Growing community of inventors

Yokohama, Japan

Masaichi Inomata

Average Co-Inventor Count = 3.84

ph-index = 6

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 136

Masaichi InomataMitsuaki Uesugi (9 patents)Masaichi InomataShoji Yoshikawa (3 patents)Masaichi InomataIsamu Komine (3 patents)Masaichi InomataTsutomu Kawamura (3 patents)Masaichi InomataAkira Kazama (3 patents)Masaichi InomataTakahiko Oshige (3 patents)Masaichi InomataMasahiro Iwabuchi (3 patents)Masaichi InomataShinichi Tomonaga (3 patents)Masaichi InomataShuji Kaneto (3 patents)Masaichi InomataOsamu Uehara (3 patents)Masaichi InomataHajime Tanaka (3 patents)Masaichi InomataShuichi Harada (3 patents)Masaichi InomataShigemi Fukuda (3 patents)Masaichi InomataYasuo Kushida (3 patents)Masaichi InomataTsuneo Suyama (3 patents)Masaichi InomataHiroyuki Sugiura (3 patents)Masaichi InomataKazuo Sano (1 patent)Masaichi InomataEiichi Makabe (1 patent)Masaichi InomataKyusuke Maruyama (1 patent)Masaichi InomataKenji Iwai (1 patent)Masaichi InomataMasaichi Inomata (9 patents)Mitsuaki UesugiMitsuaki Uesugi (13 patents)Shoji YoshikawaShoji Yoshikawa (84 patents)Isamu KomineIsamu Komine (14 patents)Tsutomu KawamuraTsutomu Kawamura (13 patents)Akira KazamaAkira Kazama (11 patents)Takahiko OshigeTakahiko Oshige (10 patents)Masahiro IwabuchiMasahiro Iwabuchi (6 patents)Shinichi TomonagaShinichi Tomonaga (5 patents)Shuji KanetoShuji Kaneto (4 patents)Osamu UeharaOsamu Uehara (3 patents)Hajime TanakaHajime Tanaka (3 patents)Shuichi HaradaShuichi Harada (3 patents)Shigemi FukudaShigemi Fukuda (3 patents)Yasuo KushidaYasuo Kushida (3 patents)Tsuneo SuyamaTsuneo Suyama (3 patents)Hiroyuki SugiuraHiroyuki Sugiura (3 patents)Kazuo SanoKazuo Sano (9 patents)Eiichi MakabeEiichi Makabe (2 patents)Kyusuke MaruyamaKyusuke Maruyama (1 patent)Kenji IwaiKenji Iwai (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Nkk Corporation (8 from 614 patents)

2. Nippon Kokan Kabushiki Kaisha (1 from 487 patents)


9 patents:

1. 7599052 - Method for marking defect and device therefor

2. 7423744 - Method for marking defect and device therefor

3. 7248366 - Method for marking defect and device therefor

4. 5104227 - Apparatus for measuring three-dimensional curved surface shapes

5. 5102224 - Apparatus for measuring three-dimensional curved surface shapes

6. 5102223 - Method and apparatus for measuring a three-dimensional curved surface

7. 4881126 - Image composing apparatus

8. 4874955 - Method and apparatus for measuring a three-dimensional curved surface

9. 4716459 - Fatigue crack position detection apparatus

Please report any incorrect information to support@idiyas.com
idiyas.com
as of
1/3/2026
Loading…