Canon Kabushiki Kaisha

Masafumi Kyogaku

Kota Iwasaki

Yoichi Otsuka

Hiroyuki Hashimoto

Hironobu Mizuno

Takeo Tsukamoto

Yohei Murayama

Tetsuo Hino

Koki Nukanobu

Yasuhiro Fushimoto

Naofumi Aoki

Masaki Yamada

Hiroshi Inoue

Manabu Komatsu

Kiyoshi Takimoto

Kazuya Miyazaki

Hiroaki Watanabe

Takumi Furukawa

Yasuhiro Hamamoto

Yuya Tomomizu

Norifumi Muranaka

Kenya Terada

Koichi Tanji

Toshimitsu Nakazawa

Kazunari Oyama

Jumpei Naito

Koji Makara

An electroconductive elastic body includes: a cross-linked product of a first ionic electro-conductive rubber, a cross-linked product of a second ionic electro-conductive rubber, and at least one of a fatty acid and a fatty acid metal salt; wherein the electroconductive elastic body has a matrix that includes the cross-linked product of the first ionic electro-conductive rubber, and a domain that includes the cross-linked product of the second ionic electro-conductive rubber; the cross-linked product of the second ionic electro-conductive rubber includes a polyether skeleton; an electrical resistance of the domain is lower than an electrical resistance of the matrix; in a waveform separation profile of the elastic body as obtained by a small-angle X-ray scattering method, A2 and A1 satisfy a relationship expressed by the following expression (1):0.005&#x2264;(2&#xd7;2/1&#xd7;1)&#x2264;0.030&#x2003;&#x2003;(1).

Electroconductive elastic body, electrophotographic member, process cartridge, and electrophotographic image-forming apparatus

An electro-conductive layer of an electrophotographic electro-conductive member has a matrix-domain structure. The matrix contains a first rubber. The domain contains a second rubber and electro-conductive particles. Where &#x3bc; represents an average of ratios of the cross-sectional area of the electro-conductive particles contained in each of the domains to the cross-sectional area of each of the domains appearing on a cross-section of the electro-conductive layer in a thickness direction, and &#x3c3; represents a standard deviation of the ratios, &#x3c3;/&#x3bc; is 0 or more and 0.4 or less, and &#x3bc; is 20% or more and 40% or less. At least eight of samples with a first cubic shape 9 &#x3bc;m on a side, which are sampled at arbitrary nine positions on the electro-conductive layer, satisfy the specified condition.

Electro-conductive member, method for producing same, process cartridge and electrophotographic image forming apparatus

A laser scanning microscope apparatus includes an irradiation unit including an objective lens, a photodetector unit, an XY-scanning unit, and a Z-scanning unit. The irradiation unit focuses a laser beam with the objective lens to a specimen. The photodetector unit detects light generated from a position irradiated with the laser beam focused. The XY-scanning unit scans the laser beam in an X-direction perpendicular to an optical axis of the objective lens and in a Y-direction perpendicular to the optical axis and the X-direction. The Z-scanning unit scans the laser beam in a Z-direction parallel to the optical axis. When acquiring XY-two-dimensional image data by detecting the light while scanning the irradiated position in the X-direction and the Y-direction, the apparatus detects the light while scanning the irradiated position also in the Z-direction.

Laser scanning microscope apparatus

An information processing device configured to process spectral information includes: a data obtaining unit configured to obtain three-dimensional distribution data of spectral information; a generating unit configured to generate two-dimensional image, data from the three-dimensional distribution data of spectral information; a display unit; a display control unit configured to display the two-dimensional image on the display unit; an information obtaining unit configured to obtain position information of a two-dimensional region which a user has selected from the two-dimensional image; and an extracting unit configured to extract, from a three-dimensional region corresponding to the two-dimensional region, in the three-dimensional distribution of spectral information, feature region information satisfying predetermined feature conditions.

Information processing device to process spectral information, and information processing method

To provide a mass spectrometer capable of performing high-sensitivity measurement using water molecules. The mass spectrometer has a chamber in which a sample is disposed, an irradiation unit for emitting particles to the sample, and an extraction electrode which leads secondary ions emitted from the sample to a mass spectrometry unit, in which the irradiation unit switches a first mode of emitting primary ions for causing the secondary ions to be emitted from the sample and a second mode of emitting particles containing water molecules to be made to adhere to the sample and emits the particles to the sample.

Mass spectrometer and mass image analyzing system

The present invention provides a mass distribution spectrometry which reduces an influence of the dispersion in the times at which ionizing beams irradiate a sample, on a mass spectrometry result, and can measure the mass distribution with high reliability. The mass distribution spectrometry is a mass spectrometry which includes irradiating the sample with a primary ion beam and detecting generated secondary ions, wherein this primary ion beam has a spread toward a direction perpendicular to a travelling direction, has a path length of each primary ion contained in the primary ion beam between a primary ion source and a surface of the sample adjusted by deflecting a trajectory, and is obliquely incident on the surface of the sample.

