Canon Kabushiki Kaisha

Tokyo Juki Industrial Co., Ltd.

Masaaki Tsukiji

Tetsuharu Nishimura

Satoshi Ishii

Koh Ishizuka

Yoichi Kubota

Tadashi Eguchi

Ko Ishizuka

Shigemasa Kato

Sanae Takada

Kou Ishizuka

Chikara Satoh

Kotaro Hosaka

Katsumi Momose

Hiroji Narumi

Masamitsu Shibuya

A device for detecting the position of an information recording or reproducing head relative to a recording medium; the head is relatively rotatable around a first axis with respect to the recording medium, and rotatable around a second axis parallel to the first axis. The device includes an autocollimator for measuring a relative positional relationship of the head substantially along the direction of the rotation around the second axis, a rotating table on which either the combination of the recording medium and the head or the autocollimator is mounted to activate the rotational movement substantially around the second axis, and a control unit. The control unit rotates the rotating table in response to the obtained position of the head with respect to the recording medium. According to the measurement result by the autocollimator, the control unit accomplishes a relative positional controlling in which a relative positional relationship between the autocollimator and the head is kept constant. As a result, a compact and high-accuracy head positioning device is achieved.

Head positioning using a disk drive mounted to a rotating table

An interferometer for measuring the displacement of a diffraction grating includes a multi-mode semiconductor laser for generating a laser beam; a device for supplying a predetermined current to the laser so that at least five vertical modes occur in an oscillation spectrum of the laser beam generated by the laser at an intensity ratio of at least 0.05; and an optical system for splitting the laser beam generated by the laser into first and second beams. The optical system also directs the first and second beams to the diffraction grating and effects interference between a first diffracted light beam generated by the diffraction of the first beam at the diffraction grating and a second diffracted light beam generated by the diffraction of the second beam at the diffraction grating to produce an interference light beam. Also provided is a photoelectric convertor for converting the interference light beam into an electrical signal.

Encoder utilizing interference using multi-mode semiconductor laser

A method of and apparatus for optically detecting the position or amount of movement of a movable object, in which a plurality of position data element arrays are provided on a scale attached to the object such that the arrays are arranged in the direction of movement of the object. A string of light beam such as a laser beam, which extends in the same direction as the position data element array, is made to illuminate one of the arrays, and the light reflected by or transmitted through the position data element array is received by a sensor array such as CCD sensor which produces a signal representing the pattern of arrangement of the data elements in the illuminated position data element array and indicating absolute position of the object, whereby the instant absolute position of the object is detected.

Method of optically detecting position of object and position detecting

Disclosed is an optical apparatus which can be used for measuring displacement of an object. The apparatus includes an optical system for forming a linearly polarized beam whose polarization direction changes, a reflecting surface for reflecting the beam and for directing the beam in a predetermined direction, a photoelectric converter for photoelectrically converting a reflected beam directed in the predetermined direction, a polarizing device, arranged in an optical path of the reflected beam, for directing only a P-polarized beam or an S-polarized beam of the reflected beam toward the photoelectric converter.

Optical apparatus for measuring displacement of an object

A device comprises output device for receiving signals having predetermined phases and outputting first and second signals having different phase angles and amplitudes, conversion device for converting the first signal into a first binary signal and the second signal into a second binary signal, the conversion device being arranged so that widths of the first and second binary signals are substantially equal to each other regardless of a difference in amplitude of the first and second signals, and generating device for generating first and second pulses according to phase angles on the basis of the first and second binary signals.

Device having signal interpolation circuit and displacement measuring

A displacement measuring apparatus comprises a scale relatively displaced to an irradiating beam, a reading head to read the scale by the irradiating beam, and control device to control the apparatus for avoiding substantially the leakage of the irradiating beam out of the apparatus in response to the positional error of the scale and the irradiating beam.

Displacement measuring apparatus

An encoder for measuring movement of an optical scale by photoelectrically converting light from the optical scale obtained by applying light from a light source to the optical scale, by means of light receiving element, includes detector for detecting a variation in intensity of the light received by the light receiving element and a comparator for comparing a signal from the detector with a predetermined reference signal. Consequently, a predetermined alarm signal is generated on the basis of the result of comparison obtained from the comparator. A measuring system for detecting a moving condition of an object, includes an optical scale connected to the object; a light source for applying light to the optical scale; a first detector for receiving light from the optical scale and for detecting the moving condition of the object; a second detector for detecting a variation in intensity of the light received by the first detector; and a signal forming device for forming a predetermined alarm signal on the basis of an output signal from the second detector.

