Kabushiki Kaisha Toshiba

Nippon Steel Corporation

Nanogeometry Research Inc.

Canon Kabushiki Kaisha

Fujitsu Corporation

Canon Denshi Kabushiki Kaisha

Masahiro Yamamoto

Hidetoshi Fujimoto

Shinya Nunoue

Masayuki Ishikawa

Genichi Hatakoshi

Shinji Saito

Yasushi Hattori

Naomi Shida

John Rennie

Kei Kaneko

Yoshihiro Kokubun

Johji Nishio

Yukie Nishikawa

Masaaki Onomura

Tadashi Kitamura

Hideto Sugawara

Kazuhiko Itaya

Kosei Fume

Shin-Ya Nunoue

Lisa Sugiura

Masaya Watanuki

Masayuki Sofue

Satoshi Takenaka

Katsunobu Sasanuma

Kazutoshi Takeda

Junichi Nakamura

Minoru Kato

Yoshihiko Suzuki

Toshio Sato

Koichi Nitta

Haruhiko Okazaki

Osamu Tanaka

Yasuhiro Aoki

Yoshinori Kato

Kentaro Yokoi

Atsushi Okada

Kazufumi Kubota

Kenji Kimiyama

Kikuji Hirose

Shigeyoshi Maeda

Shinichi Nakazawa

Neeti Vohra

Mikio Nakasuji

Hiroyasu Omata

Yutaka Hayashi

Naotsugu Hiroki

Masanori Konno

Hideo Haga

Yoshihide Nanbu

Risa Sugiura

Seiichiro Chou

Hideya Okada

Nobuaki Kaneko

According to an embodiment, a voice recognition device includes one or more processors. The one or more processors are configured to: recognize a voice signal representing a voice uttered by an object speaker, to generate text and meta information representing information that is not included in the text and included in the voice signal; generate an object presentation vector including a plurality of parameters representing a feature of a presentation uttered by the object speaker; calculate a similarity between the object presentation vector and a reference presentation vector including a plurality of parameters representing a feature of a presentation uttered by a reference speaker; and output the text. The one or more processors are further configured to determine whether to output the meta information based on the similarity, and upon determining to output the meta information, add the meta information to the text and output the meta information.

Voice recognition device, voice recognition method, and computer program product

According to an embodiment, a display control system includes a recognizer, a calculator, and a display controller. The recognizer is configured to recognize sound generated from a sound source. The calculator is configured to calculate a first direction of the sound source from a position of a user based at least in part on the recognized sound. The display controller is configured to cause a display to output display information that visually expresses the sound in a first display format determined based at least in part on an angle between a second direction in which the user faces and the first direction of the sound source.

Display control system, display control method, and computer program product using display sectors in one revolution of clockwise or counterclockwise direction

A speech processing apparatus includes a specifier, and a modulator. The specifier specifies any one or more of one or more speeches included in speeches to be output, as an emphasis part based on an attribute of the speech. The modulator modulates the emphasis part of at least one of first speech to be output to the first output unit and second speech to be output to the second output unit such that at least one of a pitch and a phase is different between the emphasis part of the first speech and the emphasis part of the second speech.

Speech processing apparatus, speech processing method, and computer program product

A speech processing apparatus includes a specifier, a determiner, and a modulator. The specifier specifies an emphasis part of speech to be output. The determiner determines, from among a plurality of output units, a first output unit and a second output unit for outputting speech for emphasizing the emphasis part. The modulator modulates the emphasis part of at least one of first speech to be output to the first output unit and second speech to be output to the second output unit such that at least one of a pitch and a phase is different between the emphasis part of the first speech and the emphasis part of the second speech.

An embodiment of a vehicle monitoring apparatus has a determiner and a reader. The determiner determines whether or not a specific site of a vehicle exists at least in an area of an image, the image imaged by an imager, the area being one of multiple areas into which the image is divided by dividing line that are substantially orthogonal to a direction of travel of the vehicle. The reader reads information on a license plate mounted to the vehicle from the area in case that the determiner determines the specific site of the vehicle is determined to exist in the area.

Vehicle monitoring apparatus and vehicle monitoring method

A control method executed by an information processing device having a function of wirelessly communicating with a wearable device and locking function of restricting operation of the information processing device, the control method includes acquiring acceleration information by an acceleration sensor; receiving information that is transmitted from the wearable device and relates to acceleration applied to the wearable device; and releasing the lock when the acceleration information acquired by the acceleration sensor matches the information relating to the acceleration.

Control method, information processing device, and storage medium

A method of manufacturing a light-emitting device includes disposing a light-emitting element on a supporting member, dispersing a fluorescent substance having a particle diameter of 20 to 45 &#x3bc;m in a material of the light-transmitting member at a concentration of 40 to 60 wt %, dripping raw material for the fluorescent layer on the light-emitting element while lowering the viscosity of the raw material, and thermally curing the coated layer.

