determined. In addition, the height of the target object at a given position can be computed based on how much the phase of the optical pattern projected onto a certain position of the object is shifted from a reference phase.

Three-dimensional shape measuring apparatus, program, computer-readable recording medium, and three-dimensional shape measuring method

The present invention provides a technique for enabling even a person having no expert knowledge to adjust the direction of an optical axis easily with high precision. In a three-dimensional image processing apparatus having plural image capturing apparatuses, optical center of an image from an image capturing apparatus is stored for each of the image capturing apparatuses. A mark indicative of the optical center is superimposed on an image obtained from the image capturing apparatus. By referring to the mark for each of the image capturing apparatuses, the orientation of each of the image capturing apparatuses is adjusted so that all of the marks overlay on the same point on an object.

Growing community of inventors

Kyoto, Japan

Masaki Suwa