Fuji Electric Co., Ltd.

Fuji Electric Device Technology Co., Ltd.

Fuji Electric Systems Co. Ltd.

Fuji Electric Holdings Co., Ltd.

Masaharu Edo

Katsunori Ueno

Shinya Takashima

Ryo Tanaka

Takayuki Hirose

Akira Sato

Hideaki Matsuyama

Hiroyuki Yoshimura

Hideaki Teranishi

Takuro Inamoto

Akira Uedono

Zenchi Hayashi

Chizuru Inoue

Daisuke Mori

Hirotaka Suda

A nitride semiconductor device is provided, comprising: a first nitride semiconductor layer of a first conductivity-type; a second nitride semiconductor layer of a second conductivity-type provided above the first nitride semiconductor layer; a junction region of a first conductivity-type which is provided to extend in a direction from a front surface of the second nitride semiconductor layer to the first nitride semiconductor layer and has a doping concentration Nequal to or higher than that of the first nitride semiconductor layer; and a source region of a first conductivity-type which is provided more shallowly than the junction region and has a doping concentration equal to or higher than the doping concentration N, wherein a dopant of the source region is an element with an atomic weight larger than that of a dopant in the junction region.

Nitride semiconductor device and method for fabricating nitride semiconductor device

A gallium nitride based semiconductor device is provided, where when a thickness of a transition layer is defined as the followings, the thickness of the transition layer is less than 1.5 nm: (i) a distance between a depth position at which an atomic composition of nitrogen element constituting the gallium nitride based semiconductor layer is &#xbd; relative to that at a position on the GaN based semiconductor layer side sufficiently away from the transition layer, and a depth position at which an atomic composition of a metal element is &#xbd; of a value of a maximum if an atomic composition of the metal element constituting an insulating layer has the maximum, or a depth position at which an atomic composition of the metal element is &#xbd; relative to that at a position on the insulating layer side sufficiently away from the transition layer if not having the maximum.

Gallium nitride based semiconductor device and manufacturing method of gallium nitride based semiconductor device

A manufacturing method of a vertical GaN-based semiconductor device having: a GaN-based semiconductor substrate; a GaN-based semiconductor layer including a drift region having doping concentration of an n type impurity, which is lower than that of the GaN-based semiconductor substrate, and is provided on the GaN-based semiconductor substrate; and MIS structure having the GaN-based semiconductor layer, an insulating film contacting the GaN-based semiconductor layer, and a conductive portion contacting the insulating film, the method includes: implanting an n type dopant in a back surface of the GaN-based semiconductor substrate after forming of the MIS structure, and annealing the GaN-based semiconductor substrate after the implanting of the n type dopant.

Manufacturing method of vertical GaN-based semiconductor device and vertical GaN-based semiconductor device

A diode is provided, the diode including: a semiconductor layer of a first conductivity type, configured to have a trench structure and be an epitaxial layer of a wide gap semiconductor; a semiconductor layer of a second conductivity type, configured to be at least in contact with a side wall of the trench structure and be an epitaxial layer of the wide gap semiconductor; and an electrode configured to be in contact with the semiconductor layer of the first conductivity type and the semiconductor layer of the second conductivity type, on the semiconductor layer of the first conductivity type and the semiconductor layer of the second conductivity type.

Diode and method of manufacturing diode

Provided is a semiconductor device including at least two isolation trench portions; a mesa region that is provided between the at least two isolation trench portions and includes a source region having a first conduction type, a base region having a second conduction type and at least a portion thereof provided below the source region, and a gate trench portion; and a contact layer that is an epitaxial layer provided at least in contact with side portions of the mesa region and bottom portions of the isolation trench portions positioned lower than the gate trench portion, and having a second-conduction-type impurity concentration higher than that of the base region, wherein the same impurities as in the contact layer are present in the source region, or the contact layer is provided higher than the source region.

Semiconductor device and manufacturing method of semiconductor device

A vertical semiconductor apparatus includes: a gallium nitride substrate; a gallium nitride semiconductor layer on the gallium nitride substrate; a p-type impurity region in the gallium nitride semiconductor layer and having an element to function as an acceptor for gallium nitride; an n-type impurity region in the p-type impurity region and having an element to function as a donor for gallium nitride; and an electrode provided contacting a rear surface of the gallium nitride substrate. The element to function as the donor in the n-type impurity region includes: a first impurity element to enter sites of gallium atoms in the gallium nitride semiconductor layer; and a second impurity element different from the first impurity element and to enter sites of nitrogen atoms in the gallium nitride semiconductor layer. In the n-type impurity region, a concentration of the first impurity element is higher than that of the second impurity element.

Semiconductor device and method of manufacturing semiconductor device

In order to improve the dynamic characteristics of a vertical MOSFET using GaN, it is an objective of the present invention to reduce the resistance of a current path with a long hole movement distance in a p-type well. Provided is a vertical MOSFET including a gallium nitride layer having a main surface that is a non-polar surface; a p-type well region that is provided with a stripe shape in the main surface of the gallium nitride layer; and a stripe-shaped electrode provided above the p-type well region. Hole mobility is higher in a direction orthogonal to an extension direction of the stripe-shaped electrode than in the extension direction, among directions in a plane parallel to the main surface.