Method of manufacturing light-emitting device with fluorescent layer

The present invention is intended to provide a semiconductor optoelectric device with high luminescent efficiency and a method of manufacturing the same. The semiconductor optoelectric deviceaccording to the present invention is constructed by depositing compound-semiconductor layersandon a monocrystalline substrateof a hexagonal close-packed structure. The shape of the monocrystalline substrateis a parallelogram. Individual sides of the parallelogram are parallel to a &#x3c;11-20&#x3e; orientation. As the monocrystalline substrate, sapphire, zinc oxide or silicon carbide may be used. As the compound-semiconductor layers, an n-type GaN layerand p-type GaN layermay be used.

Semiconductor optoelectric device and method of manufacturing the same

A light-emitting device is provided, which includes a substrate having a plane surface, a semiconductor light-emitting element mounted on the plane surface of the substrate and which emits light in a range from ultraviolet ray to visible light, a first light transmissible layer formed above the substrate and covering the semiconductor light-emitting element, a phosphor layer formed above the first light transmissible layer and containing phosphor particles and matrix, and a second light transmissible layer formed above the phosphor layer and contacting with the plane surface of the substrate. The surface of the phosphor layer has projections reflecting shapes of the phosphor particles.

Semiconductor light-emitting device

A paint for highly corrosion-resistant zinc-alloy coated steels containing zinc-alloy powder at not less than 60 mass %, characterized in that said powder contains aluminum at not less than 10 mass % and less than 30 mass % and the remainder comprising zinc and unavoidable impurities, the shape of powder particles is spherical or oval and the ratio between the maximum and minimum diameters (maximum diameter/minimum diameter) is 1 to 1.5, and a steel structure having coated films produced by using said paint.

Paint for highly corrosion-resistant zinc-alloy coated steels and steel structure having coated film of said paint

A light-emitting device is provided, which includes a supporting member, a light-emitting element disposed on the supporting member to emit a light, and a fluorescent layer formed on the light-emitting element and having a thickness ranging from 80 to 240 &#x3bc;m, the fluorescent layer containing a light-transmitting member and a fluorescent substance having a particle diameter ranging from 20 to 45 &#x3bc;m at a concentration of 40 to 60 wt %.

Light-emitting device with fluorescent layer

A pattern inspection apparatus is used for inspecting a pattern, such as semiconductor integrated circuit (LSI), liquid crystal panel, and a photomask by using an image of the pattern to-be-inspected and design data for fabricating the pattern to-be-inspected. The pattern inspection apparatus includes a reference pattern generation device for generating a reference pattern represented by one or more lines from design data, an image generation device for generating the image of the pattern to-be-inspected, a detecting device for detecting an edge of the image of the pattern to-be-inspected, and an inspection device for inspecting the pattern to-be-inspected by comparing the edge of the image of the pattern to-be-inspected with the one or more lines of the reference pattern.

Pattern inspection apparatus and method

A light-emitting device is provided, which includes a supporting member, a light-emitting element disposed on the supporting member to emit a light, the light-emitting element having a semiconductor substrate and a polygonal top surface, an electrode pad formed on the top surface of the light-emitting element, a first lead electrode formed on the supporting member, a conductive wire connecting the electrode pad with the first lead electrode, the conductive wire being arranged to pass over one of corners of the polygonal top surface of the light-emitting element and along a ridge formed contiguous to the one of corners and corresponding to a boundary between neighboring side surfaces of the light-emitting element, and a fluorescent layer containing a light-transmitting member and a fluorescent substance.

Light-emitting device

First, a pattern inspection apparatus detects the first edge from an image of a pattern to-be-inspected. Next, the pattern inspection apparatus conducts matching of the image of the pattern to-be-inspected and the first reference pattern by comparing the first edge and an edge of the first reference pattern. Since, as a result of the matching, a shift quantity Scan be obtained, and then the first reference pattern is shifted by this shift quantity S. Subsequently the pattern to-be-inspected is inspected by comparing the first edge and the edge of the first reference pattern so shifted. In this first inspection, pattern deformation quantities are obtained and defects are detected. A shift quantity Scan be obtained as one of the pattern deformation quantities. Next, in order to detect the second edge from the pattern image to-be-inspected, the corresponding second reference pattern is shifted by a shift quantity S+S. Using the second reference pattern so shifted, a profile is obtained on the pattern image to-be-inspected and the second edge is detected. Then, by comparing the second edge and the edge of the second reference pattern so shifted, the pattern to-be-inspected is inspected. Also in this second inspection, the pattern deformation quantities are obtained and defects are detected. A shift quantity Scan be obtained as one of the pattern deformation quantities.

Pattern inspection apparatus, pattern inspection method, and recording medium

A semiconductor light emitting element includes a semiconductor light emitting element emitting light beams in ultraviolet ranges and visible ranges, and a fluorescent element absorbing the light beams from the semiconductor light emitting element and outputting visible light beams in a light taking-out direction different from a light emitting direction. The light beams emitted from the light emitting element are absorbed within the semiconductor light emitting device.

Semiconductor light emitting device

Growing community of inventors

Kawasaki, Japan

Masahiro Yamamoto