Denso Corporation

Sintokogio, Ltd.

Masahiro Kitagawa

Junichi Nagata

Akio Kojima

Hiroyuki Obata

Tomohisa Kishigami

Hiroyuki Mori

Hiroyuki Ban

Youichirou Suzuki

Noboru Maeda

Kiyoshi Yamamoto

Tomoyuki Koike

Hirokazu Itakura

Katsuhito Takeuchi

Shinichi Maeda

Masaji Shiga

Hiroyuki Kawabata

An inter-line switching element formed of a MOSFET is provided between a pair of signal lines. When the level of a differential signal changes from high to low, a control circuit turns on the FET for a fixed period thereby to suppress ringing by decreasing the impedance between the signal lines when the level of the differential signal transitions, and causing the energy of the distortion of the differential signal waveform to be absorbed by the on-resistance of the FET.

Ringing suppression circuit

An operation switching circuit switches over two comparators, which receives communication data, in accordance with a normal mode and a standby mode of a microcomputer. A delay circuit delays a mode switching signal. The mode switching signal and the delayed signal are combined by an OR gate and an AND gate to two comparator control signals, which have different high level periods. The comparators are driven by the comparator control signals, while a multiplexer is driven by the delayed signal. When one comparator is switched from the inoperative state to the operative state, the other comparator is continued to be held operative for the delay period before being switched to the inoperative state.

Comparator switching apparatus and method

A drive circuit that supplies electric power to an electric load from a DC electric source includes a pair of series-connected first and second MOSFETS of the same conduction type, a pair of clamp circuits respectively connected between the drains and gates of the first and second MOSFETS, a series circuit of a first resistor and a switch, a first test terminal; a second test terminal connected to a joint of the first and second MOSFETS, a third test terminal for operating the switch, a fourth test terminal connected a joint of the first resistor and the switch; and a second resistor connected between the gate of the second MOSFET and the first test terminal. The switch and the first resistor are connected between the gate and the source of the first MOSFET to close when the drive circuit is normally operated and to open when it is given a high voltage test.

Drive circuit and method of applying high voltage test thereon

A constant voltage supplying circuit including an output transistor is connected to a power source line and an output terminal. A base-emitter voltage of the output transistor is detected by a voltage detecting circuit composed of a transistor. A current-outputting circuit for supplying a current determined based on the voltage detected by the voltage detector to a reference voltage supplying circuit is used in the constant voltage supplying circuit. The reference voltage is supplied to a base of the output transistor to cancel a base-emitter voltage of the output transistor and to equalize the output voltage to a voltage generated in a reference voltage generating element included in the reference voltage supplying circuit. In this manner, the output voltage is kept constant notwithstanding variation of output current.

Circuit for supplying constant voltage

A centrifugally projecting apparatus is provided to allow a liner to be easily exchanged, to prevent projecting members from projecting through the connected parts of the liner components, and to prevent an impeller cover from being abraded. The apparatus comprises bolts and a fixing member (hook members ) to press first and second-side liner components A, front and rear-side liner components A, and a frame-liner component against a ceiling-side liner component so that they are fixed to each other.

Centrifugal projecting machine

A constant voltage circuit robust to the input voltage lowering is disclosed. The invention is applied to a constant voltage circuit fed with an input voltage through first and second power conductors for transferring the input voltage to a load as an output voltage through an output transistor. An inventive constant voltage circuit is provided with a substitute circuit, responsive to a detection of the lowing of the input voltage to a predetermined voltage, for providing a substitute output path that is connected in parallel with the output transistor. Doing this minimize the degree of lowering of the second voltage due to the lowering of said first voltage. The output transistor may be nay of NPN and PNP transistors and P-type and N-type MOS FETs.

Constant voltage circuit with a substitute circuit in case of input voltage lowering

In the high side switch type of electrical load driving circuit, wherein an N channel MOS transistor is provided on the circuit for supplying power to the electrical load, a zener diode is provided between the drain and the source of the MOS transistor to protect the MOS transistor. A load is provided between the gate and the ground to protect the MOS transistor. In this circuit, when a positive high voltage is induced on the side of the electrical load, the zener and a parasitic diode of the MOS transistor flows forward currents which absorb the high voltage noise. When a negative high voltage noise is induced from the side of the electrical load, a breakdown current flows through the zener diode, so that the voltage difference between the drain and source is clamed to a predetermined voltage. Then, the diode turns on the MOS transistor. Thus, the MOS transistor can be surely protected from high voltage noises without increasing the current capacities of elements for the protection circuit.

Growing community of inventors

Nukata-gun, Japan

Masahiro Kitagawa