Mitsubishi Electric Corporation

Masahiko Uno

Hirohisa Nishino

Kenji Teramoto

Takuya Monden

Takao Ohara

In a rotary switch (), a rotation unit () is rotatably supported by a holder unit (). The holder unit () is fixed onto a detection surface of a touch panel (). Contact points () make contact with the detection surface of the touch panel () with their positional relationship corresponding to a function of the rotary switch (). A contact point () rotates while making contact with the detection surface of the touch panel (), as the rotation unit () rotates.

Operating tool, input device, and electronic device

The method comprises a first step (Sin FIG.) of obtaining a transmission image, a second step (S) of applying a quadratic differential filter to the transmission image, thereby to emphasize a part of large luminance change as a quadratic differential filter image, a third step (S) of binarizing the quadratic differential filter image with a predetermined threshold value, and then storing the resulting binarized image, a fourth step (S) of binarizing the transmission image with another predetermined threshold value, and then storing the resulting binarized image, a fifth step (S) of performing the measurement of binary feature quantities for the binarized image stored at the third step (S) and the binarized image stored at the fourth step (S), and a sixth step (S) of deciding the quality of the object to-be-inspected from the binary feature quantities.

Image inspection method and image inspection apparatus employing the same

A display device includes a display panel having a display plane, a frame having an opening formed at an area corresponding to the display plane, for holding the periphery of the display panel, a protecting cover for protecting the display plane, and two transparent adhesive sheets arranged in the gap between the display plane and the protecting cover.

Display device

In an inspection of a semiconductor wafer for a defect, when infrared light passing through a semiconductor wafer is imaged by a camera and an inspection is conducted using the image, a problem that halation occurs in the camera due to light leaking from the side of the inspection object, which makes it impossible to conduct an inspection at the periphery portion occurs. An inspection object is irradiated by an infrared light source, and transmitted light is imaged by an infrared camera to be conducted. With the use of mask means that secures a clearance from the end portion on the outer side, it is possible to inspect on the peripheral portion. Also, as means for supporting the object, plural sets of those configured to be capable of evacuating are used, and by allowing the plural sets to evacuate alternately, it is possible to inspect across the entire surface.

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Tokyo, Japan

Masahiko Uno