Hamamatsu-photonics K.k.

Masahiro Kotani

Takayuki Ohmura

Yasuhide Naito

Miu Takimoto

Akira Tashiro

Motohiro Suyama

Hiroshi Kobayashi

Hiroki Kawakami

Takamasa Ikeda

Yuki Nishimura

Yasuhida Naito

Takanori Ichinomiya

A sample support body includes: an insulating substrate having a measurement region formed with a plurality of through holes; a frame formed with an opening part opening to a first face and a second face to correspond to the measurement region, and formed on the first surface such that the opening part overlaps the measurement region when viewed from a thickness direction of the substrate; an adhesive layer to bond the substrate and the frame and having a protruding portion protruding from an inner surface of the opening part toward the measurement region; and a conductive layer having a first portion provided along the inner surface of the opening part, a second portion provided along the first surface of the measurement region, and a third portion provided along a surface of the protruding portion so as to connect the first portion and the second portion.

Specimen carrier and method for manufacturing specimen carrier

A sample support is used for ionization of a sample. The sample support includes a film part having a first front surface and a first back surface, the film part being formed with a plurality of through-holes, and a support part defining a measurement region for ionizing the sample with respect to the film part and supporting the film part. The support part includes an inner portion having a second front surface and a second back surface, the film part being fixed to the inner portion, and an outer portion having a third front surface and a third back surface and extending along an outer edge of the inner portion. A difference generated between a position of the first front surface and a position of the third front surface in a thickness direction of the film part is smaller than a thickness of the film part.

Sample support, adapter, ionization method and mass spectrometry method

A surface-assisted laser desorption/ionization method according to an aspect includes: a first process of preparing a sample support () having a substrate () in which a plurality of through-holes (S) passing from one surface () thereof to the other surface () thereof are provided and a conductive layer () that covers at least the one surface (); a second process of placing a sample () on a sample stage () and arranging the sample support () on the sample () such that the other surface () faces the sample (); and a third process of applying a laser beam (L) to the one surface () and ionizing the sample () moved from the other surface () side to the one surface () side via the through-holes (S) due to a capillary phenomenon.

Surface-assisted laser desorption/ionization method, mass spectrometry method and mass spectrometry device

A sample support includes: a substrate having a plurality of through-holes opening on a first surface and on a second surface; a first member having a plurality of first openings and disposed on the first surface; a second member having a plurality of second openings and disposed on the second surface, and; a bonding member disposed between the first member and the second member; and a conductive layer integrally provided on a region of the second surface corresponding to each of the plurality of second openings. The plurality of through-holes include a plurality of first through-holes located between each of the plurality of first openings and each of the plurality of second openings, and a plurality of second through-holes located between the first member and the second member. Each of the plurality of second openings communicate with each of the plurality of first openings through the plurality of first through-holes.

Sample support

A sample support body is a sample support body for ionizing a sample, including: a substrate formed with a plurality of first through holes opening to a first surface and a second surface opposite to each other; and a conductive layer provided at least on a peripheral portion of the first through hole in the first surface, in which in a partition portion provided between the adjacent first through holes, a plurality of second through holes communicating the adjacent first through holes are formed.

Sample support, and manufacturing method of sample support

A sample support is a sample support for sample ionization, including: a substrate formed with a plurality of through holes opening to a first surface and a second surface on a side opposite to the first surface; a conductive layer provided not to block the through hole in the first surface; and a reinforcement member disposed inside a part of the plurality of through holes.

Sample support, sample ionization method, and mass spectrometry method

A sample support body for ionization of a sample, including: a substrate having a first surface, a second surface on a side opposite to the first surface, and a plurality of through-holes opening on each of the first surface and the second surface; a conductive layer provided on the first surface; and a matrix crystal layer provided on at least one of the conductive layer and the second surface, in which the matrix crystal layer is formed of a plurality of matrix crystal grains so as to include a gap communicating the plurality of through-holes with an outside.

Sample support, method for producing sample support, ionization method and mass spectrometry method

A sample support body is a sample support body for ionizing a sample, including: a substrate having an irregular porous structure formed to communicate a first surface and a second surface opposite to each other; and a conductive layer provided at least on the first surface.

A sample support is a sample support for sample ionization, including: a substrate formed with a plurality of through holes opening to a first surface and a second surface on a side opposite to the first surface; a conductive layer provided not to block the through hole in the first surface; and a frame body provided in a peripheral portion of the substrate to surround an ionization region in which a sample is ionized when viewed in a thickness direction of the substrate, in which a marker for recognizing a position in the ionization region is provided in the frame body.

Provided is a sample support body that includes a substrate, an ionization substrate, a support, and a frame. The ionization substrate has a plurality of measurement regions for dropping a sample on second surface. A plurality of through-holes that open in a first surface and the second surface are formed at least in the measurement regions of the ionization substrate. A conductive layer is provided on peripheral edges of the through-holes at least on the second surface. The frame has a wall provided on peripheral edges of the measurement regions on the second surface to separate the plurality of measurement regions when viewed in the direction in which the substrate and the ionization substrate face each other.

Sample support body

Provided is a sample support body that includes a substrate, an ionization substrate, and a support. The ionization substrate has a plurality of measurement regions for dropping a sample on a second surface. A plurality of through-holes that open in a first surface and the second surface are formed at least in the measurement regions of the ionization substrate. A conductive layer is provided on peripheral edges of the through-holes at least on the second surface. The support has a first support provided on peripheral edges of the measurement regions on the first surface to separate the plurality of measurement regions when viewed in the direction in which the substrate and the ionization substrate face each other.

Provided is a sample support body that includes: a substrate having a first surface and a second surface opposite to each other; and a conductive layer provided on at least the first surface. A plurality of through-holes, which open to the second surface and a third surface of the conductive layer which is located on a side opposite to the substrate, are formed in the substrate and the conductive layer. At least one of the second surface and the third surface is subjected to surface treatment for providing a difference in an affinity with water between a surface close to the second surface and a surface close to the third surface.

Sample support body, production method for sample support body, and sample ionization method

A sample support body is for ionization of a sample. The sample support body includes a substrate including a first surface and a second surface on sides opposite to each other, and a conduction layer provided at least on the first surface. A plurality of through-holes opening on the first surface and the second surface are formed in an effective region of the substrate, the effective region being for ionizing components of the sample. A width of a second opening on the second surface side is larger than a width of a first opening on the first surface side in each of the plurality of through-holes.

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Hamamatsu, Japan

Masahiro Kotani