International Business Machines Corporation

National Research Council of Canada

Jeol Ltd.

Jeol Usa, Inc.

Masahiro Kawasaki

Yun-Yu Wang

Anthony Gene Domenicucci

John Gerard Gaudiello

Michael Abramovich Gribelyuk

John Bruley

Marco Beleggia

Ray Egerton

Marek Malac

New methods for phase contrast imaging in transmission electron microscopy use the imaging electron beam itself to prepare a hole-free thin film for use as an effective phase plate, in some cases eliminating the need for ex-situ fabrication of a hole and reducing requirements for the precision of the ZPP hardware. The electron optical properties of the ZPP hardware are modified primarily in two ways: by boring a hole using the electron beam; and/or by modifying the electro-optical properties by charging induced by the primary beam. Furthermore a method where the sample is focused by a lens downstream from the ZPP hardware is disclosed. A method for transferring a back focal plane of the objective lens to a selected area aperture plane and any plane conjugated with the back focal plane of the objective lens is also provided.

Charging of a hole-free thin film phase plate

An inline electron holograph method for observing a specimen with a transmission electron microscope having an electron gun, a collimating lens system, two spaced objective lenses, a biprism, and an imaging means comprises the steps of: with the first objective lens forming a virtual image of a portion of the specimen; with the second objective lens focussing the virtual image at an intermediate image plane to form an intermediate image; and projecting the intermediate image onto the imaging means.

Electron holography method

Growing community of inventors

Peabody, MA, United States of America

Masahiro Kawasaki