Mass distribution spectrometry method and mass distribution spectrometer

Provided is a sample analysis method of irradiating a sample with a primary ion beam to analyze a secondary ion emitted from the sample by mass spectrometry, the sample analysis method including the steps of cooling a sample placed in a chamber; forming an ice layer on a surface of the cooled sample by discharging one of water and an aqueous solution to the chamber; and irradiating the surface of the sample with the primary ion beam with the ice layer being formed thereon, wherein an amount of the water forming the ice layer is 0.1 ng/mmor more and 20 ng/mmor less.

Method of analyzing sample using secondary ion emitted from sample and analyzer for performing analysis method

A mass spectrometry apparatus includes a holding table that holds a specimen to be ionized, a probe that identifies a portion of the specimen to be ionized, an ion extraction electrode that extracts ions obtained by ionizing the specimen, a liquid supplying unit that supplies liquid to between the specimen and the probe to form a liquid bridge between the specimen and the probe, a vibrating unit that vibrates one of the probe and the holding table, an electric field generating unit that generates an electric field between the probe and the ion extraction electrode, a mass spectrometry unit that mass analyzes ions extracted by the ion extraction electrode, and a synchronization unit configured to synchronize a time at which ions are generated from the portion with a time at which the mass spectrometry unit measures the ions.

Ionization device, mass spectrometry apparatus, mass spectrometry method, and imaging system

Provided is an ionization apparatus including: a holder configured to hold a sample; a probe configured to determine a part to be ionized of the sample held by the holder; an extract electrode configured to extract ionized ions of the sample; a liquid supply unit configured to supply liquid to a part of a region of the sample; and a unit configured to apply a first voltage between the probe and the extract electrode, in which the first voltage is pulse-modulated.

Ionization apparatus, mass spectrometer including ionization apparatus, and image forming system

An optical measurement device includes a light source unit including a first laser light source configured to emit a laser beam having a first wavelength and a second laser light source configured to emit a laser beam having a second wavelength, a measurement wave number setting unit, and a light source adjustment unit configured to adjust at least one of the first wavelength and the second wavelength such that a difference between or a sum of a first wave number corresponding to the first wavelength and a second wave number corresponding to the second wavelength matches a measurement wave number set through the measurement wave number setting unit.

Light source adjustment unit, optical measurement device, subject information obtaining system, and wavelength adjustment program

The present invention provides an ion group irradiation device which includes: an ion source which generates an ion; and an ion group selecting unit which selects an ion group containing a cluster ion from ions released from the ion source, in an ion group irradiation device for irradiating a sample with the ion group, wherein the ion source has a pressure gradient forming unit for changing a pressure with which a material of the cluster ion is jetted, with time, the ion group selecting unit has a chopper which performs a chopping operation of selecting the ion group by passing and blocking the cluster ions in a traveling direction by the opening and closing of the chopper, and the chopper performs two or more times of the chopping operations per one time of a pressure gradient forming operation by the pressure gradient forming unit.

Ion group irradiation device and secondary ion mass spectrometer

To provide a method that reduces an influence of dependence of an ionizing beam in an incident direction or uneven irradiation to a sample on a result of mass spectrometry, and can measure mass distribution with high reliability. A mass distribution measuring method according to the present invention includes: changing a direction of irradiating the ionizing beam to a sample surface; acquiring a plurality of mass distribution images in a plurality of incident directions; performing image transform of the mass distribution images according to an angle formed by an incident direction of the ionizing beam and a substrate surface; synthesizing the plurality of transformed images; and outputting the synthesized mass distribution images.

Mass distribution measuring method and mass distribution measuring apparatus

In a driving method for an electron-emitting device in which an electron-emitting member made of an aggregate of carbon fibers is made to emit electrons by a voltage being applied between a cathode electrode on which the electron-emitting member is formed and a counter electrode disposed in opposition to the cathode electrode, a driving voltage V smaller than a maximum applied voltage Vmax is applied between the cathode electrode and the counter electrode to drive the electron-emitting device, the maximum applied voltage Vmax being a maximum voltage applied between the cathode electrode and the counter electrode before the start of driving.

Driving method for electron-emitting device, driving method for electron source, manufacturing method for electron source, and image display apparatus

To provide an electron-emitting device that can be used to manufacture an image forming apparatus having a superior display quality and in which the development of the abnormal light emission point is suppressed and the unevenness of brightness is not caused. The electron-emitting device includes: a cathode electrode and a gate electrode, which are formed on a base surface and opposed to each other with a space therebetween; and an electron-emitting film which is located on the cathode electrode, and in the electron-emitting device, the electron-emitting film has two end portions (A and B) in a plane substantially parallel to the base surface in a direction substantially perpendicular to a direction along which the cathode electrode and the gate electrode are opposed to each other, and a structure is used in which electric field strengths applied between each of the two end portions (A and B) of the electron-emitting film and the gate electrode are made weaker than an electric field strength applied between a region between the two end portions (A and B) of the electron-emitting film and the gate electrode at a time of driving.

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Yokohama, Japan

Masafumi Kyogaku