Environmental Research Institute of Michigan

Marvin J Holter

David Michael Zuk

Vernon L Larrowe

Robert J Maxwell

A pattern recognition system for use with a two-dimensional image, each point associated with a height and with contributions from various wavelengths of light. The image to be analyzed is first sensed by a sensor and stored in a memory. Signals, read from the memory, are filtered and processed to produce signals measuring each of the wavelengths and measuring the height. The resulting distributions of data are first scanned for areas containing appropriate height measurements. Each pixel of these areas is classified according to predetermined classification definitions, further reducing the areas to be processed. These areas are subjected to spatial classification according to other classification definitions. The spatial classification may be accomplished by a neighborhood processor. The areas of the image are then identified with the features to be recognized.

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Ann Arbor, MI, United States of America

Marvin J Holter