Seiko Epson Corporation

Masaki Kimura

Kenji Fukasawa

Makoto Fujino

Kenji Matsuzaka

Takahiro Kamada

Katsuyuki Tanaka

Hiroaki Tsunoda

An inspection apparatus including: a display device; and one or a plurality of processors, wherein the one or the plurality of processors is programmed to execute a method including: converting an inspection target image representing an inspection target into a virtual good article image by using a learning model, the learning model being trained so that an image representing a good article is generated based on features of a plurality of targets that are determined as good articles, generating a difference between the virtual good article image and the inspection target image as a defect candidate image, and displaying the defect candidate image on the display device.

Inspection apparatus, inspection method, and non-volatile storage medium

A profile adjustment system adjusts a profile to be used for converting a coordinate value in a color space, based on an adjustment target at an adjustment point indicating a color to be adjusted. The profile adjustment system includes a coordinate receiving unit configured to display on a display unit an input field for coordinates of the adjustment point, and to receive an input of the coordinates of the adjustment point, and a color display processing unit configured to display on the display unit a color corresponding to the coordinates, the input of which has been received, in association with displaying of the coordinates.

Profile adjustment system, profile adjustment device, and profile adjustment method

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Nagano, Japan

Masaki Kimura