Adv Antest Corporation

Masahiko Takikawa

Yoshiyuki Hata

Makoto Nakanishi

Taku Sato

Tomoo Yamanouchi

Junichi Okayasu

Daiju Terasawa

A semiconductor switch is configured to conduct or cutoff a signal path from its first terminal to its second terminal. An enhancement-type first transistor is arranged between the first terminal and the second terminal. A first bias circuit is connected to apply a gate voltage Vthat corresponds to a control signal Vto the gate of the first transistor when the power supply voltages Vand Vare supplied. A second bias circuit is connected such that a voltage that corresponds to the lower voltage of the voltages at the first terminal and the second terminal is applied to the gate of the first transistor when the power supply voltages Vand Vare not supplied.

Semiconductor switch

There is provided a semiconductor switch apparatus that can handle a wide range of input voltages. The switch apparatus includes a main switch that is provided between a first terminal and a second terminal, and a switch controller that, to turn on the main switch, supplies the same gate-source voltage to the main switch irrespective of a direction of a current flowing through the main switch. To turn on the main switch, the switch controller supplies the gate-source voltage that is determined based on at least one of a voltage of the first terminal and a voltage of the second terminal to a gate of the main switch.

Switch apparatus and test apparatus

To perform a forcible disconnection when voltage outside a reference range is applied to a terminal, provided is a switching apparatus comprising a main switch provided between a first terminal and a second terminal; a voltage detection section that detects whether voltage of the second terminal is within a reference range; and a control section that controls the main switch according to a control signal received from a control terminal and turns OFF the main switch when the voltage of the second terminal is outside the reference range. The voltage detection section includes a detection switch that disconnects the second terminal and the control section from each other when the voltage of the second terminal is within the reference range and connects the second terminal and the control section to each other when the voltage of the second terminal is outside the reference range.

Switching apparatus and test apparatus

It is an objective to provide a semiconductor device with low leak current. The semiconductor device includes a plurality of ground side electrodes and a plurality of signal side electrodes arranged on a semiconductor substrate in an alternating manner; a plurality of control electrodes arranged respectively between each pair of a ground side electrode and a signal side electrode; a ground side electrode connecting section that connects the ground side electrodes to each other; a signal side electrode connecting section that connects the signal side electrodes to each other; and ground side lead wiring and signal side lead wiring that extend respectively from a region near one end and a region near another end of an arranged electrode section, in which the ground side electrodes and the signal side electrodes are arranged in an arrangement direction, away from the arranged electrode group in the arrangement direction.

Growing community of inventors

Tokyo, Japan

Masahiko Takikawa