Growing community of inventors

Tokyo, Japan

Masafumi Watanabe

Average Co-Inventor Count = 2.06

ph-index = 6

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 168

Masafumi WatanabeYuki Ashino (8 patents)Masafumi WatanabeNaoko Ito (6 patents)Masafumi WatanabeMasato Yamane (5 patents)Masafumi WatanabeKazutoshi Watanabe (3 patents)Masafumi WatanabeMasatsugu Shigeno (3 patents)Masafumi WatanabeHideyuki Akiyama (3 patents)Masafumi WatanabeNatsuko Tsutazawa (3 patents)Masafumi WatanabeWen Zheng Li (2 patents)Masafumi WatanabeYoichiro Morita (2 patents)Masafumi WatanabeMasahiro Toyama (2 patents)Masafumi WatanabeAya Ohmae (2 patents)Masafumi WatanabeKantaro Maruoka (2 patents)Masafumi WatanabeKota Toida (2 patents)Masafumi WatanabeHiroshi Ikeda (1 patent)Masafumi WatanabeAtsushi Nakamura (1 patent)Masafumi WatanabeKentaro Yamada (1 patent)Masafumi WatanabeSusumu Ito (1 patent)Masafumi WatanabeShigeru Wakiyama (1 patent)Masafumi WatanabeHirofumi Ueda (1 patent)Masafumi WatanabeHiroyoshi Yamamoto (1 patent)Masafumi WatanabeKazuo Chinone (1 patent)Masafumi WatanabeNoriaki Sakai (1 patent)Masafumi WatanabeRyusuke Hirose (1 patent)Masafumi WatanabeTakehiro Yamaoka (1 patent)Masafumi WatanabeToshitada Takeuchi (1 patent)Masafumi WatanabeShoichi Hasegawa (1 patent)Masafumi WatanabeSatoshi Fujino (1 patent)Masafumi WatanabeHiroumi Momota (1 patent)Masafumi WatanabeToshihiro Ueno (1 patent)Masafumi WatanabeTaniya Singh (1 patent)Masafumi WatanabeMasafumi Watanabe (34 patents)Yuki AshinoYuki Ashino (22 patents)Naoko ItoNaoko Ito (30 patents)Masato YamaneMasato Yamane (11 patents)Kazutoshi WatanabeKazutoshi Watanabe (75 patents)Masatsugu ShigenoMasatsugu Shigeno (26 patents)Hideyuki AkiyamaHideyuki Akiyama (13 patents)Natsuko TsutazawaNatsuko Tsutazawa (6 patents)Wen Zheng LiWen Zheng Li (47 patents)Yoichiro MoritaYoichiro Morita (23 patents)Masahiro ToyamaMasahiro Toyama (13 patents)Aya OhmaeAya Ohmae (9 patents)Kantaro MaruokaKantaro Maruoka (3 patents)Kota ToidaKota Toida (2 patents)Hiroshi IkedaHiroshi Ikeda (84 patents)Atsushi NakamuraAtsushi Nakamura (83 patents)Kentaro YamadaKentaro Yamada (41 patents)Susumu ItoSusumu Ito (26 patents)Shigeru WakiyamaShigeru Wakiyama (19 patents)Hirofumi UedaHirofumi Ueda (17 patents)Hiroyoshi YamamotoHiroyoshi Yamamoto (17 patents)Kazuo ChinoneKazuo Chinone (14 patents)Noriaki SakaiNoriaki Sakai (8 patents)Ryusuke HiroseRyusuke Hirose (6 patents)Takehiro YamaokaTakehiro Yamaoka (5 patents)Toshitada TakeuchiToshitada Takeuchi (4 patents)Shoichi HasegawaShoichi Hasegawa (4 patents)Satoshi FujinoSatoshi Fujino (3 patents)Hiroumi MomotaHiroumi Momota (2 patents)Toshihiro UenoToshihiro Ueno (2 patents)Taniya SinghTaniya Singh (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Nec Corporation (19 from 35,658 patents)

2. Hitachi High-tech Science Corporation (9 from 223 patents)

3. Renesas Electronics Corporation (3 from 7,524 patents)

4. Nec Electronics Corporation (3 from 2,467 patents)


34 patents:

1. 12061730 - Security assessment apparatus, security assessment method, and non-transitory computer readable medium

2. 12045342 - Information processing device, display method, and non-transitory computer readable medium

3. 11860604 - Analysis assistance apparatus, analysis assistance method, and computer-readable recording medium

4. 11847216 - Analysis device, analysis method and computer-readable recording medium

5. 11646188 - Apparatus and method for analyzing evolved gas

6. 11640463 - Analysis device, analysis method and computer-readable recording medium

7. 11579596 - Plant monitoring apparatus, plant monitoring method, and computer readable recording medium

8. 11436325 - Analysis device, analysis method, and storage medium in which analysis program is recorded

9. 10931468 - Analysis system, analysis method, and storage medium

10. 10554383 - Analysis system, analysis method, and storage medium

11. 10536261 - Analysis system, analysis method, and storage medium

12. 10528730 - Analysis device, analysis method, and storage medium in which analysis program is recorded

13. 10466271 - Scanning probe microscope and optical axis adjustment method for scanning probe microscope

14. 10360378 - Analysis device, analysis method and computer-readable recording medium

15. 10161958 - Three-dimensional fine movement device

Please report any incorrect information to support@idiyas.com
idiyas.com
as of
12/8/2025
Loading…