Adv Antest Corporation

Mitsubishi Paper Mills Limited

Konica Minolta Medical and Graphic, Inc.

Masakazu Ando

Takashi Hashimoto

Tsuyoshi Yamashita

Toshiaki Awaji

Hiroyuki Takahashi

Noriaki Takahashi

Takashi Sekino

Masahiko Saikawa

Yoshiyuki Tanno

Hidemi Hanada

Pressing an electronic device () to be tested to contact terminals (and) while bringing a heater () having equal or close temperature change characteristics to those of the electronic device to be tested by a test pattern, transmitting a test pattern to the electronic device to be tested in this state, and controlling a power consumption of a heater so that total power of a power consumption of the electronic device to be tested by the test pattern and a power consumption of the heater becomes a constant value.

Temperature control device and temperature control method

Provided is a test apparatus for testing a device under test, the test apparatus including: a pattern generating section that inputs a test pattern to the device under test; a judging section that receives an output signal of the device under test, and makes judgment concerning pass/fail of the device under test based on the output signal; an internal circuit that exchanges signals between the device under test and the pattern generating section or the judging section; a first transmission line that connects the internal circuit to the device under test; and a first switch that connects the first transmission line to a ground potential in not testing the device under test, and cuts off the first transmission line from the ground potential in testing of the device under test.

Test apparatus, pin electronics card, electrical device and switch

Radiographic image reader for medical purposes

A driver circuit for a semiconductor test system significantly reduces power consumption and limits current flowing from a power-supply. The driver circuit provides a test signal having predetermined voltage levels to a semiconductor test under test by switching diode bridges connected with high and low reference voltages. When receiving a switching signal, transistor circuits drive the diode bridge so that a test signal having the reference voltage is supplied to an output driver through the selected diode bridge. The output driver then supplies the test signal to the semiconductor device under test. The transistor circuits drive the diode bridge by supplying bridge current to ON/OFF control the diode bridges. Each of the diode bridges has a plurality of diodes connected symmetrically and an output of the diode bridge is taken from a point shifted by one diode from a center the diode bridge. The output driver is formed of a first and second pairs of transistors each pair of transistors are connected in a current Miller fashion, and the first pair of transistors are NPN transistors and the second pair of transistors are PNP transistors.

Driver circuit for semiconductor test system

A driver circuit for a semiconductor test system that can reduce power consumption significantly, set the power-supply voltage to low level, and can facilitate mearsurments against temperature increases. The invention is able to respond to higher amplitudes and high speeds in the semiconductor test system. The driver circuit provides an output for a semiconductor test system by switching the high and low voltage levels, and configuring a current-source device 703 to supply an output current at a period set by a switch. The invention also comprises a driver circuit that consumes less power by adapting a circuit that drastically reduces current consumption during no-load operation. To accomplish this, after receiving the positive differential-switching signal and negative differential-switching signal, the analog-voltage signal is supplied to an output-stage transistor by switching diode bridges. Output is provided by buffering and amplifying by means of forming a current mirror. Furthermore, the invention provides a driver circuit that reduces I/O spikes during the driver-inhibit mode. To achieve this, the high-level input-voltage VH is applied to the first switch terminal and the base-voltage VA of the first voltage-output device is applied to the second switch terminal. The control-current signal for the first current-source device is connected to the input terminal. This features prohibits the first current-source device from turning on until the voltage VA coincides with the high-level input-voltage VH. The same arrangement is made for the low-level side.

A developing apparatus for a lithographic offset printing plate, including: a developer applying device including a pair of rod-shape members which are not rotated; and a developer supply device disposed above said developer applying means and a method adapted to the apparatus and including a step of supplying a developer to either of said rod-shape members that face the surface of said lithographic offset printing plate on which a silver halide emulsion layer has been formed by application.

Method and apparatus for developing lithographic offset printing plate

A test pattern is supplied to the IC under test and a current corresponding to the power supply current of the IC is obtained from a current converter. A reference current reverse in polarity from the output current of the current converter is yielded from a reference current source. The output currents of the current converter and the reference current source are supplied to an integrating capacitor via first and second switches, respectively. The first and second switches are simultaneously turned ON in synchronism with the test pattern and held in the ON state in a specified phase for a specified period in one operation cycle. The voltage of the integrating capacitor immediately after turning-OFF of the first and second switches is compared with a reference voltage and the comparison result is output. After the outputting of the comparison result and before the turning-ON of the first and second switches the voltage of the integrating capacitor is reset by reset means to the reference voltage.

Growing community of inventors

Tokyo, Japan

Masakazu Ando