Mitsubishi Heavy Industries Limited

Masaki Kusano

Daisuke Kobayashi

Daisuke Matsuura

Shigeru Ishii

Kazuyuki Hirose

Osamu Kawasaki

Yoshiharu Mori

Naohisa Anabuki

An electronic device protection unit is provided. The electronic device protection unit includes a sensing part, a responding part, and an analysis and control part. The sensing part is configured to detect an incident ray which is electromagnetic wave or radiation with potential to cause destruction (damage), failure, or malfunction of an electronic device. The responding part is configured to be able to perform a plurality of behaviors to protect the electronic device. The analysis and control part is configured to control the behaviors of the responding part in response to a type of the incident ray detected by the sensing part.

Electronic device protection unit and electronic system

The purpose of the invention is to compensate for the radiation tolerance of a semiconductor memory. An apparatus () for compensating for radiation tolerance comprises: a voltage value acquisition unit () that acquires a data retention voltage value that is a maximum voltage value at which data is inverted when a power supply voltage of a semiconductor memory having a latch circuit is lowered; a correction value determination unit () that determines a voltage correction value on the basis of a difference between the data retention voltage value and a reference voltage value; and a voltage adjustment unit () that adjusts at least one among the power supply voltage and a substrate bias voltage by using the voltage correction value. The reference voltage value is set to be equal to or lower than the data retention voltage value that satisfies a required radiation tolerance.

Apparatus for compensating for radiation resistance of semiconductor memory, method therefor, and electronic circuit

Growing community of inventors

Tokyo, Japan

Masaki Kusano