Mitsubishi Heavy Industries Limited

Mitsubishi Hitachi Power Systems, Ltd.

Masaaki Kurokawa

Kayoko Kawata

Takeo Kamimura

Kentaro Jinno

Satoshi Tsuzuki

Tadaaki Tanii

Yoshihiro Asada

Shiro Honnmura

Reizou Miyauchi

Takahiko Hirai

Masayoshi Higashi

Yuko Yamamoto

Jun Yasui

Naoto Kawase

Shigetoshi Shiotani

Seiichi Kawanami

Tomonori Shichida

Mitsuyoshi Matsumoto

Masaharu Michihashi

Yuji Kohashi

Hajime Kumatani

Masaya Takatsugu

Keiichi Kenmotsu

A measuring method of measuring a thickness of attachments attached to an outer peripheral surface of a heat transfer pipe by using an eddy-current probe, which is provided with an excitation coil and a pair of detection coils, the method including: obtaining a point in which the difference becomes zero is set as a reference point in a region to which the attachments is not attached by calculating a difference between the axial and circumferential components of the magnetic field detected by the pair of detection coils; moving the eddy-current probe inside the heat transfer pipe in the direction of the axis; calculating the difference between the axial and circumferential components of the magnetic field; obtaining a drift amount by comparing the difference with the reference point; and calculating the thickness of the attachments from a calibration curve obtained in advance on the basis of the drift amount.

Scale thickness measuring method

An eddy current flaw detection probe includes first coils, second coils, and a switching circuit configured to cause the first or the second coils in each unit U, the unit U being composed of adjacent four coils, to serve as excitation coils that generate eddy currents in an inspection target and cause the other coils in the unit U to serve as detection coils that detect a change in the eddy currents. The first coils each have one end thereof connected to a first common wiring, and the second coils each have one end thereof connected to a second common wiring. The switching circuit includes a first switching circuit connected to the other ends of the first coils and the second coils arranged in a first row, and a second switching circuit connected to the other ends of the first coils and the second coils arranged in a second row.

Eddy current flaw detection probe

An eddy current flaw detecting probe includes a plurality of excitation coils () which is configured to generate an eddy current in an inspection target and a plurality of detection coils () which are differentially connected to each other. The plurality of detection coils () includes a first detection coil () which is disposed on a second center line () intersecting a first center line () which connects a center of a first excitation coil () and a center of a second excitation coil () to each other and a second detection coil () which is disposed on a side opposite to the first detection coil () on the second center line (). The excitation coil () and the detection coil () are disposed to be inclined toward an inspection target surface as approaching each other.

Coil-type eddy current flaw detecting probe

An eddy current testing probe includes: exciter coilsincluding a first exciter coiland a second exciter coilidentical with each other and arranged in point symmetry, and each of which generates an alternating magnetic field to generate an eddy current in a test object; and detector coilsincluding a first detector coiland a second detector coilidentical with each other, arranged in point symmetry, arranged in phase, and differentially connected to each other. The exciter coilsand the detector coilsare arranged on a single plane. A center of symmetry O on a center line of symmetry CLof the coils, is identical with a center of symmetry O on a center line of symmetry CLof the coils, and the CLintersects with the CLat a right angle.

Eddy current testing probe and eddy current testing method

Noise included in detection signals is distinguished with a simple configuration. Provided is a flaw-detection apparatus () including a flaw-detection sensor group () in which two flaw-detection sensors (and) are arranged substantially in one row in a scanning direction with a distance therebetween and a processing device () that detects a defect in an inspection object on the basis of detection signals detected by the individual flaw-detection sensors (and), wherein, with regard to the detection signals detected by the flaw-detection sensors (and), when signal values detected at substantially a same positional coordinate in the scanning direction are not similar to each other, and, additionally, when signal values measured at a same time are similar to each other, the processing device () determines that the detection signals are not defect signals.

Flaw-detection apparatus and flaw-detection method

An object is to improve the precision of estimating a blockage ratio or a deposited-scale thickness. In a deposit measurement apparatus that estimates a blockage ratio of a gap between a wall surface of a through-hole and an outer surface of a heat-conducting pipe or the thickness of a deposit deposited at the gap, an eddy-current flaw detection probe () acquires an eddy-current flaw detection signal by scanning inside the heat-conducting pipe with a sensor; and a processing device () estimates the blockage ratio at the gap or the thickness of the deposit deposited at the gap by using the eddy-current flaw detection signal for the gap of the pipe-supporting-plate protrusion in the through-hole.

