Konica Minolta Opto, Inc.

Konica Minolta Advanced Layers, Inc.

Masahiro Okitsu

Kenji Konno

Hiroshi Hatano

Koujirou Sekine

Hiroaki Ueda

Manami Kuiseko

Naoki Nishida

Kazuyuki Ogura

Kyu Takada

Youichi Ogawa

In an eccentricity measuring method according to the present invention, a first position of a light source image formed by reflection at one optical surface is measured (S), a predetermined second position related to another optical surface is measured (S), and a relative eccentricity between both optical surfaces is calculated based on the first and second positions (S). Therefore, the eccentricity measuring method enables measurement of eccentricity by a same measurement optical system regardless of a radius of curvature of an optical surface of an optical element.

Eccentricity measuring method

Provided is an optical recording head in which a light beam from a light source is collected by an optical element and reflected on a reflecting surface to be formed into a spot light. Since a support portion for supporting the light source of the optical element at a predetermined position and the reflection surface for reflecting the light beam are formed integrally with each other, it is not required to perform the positioning thereof, and light can be collected to a very small spot with high efficiency, and an optical recording head and an optical recording apparatus having low heights can be provided.

Optical recording head and optical recording apparatus

A recorder has a recording head which uses light for information recording to a recording medium. The recording head has a slider and an optical waveguide. The slider moves relative to the recording medium while floating thereon. The optical waveguide is provided in the slider and has a refractive index difference of 20% or more between a core and a cladding.

Recording head and recorder

To obtain an optical element for generating near-field light which can accurately detect positions of a plurality of minute structures formed on a metallic thin film provided to a condensing surface, and a method of adjusting an optical spot position of the optical element. The metallic thin film is formed on the condensing surface of the optical element that condenses incident light so as to generate near-field light smaller than an condensing spot B near a condensing point, and a plurality of openings (minute structure) for generating the near-field light are formed into a matrix matter on the metallic thin film, and position detecting structures are formed on positions that partitions the openings is formed. Scanning in X and Y directions is carried out by a light beam, and its reflected light is detected so that the positions of the openings are detected.

Optical element for condensing incident light

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Higashiosaka, Japan

Masahiro Okitsu