International Business Machines Corporation

Cadence Design Systems, Inc.

Mary Prilotski Kusko

Steven Michael Douskey

Franco Motika

Cedric Lichtenau

William Vincent Huott

Raghu Gaurav GopalaKrishnaSetty

Phong T Tran

Gary William Maier

Satya R S Bhamidipati

Gerard M Salem

Eugene R Atwood

Michael F Fee

Timothy J Koprowski

Bryan J Robbins

Hari Krishnan Rajeev

Ronald J Frishmuth

Matthew B Schallhorn

Satya Rama S Bhamidipati

Frank Eliot Levine

Anna Wanda Topol

Michael John Hamilton

Amanda Renee Kaufer

Ryan Andrew Fitch

Stella Lee Taylor

Spencer K Millican

Srinivas V N Polisetty

Peilin Song

James Douglas Warnock

Haoxing Ren

Andrew A Turner

Sridhar H Rangarajan

Orazio Pasquale Forlenza

Richard Frank Rizzolo

Raghu G GopalaKrishnaSetty

Robert C Redburn

Gregory J Cook

Patrick James Meaney

Barry Watson Krumm

Brion L Keller

Leah M Pastel

Maroun Kassab

Cédric Lichtenau

Ronald Gene Walther

George Antony

Victor N Kravets

Rao H Desineni

Ulrich Baur

Lawrence Kenneth Lange

Timothy J Charest

Kevin William McCauley

Ankit N Kagliwal

Paul Jacob Logsdon

Rona Yaari

Timothy C Taylor

Sumit Panigrahi

Shrinivas Shenoy

Robert M Casatuta

Todd L Cohen

Raghu G Gaurav

Gregory O'Malley

Dustin Feller

A system comprises a plurality of regions, wherein ones of the plurality of regions are partitioned from others of the plurality of regions and at least one of the plurality of regions is a region under test. The system comprises at least one noise generator configured to generate noise in at least the region under test, and at least one noise monitor configured to monitor one or more effects of the noise generated in the region under test. The system comprises a test controller configured to: cause the at least one noise generator to generate the noise in at least the region under test; receive information from the at least one noise monitor indicative of the one or more effects of the noise generated in the region under test; and determine one or more conditions based on at least a portion of the received information.

System testing using partitioned and controlled noise

Data privacy for data associated with traveling in a vehicle that has access to passenger data, vehicle location data, vehicle navigation data, peripheral data; and/or itinerary data. Privacy is achieved by data classification and corresponding data security preferences and/or user selection including end of trip data disposition actions.

User privacy for autonomous vehicles

A method includes executing a test against a first structure and a second structure of a built-in self-test circuit. Each of the first and second structures include a plurality of latches arranged as a plurality of stump chains. The method also includes unloading a first result of the test from the plurality of stump chains of the first structure and a second result of the test from the plurality of stump chains of the second structure. The method further includes determining that the plurality of stump chains of the first structure includes a faulty latch based on the first result not matching the second result.

Diagnostic enhancement for multiple instances of identical structures

A series of pseudo-random test patterns provide inputs to a logic circuit for performing logic built-in self test (LBIST). A weight configuration module applies one or more weight sets to the pseudo-random test patterns, to generate a series of weighted pseudo-random test patterns. A logic analyzer determines a probability expression for each given net of the logic circuit, based on associated weight sets and a logic function performed by the net. A probability module computes an output probability for each net based on associated probability expressions and associated input probabilities. The weight configuration module optimizes the weight sets, based on the computed net probabilities, and further based on a target probability range bounded by lower and upper cutoff probabilities.

Dynamic weight selection process for logic built-in self test

Operating pulsed latches on a variable power supply including turning on a first power rail powering a first latch of an integrated circuit, wherein the first latch is a pulsed latch; turning on a second power rail powering a second latch of the integrated circuit, wherein the second latch is operatively coupled to the first latch; performing a scan operation using the first latch and the second latch; turning off the first power rail powering the first latch; and performing a functional operation using the second latch, wherein the first power rail powering the first latch is off during the functional operation.

Operating pulsed latches on a variable power supply

An approach for testing, including a self-test method, a semiconductor chip is disclosed. The approach generates test patterns, including weighted random test patterns, for testing random pattern resistant faults, and un-modeled faults directed at specific logic groups, where the dynamically generated test pattern weights are configured to optimize test coverage and test time. The dynamically generated test patterns are based on factors related to random pattern resistant logic structures interconnected via scan chains. More particularly, the dynamically generated test patterns are designed to enable fault detection within logic structures that are resistant to fault detection when tested with random patterns.