Optical scale encoder with light intensity alarm

A scale, for measuring the displacement of an object to be examined, has a division and a mark for alignment of the division, and a displacement measuring apparatus, for measuring the displacement of a scale, has a device for reading the division of the scale and a detector for detecting the positional error of the division relative to the direction of the displacement.

Scale for use for measurement of the displacement of an object to be

An encoder in which a light beam emitted from a semiconductor laser or the like is applied to a diffraction grating from a predetermined direction which is not contained in a reference plane defined by direction of relative movement of the diffraction grating and a direction normal to the diffraction grating. A diffracted light created from the diffraction grating by the application of the light beam by the light applying means is reflected by re-entering means and the reflected light is caused to re-enter the diffraction grating at substantially the same position as the position at which the diffracted light is created. At this time, an interference light formed by the other re-diffracted lights than O-order light created from the diffraction grating substantially in the same direction as the predetermined direction by the re-entrance of the diffracted light by the re-entering means is detected, and the information of the relative displacement of the light beam and the diffraction grating is obtained from a variation in the intensity of the interference light.

Encoder incorporating a displaceable diffraction grating

In the reference-position detection method and apparatus for detecting a reference position of a scale, first and second patterns are disposed on the scale so that respective detection timings shift inversely to each other in response to a deviation in attitude of the scale. The first and second patterns are detected with timings different from each other by corresponding first and second sensors, and the reference position of the scale is determined according to outputs of respective sensors. Hence, even if the attitude of the scale changes from a predetermined attitude due to an inclination of the scale or a deviation in position of the scale, it is possible to exactly detect the reference position of the scale. Accordingly, it becomes also possible to increase the performance of a displacement measuring apparatus.

Method and apparatus for detecting a reference position of a rotating

An encoder of this invention radiates a light beam onto an optical scale, in which a reflection film is formed on a surface of a relief type diffraction grating formed on one surface of a light-transmission substrate, from a surface opposite to the formation surface of the diffraction grating, and detects a change in intensity of interference light caused by diffracted light produced by the diffraction grating, thereby measuring a displacement of the optical scale.

Relief diffraction grating encoder

A method for detecting a state of rotation of a rotary scale having a diffraction grating therein in which a radiation beam is directed to a first place on the diffraction grating to generate first and second diffracted beams. The first and second diffracted beams are re-diffracted at the first place to form a first re-diffracted beam and a second re-diffracted beam. The first and second re-diffracted beams are directed to a second place on the diffraction grating substantially opposite the first place with respect to the center of rotation of the rotary scale. The first and second re-diffracted beams are diffracted at the second place to interfere with each other so that an interference beam is formed. The interference beam is converted into a signal to detect the state of rotation of the rotary scale.

Diffracted beam encoder

In an optical type encoder for projecting a light beam onto an optical type scale having a diffraction grating formed thereon, forming an interferenced light by the use of a diffracted light from the scale, and photoelectrically converting the interferenced light to thereby measure the displacement of the scale, first and second light beams are caused to enter substantially the same position on the scale from different first and second directions, first and second diffracted light beams emerging from the scale by the first and second light beams being diffracted by the scale are directed to the aforementioned position by a reflecting device, the diffracted light beams emerging in the first and second directions by the first and second diffracted light beams being diffracted by the scale are superposed one upon the other to thereby form an interferenced light, and light components created by the first and second light beams being regularly reflected at the aforementioned position are not included in the interferenced light.

Optical type encoder

An encoder having a long length measuring stroke with a simple construction is provided. The encoder comprises a scale formed with a periodic lattice pattern, first and second reading heads arranged along a moving direction of the scale for reading the scale, and an adder for adding output signals from the first and second reading heads. The encoder further has adjusting mechanism for adjusting such that the phase difference between the output signals from the first and second reading head becomes zero. A continuous periodic signal can be always accurately obtained independently of the position of the scale.

Encoder having long length measuring stroke

A displacement measuring apparatus has an illuminating device for illuminating a diffraction grating with a radiation beam, an optical system for directing first and second diffracted beams created by the diffraction grating with to the diffraction grating, the optical system being provided so that the first and second diffracted beams have a common optical path and travel in opposite directions along the optical path. In addition, a device receives an interference beam formed by first and second re-diffracted beams created by the first and second diffracted beams being diffracted by the diffraction grating, and outputs a signal conforming to the displacement of the diffraction grating relative to the radiation beam.

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Tokyo, Japan

Masaaki Tsukiji