Vertical MOSFET

In a case where a semiconductor layer is epitaxially grown on a step shape formed due to CBL (current blocking layer) formation, the crystallinity of the semiconductor layer lowers. Also, a GaN layer that is epitaxially regrown on the CBL is not formed continuously by epitaxial growth, and therefore the crystallinity of the GaN layer lowers. A vertical semiconductor device manufacturing method is provided that comprises: a step of epitaxially growing a gallium nitride-based n-type semiconductor layer on a gallium nitride-based semiconductor substrate; a step of epitaxially growing a gallium nitride-based p-type semiconductor layer on the n-type semiconductor layer; and a step of ion-implanting p-type impurities to form a p-type embedded region selectively in a predetermined depth range across the boundary between the n-type semiconductor layer and the p-type semiconductor layer.

Vertical semiconductor device and manufacturing method thereof

When a nitride semiconductor layer into which impurity ions have been implanted is subjected to annealing after a protective film is provided on the nitride semiconductor layer, vacancy defects may be disadvantageously prevented from escaping outside through the surface of the nitride semiconductor layer and disappearing. A manufacturing method of a semiconductor device including a nitride semiconductor layer is provided. The manufacturing method includes implanting impurities into the nitride semiconductor layer, performing a first annealing on the nitride semiconductor layer at a first temperature within an atmosphere of a nitrogen atom containing gas without providing a protective film on the nitride semiconductor layer, forming the protective film on the nitride semiconductor layer after the first annealing, and after the protective film is formed, performing a second annealing on the nitride semiconductor layer at a second temperature that is higher than the first temperature.

Manufacturing method of semiconductor device

When a defect region is present near the pn junction in a GaN layer, lattice defects are present in the depletion layer. Therefore, when a reverse bias is applied to the pn junction, the defects in the depletion layer cause the generated current to flow as a leakage current. The leakage current flowing through the depletion layer can cause a decrease in the withstand voltage at the pn junction. Provided is a semiconductor device using gallium nitride, including a gallium nitride layer including an n-type region. The gallium nitride layer includes a first p-type well region and a second p-type well region that is provided on at least a portion of the first p-type well region and has a peak region with a higher p-type impurity concentration than the first p-type well region.

Semiconductor device and manufacturing method of the semiconductor device

In case of performing annealing at a temperature of 1300&#xb0; C. or higher, it is not possible to sufficiently suppress escape of nitrogen from a GaN layer even if a cap layer is provided thereon. Thereby, the front surface of the GaN layer is roughened. A semiconductor device manufacturing method of manufacturing a semiconductor device having a nitride semiconductor layer is provided. The semiconductor device manufacturing method includes: implanting, into a predetermined region of the nitride semiconductor layer, n-type or p-type impurities relative to the nitride semiconductor layer; forming, by atomic layer deposition, a first protective film containing a nitride on and in direct contact with at least the predetermined region; and annealing the nitride semiconductor layer and the first protective film at a temperature of 1300&#xb0; C. or higher.

Method for high temperature annealing of a nitride semiconductor layer

An ion implantation results in defects generated in a nitride semiconductor layer. If the nitride semiconductor layer is set at a particular temperature for a predetermined time period after the ion implantation, the defects may probably be clustering. Provided is a manufacturing method of a semiconductor device including a nitride semiconductor layer comprising: implanting impurities in the nitride semiconductor layer; and increasing a temperature of the nitride semiconductor layer from an initial temperature to a target temperature and annealing the nitride semiconductor layer at the target temperature for a predetermined time period; wherein in the annealing, in at least part of temperature regions below a first temperature between the initial temperature and the target temperature, the nitride semiconductor layer is annealed at a temperature increase speed lower than in a temperature region not lower than the first temperature.

Manufacturing method of semiconductor device including a nitride semiconductor layer

A method of manufacturing a nitride semiconductor device is provided, comprising: forming, on a substrate, a first laminated body where a first nitride semiconductor layer, a second nitride semiconductor layer and a third nitride semiconductor layer are laminated in this order; subsequent to the forming, removing a partial region of the third nitride semiconductor layer, subsequent to the removing; implanting ions to the first nitride semiconductor layer from the partial region where the third nitride semiconductor layer is removed at least through the second nitride semiconductor layer; and subsequent to the implanting the ions, annealing the first laminated body.

Method of manufacturing nitride semiconductor device using laminated cap layers

A method for producing a semiconductor device having a nitride-based semiconductor layer includes forming an aluminum nitride layer on a surface of the nitride-based semiconductor layer at a forming temperature and in a growth atmosphere for aluminum nitride; and performing a thermal treatment on the nitride-based semiconductor layer and the aluminum nitride layer, at a treatment temperature that is higher than the forming temperature and in the growth atmosphere for aluminum nitride. For example, an n-GaN layer is formed on an n-GaN substrate, and thereafter the n-GaN layer is doped with an impurity. A cap layer of an epitaxial film made up of AlN is formed, by MOCVD, on the surface of the n-GaN layer. Thermal treatment for activation annealing activates the impurity in the n-GaN layer in an atmosphere that causes AlN to grow, or in an atmosphere in which growth and decomposition of AlN are substantially balanced.

Method for producing a semiconductor device, and semiconductor device

A powder magnetic core with improved high frequency magnetic characteristics and reduced eddy current loss is manufactured by a manufacturing method including the steps of (a) providing coated soft magnetic particles which are particles composed of soft magnetic material which each have been coated with an insulating coating, and insulator particles; (b) forming a magnetic layer by press molding the coated soft magnetic particles in a mold assembly; (c) forming an insulator layer on the magnetic layer by press molding the insulator particles in the mold assembly; and (d) repeating the steps (b) and (c) to fabricate a laminate of alternating magnetic layers and insulator layers and provide the powder magnetic core.

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Tokorozawa, Japan

Masaharu Edo