Deposit measurement apparatus, deposit measurement method, and computer-readable storage medium storing deposit measurement program

A film thickness measurement apparatus includes: an ECT sensor for measuring a film thickness of a thermal barrier coating formed on a turbine blade; a storage unit for storing a measurement point on the turbine blade which is a point where the film thickness of the thermal barrier coating is measured; a laser displacement meter for measuring a shape of the turbine blade; a measurement position calculation unit for calculating an actual measurement point suitable for actual film thickness measurement using the ECT sensor, based on the shape of the turbine blade measured by the laser displacement meter and the measurement point on the turbine blade stored in the storage unit; and an arm drive unit for driving the ECT sensor to adjust a measurement position of the ECT sensor based on the actual measurement point calculated by the measurement position calculation unit.

Film thickness measurement apparatus and film thickness measurement method

An eddy current probein accordance with the present invention has a structure in which a cross coilis placed in a predetermined direction relative to permanent magnetsandin the following manner. When the probeis erected, the coilis placed between the magnetsandso that a direction CD in which the opposing portion() of the first coilis extended intersects with a direction MD in which the magnetsandare extended. In the same manner, when the probeis erected, the coilis placed between the magnetsandso that a direction CD in which the opposing portion() of the second coilis extended intersects with the direction MD in which the magnetsandare extended.

Eddy current probe

An inspection device that is capable of inspecting all heat-transfer-tube sealing portions in a steam generator and that is also capable of analyzing a defect shape is provided. An inspection device that employs the eddy-current flaw detection method to inspect the presence/absence of a defect in a welded portion () between a tube () and a tube plate () is provided with a main unit () that has a circular-column portion (A), which is inserted into the tube (), and a flange portion (B), which is pressed against the tube plate (), and that is rotatable with respect to the welded portion (); a probe () that is disposed inside the main unit (), that can be moved close to and away from the welded portion (), and that detects a defect in the welded portion (); and a pressing portion () that presses the probe () toward the welded portion.

Inspection device

A method and an apparatus for classifying and recovering the main components of used batteries, particularly, a method and an apparatus by which the batteries are conveyed on a conveyor while an alternating magnetic field of a plurality of frequencies is applied to each and a detection means detects what sort of induced magnetic field has resulted from the eddy current induced in the battery. The orthogonal components in the change of the induced magnetic field are detected; the relationship between these orthogonal components and the frequencies are compared with the database of the same which is previously obtained, and the batteries are sorted according to their classification and size. This method can sort large amounts of used batteries continuously. In this invention, the battery will be drawn down into the detection region either magnetically or mechanically while the stable transport of the battery is achieved. The method and apparatus of the invention enable continuous bulk sorting of batteries, assure a smooth feed, and improve the accuracy with which the induced magnetic field generated in the battery is detected.

Method and apparatus for classifying and recovering the main components of used batteries

The present invention relates to an eddy current testing probe, which is suitable for used in a nondestructive test. The eddy current testing probe is provided with an excitation coil ( ) which generates an alternating magnetic field to generate an eddy current ( ) in a specimen ( ), and a pair of detection coils ( ) differentially connected and arranged in phase. A central portion (C ) of the pair of detection coils and a central portion (C ) of the excitation coil ( ) are arranged to be located at an identical or an almost identical position in a plan view taken in the direction toward the specimen ( ), and a flaw ( ) on the specimen ( ) is detected based on a difference between voltages generated in the pair of detection coils ( ) due to the eddy current ( ).

Eddy-current flaw detector probe

A method for evaluation of an eddy current testing signal is provided. The method includes the steps of generating a feature amount based on a sample eddy current testing signal obtained by measuring a standard specimen, the feature amount including a feature highly correlated to a secondary factor which is other than a depth of the flaw and which affects the waveform of the signal; generating an evaluation parameter by using the feature amount, the evaluation parameter being a parameter for outputting a value with a sufficiently small error relative to correct answer data on the sample eddy current testing signal; and estimating the depth of a flaw, expressed by an actual measurement eddy current testing signal, by use of the evaluation parameter.

Method and apparatus for evaluation of eddy current testing signal

This invention prevents the failure of detection for horizontal and oblique lift-offs in a probe for an eddy current flaw detection test. A plurality of probes are provided, and each probe includes four detection coils. Two adjacent eddy current flaw detecting probes commonly own (share) one of the four coils. The detection coils are connected to a bridge circuit for picking up a flaw signal. The detection coils are adjusted so that interlinkage magnetic fluxes generated inside the detection coils by the eddy current become equal. An excitation coil for inducing the eddy current in a test piece by AC driving can be disposed over the detection coils. The center of the excitation coil is positioned on the center axes of the detection coils. An oscillator for applying an AC current to this excitation coil is connected to the coil.

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Tokyo, Japan

Masaaki Kurokawa