Kabushiki Kaisha Nihon Micronics

Nakamichi Corporation

Nakamichi Fukushima Corporation

Masahisa Tazawa

Takayuki Hayashizaki

Hideki Hirakawa

Shinji Kuniyoshi

Akira Soma

Akira Souma

Tomoya Sato

Takahiko Tandai

Yoshikazu Urushiyama

A probe for current test is provided. The probe includes a probe body having a plate-like connection portion whose end face becomes a connection face to a probe board, a solder layer formed on at least one side face of said connection portion, and a guide portion formed on the connection portion. The guide portion penetrates the connection portion in its thickness direction from the one side face with the solder layer formed to the other side face. When the solder layer is melted, the guide portion guides a portion of the melted solder to the other side face.

Current test probe having a solder guide portion, and related probe assembly and production method

A probe for electrical test comprises a plate-shaped main portion having a base end to be attached to a support board and a tip end opposite the base end, and a probe tip portion arranged at the tip end of the main portion and having a probe tip to contact an electrode of a device under test, the main portion being made of a tenacity material. The main portion includes a conductive material extending from the base end to the tip end and at least part of which is buried within the tenacity material, and the tenacity material has higher resiliency than that of the conductive material while the conductive material has higher conductivity than that of the tenacity material. As a result, disorder of a signal provided via the probe is decreased without losing elastic deformation.

Electrical test probe

A pair of half core blocks, one of which is provided with a groove for providing a prescribed gap depth in a magnetic head, are bonded together to produce a ring core. The ring core is inserted into a slot formed in a top of a magnetic slider and secured in position which provides a precise flush relation between a base end of a half core provided with a groove and the top of the slider. The slider is ground from its bottom to expose the end of the ring core inserted into the slot to produce a head assembly. One side of the ring core portrudes from the slider in the head assembly. When one or more of the head assemblies are mounted on a base block, the protruding side is maintained in contact with a reference upstanding plane provided by a jig for definite positioning of the head assemblies so that gaps in the respective ring cores extends exactly in a running direction of a magnetic tape, thereby preventing azimuth loss.

Method of manufacturing magnetic head

Growing community of inventors

Aomori, Japan

Masahisa Tazawa