Logic built-in self test dynamic weight selection method

Methods, systems and computer program products for loading, storing and executing dynamically modifiable functional exercisers are provided. Aspects also include receiving a plurality of functional exercisers by a secondary reload memory disposed on a device-under-test. Aspects include loading at least a first functional exerciser from the secondary reload memory into a primary execution memory disposed on the device-under-test. Aspects include executing and modifying the first functional exerciser stored in the primary execution memory. Aspects further include, responsive to determining based on a test algorithm that one or more functional exercisers of the plurality have not been fully executed, loading a second functional exerciser from the secondary reload memory into the primary execution memory.

Iterative functional test exerciser reload and execution

Method and apparatus to test an integrated circuit includes retrieving power distribution data relating to an integrated circuit and designating a segment that includes at least one component of the integrated circuit. A switching limit associated with the segment may be set based on the power distribution data. Processes further generate a testing pattern that includes the determined switching limit associated with the segment.

Dynamically power noise adaptive automatic test pattern generation

Embodiments are directed to a computer implemented method and system for the testing, characterization and diagnostics of integrated circuits. A system might include a device under test, such as an integrated circuit, that includes an adaptive microcontroller. The method includes loading a testing program for execution by the adaptive microcontroller, causing the microcontroller to execute the testing program. Once results from the testing program are received, the testing program can be adaptively modified based on the results. The modified testing program can be run again. The testing program can modify parameters of the integrated circuit that are not externally accessible. Other embodiments are also disclosed.

Built-in device testing of integrated circuits

Aspects include a method for logic built-in self-testing (LBIST) for use in an integrated circuit with scan chains. The method includes programming a product control generator and a pattern generator with an LBIST pattern comprising at least a number of loops. The LBIST pattern is executed by generating scan-in test values for scan chains with the pattern generator and controlling at least one test parameter with the product control generator. Scan-out responses are collected from the scan chains in a signature register, and a start request is received from a chip tester. The LBIST is started in response to the start request. Test summary data is reported to the chip tester before the whole number of loops has been executed.

Logic built in self test circuitry for use in an integrated circuit with scan chains

Aspects include a system having logic built-in self-test (LBIST) circuitry for use in an integrated circuit with scan chains. The system includes a pattern generator configured for generating scan-in test values for said scan chains; a signature register configured for collecting scan-out responses from said scan chains after a clock sequence; an on-product control generator configured for controlling at least one test parameter; one or more microcode array or memory elements configured to receive inputs to initialize fields in the microcode array or memory elements; and a test controller. The test controller includes a reader component configured for reading test parameters from a field of the microcode array or the memory elements; and a programming component configured for configuring the on-product control generator and the pattern generator with a LBIST pattern according to the read test parameters.

Providing non-destructive recirculation test support in a device under test includes determining an initial latch allocation of a plurality of latches to form a plurality of self-test chains for the device under test. An optimized latch allocation to the self-test chains is determined based on a plurality of physical and logical grouping constraints. One or more of the latches are adjusted and reassigned between one or more of the self-test chains based on the optimized latch allocation. A recirculating feedback is coupled from an output of at least one of the self-test chains to a recirculation selector. A test input source is coupled to the recirculation selector, where the recirculation selector is operable to select between providing the test input source or the recirculating feedback to an input of the at least one of the self-test chains.

Non-destructive recirculation test support for integrated circuits

A tool for determining unknown sources in a circuit design for exclusion from logic built-in self test (LBIST) verification for the circuit. Responsive to initializing each of one or more latches in one or more test channels of the circuit design being tested, the tool determines whether a latch of the one or more latches is corrupted by an unknown source. The tool gathers each of the one or more latches determined to be an unknown source after a capture clock phase. The tool performs a backward traverse of logic circuitry feeding each of the one or more latches determined to be an unknown source. The tool verifies that a fence on one or more unknown source nets associated with each of the one or more latches blocked the unknown source from contributing to a test signature.

Identification of unknown sources for logic built-in self test in verification

An embodiment of the present invention provides a computer-implemented method for functional test and diagnostics of integrated circuits. The computer-implemented method includes executing one or more functional test exercisers in a functional execution sequence for a device under test up to one or more checkpoints, applying dynamic clock switching to a clock of the device under test to identify one or more likely causes of a failure identified at the one or more checkpoints, and includes iteratively invoking a portion of the functional execution sequence between a plurality of the checkpoints to progressively isolate the one or more likely causes of the failure as a most likely failure source based at least in part on the applied dynamic clock switching.

Functional diagnostics based on dynamic selection of alternate clocking

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Hopewell Junction, NY, United States of America

Mary Prilotski Kusko