Gunma University

Japan Atomic Energy Agency

Masakazu Oikawa

Kazuo Arakawa

Takahiro Satoh

Hirofumi Shimada

Takashi Nakano

Ken Yusa

Hiroyuki Katoh

Shoji Kishi

Takuro Sakai

Taku Sato

Mitsuhiro Fukuda

Yasushi Horiuchi

Takashi Agematsu

A subject is imaged for treatment of the subject such as an eye to be inspected, while irradiating a charged particle beam on the eye, so that an aim position of a charged particle beam for treatment can be determined. The device for determining an aim position of a charged particle beam includes a range adjusterthat adjusts an irradiation position, in a depth direction of the eye, of a charged particle beam irradiated from a charged particle beam source, a mirrorthat transmits or passes the position determining charged particle beam and reflects an emitted light emitted from a region of the eye on which the charged particle beam is irradiated and an emitted light emitted, due to an irradiated of an excitation light, from a region including the region of the eye on which the position determining charged particle beam, toward the outside of the axis of the charged particle beam, and an eyeground imaging devicethat is arranged at a position where the emitted lights reflected from the mirror are incident and images the region including the region of the eye on which the charged particle beam is irradiated by causing the emitted lights to be incident, so that it allows to determine an aim position of a charged particle beam for treatment based on a imaged image.

Device for determining aim position of charged particle beam, method of using the device, and treatment device employing device for determining aim position

Growing community of inventors

Takasaki, Japan

Masakazu Oikawa