Micro-epsilon Messtechnik Gmbh & Co. Kg

Siemens Aktiengesellschaft

Micro-epsilon Messtechnik Gmbh & Co.

Martin Sellen

Felix Mednikov

Karl Wisspeintner

Ulrich Kleine

Werner Grömmer

Falk Roewer

Klaus Salzwedel

Benno Weis

Robert Schmid

Axel Seikowsky

Eduard Huber

Mark Nechaewskij

Stanislav Medinkov

Mark Netchaewskij

Martin Dumberger

Ludwig Kirschenhofer

Eduard Sammereier

In one embodiment, a method for determining the distance of a conducting surface profiled in a direction of distance determination from a functional surface moving relative to the profiled surface is disclosed. The method includes connecting inputs of a sensor to an oscillator arrangement. The sensor includes a first and a second measuring coil. The method includes further connecting outputs of the sensor to an analog-to-digital converter via a demodulator unit to obtain first and second digital measured values. The first and second digital measured values correspond to the distance between the profiled surface and the first and second measuring coil of the sensor, respectively. The method further includes connecting an arithmetic unit to the analog converter unit. The second measurement coil is arranged at a known distance from the first measuring coil on the side of the first measuring coil that faces away from the profiled surface. The method finally includes calculating, using the first and second digital measured value and a reference digital value and the fixed distance, a distance measured value giving the distance of the functional surface from the profiled surface. The reference digital value corresponding to the measured value from a reference coil. The reference coil is assigned to the first and second measuring coils and the reference coil is located outside the range of influence of the profiled surface.

Method and system for determining the distance between a profiled surface and a functional surface moving in relation thereto by using measurement coils and a reference coil

A non-contacting position measuring system comprising a sensor that includes a measuring coil which can be energized with alternating current, where the measuring coil comprises at least two voltage taps, an electrically or magnetically conductive object to be measured which is assigned to the sensor, and an evaluation circuit, where the sensor and the object to be measured can be displaced relative to one another in a longitudinal direction of the measuring coil. The position-measuring system presented is formed in such a manner that the object to be measured comprises at least one marking affecting the impedance of the measuring coil between two voltage taps so that the evaluation circuit provides an output signal correlating with the position of the object to be measured in relation to the voltage taps.

Non-contacting position measuring system

A device and method for detecting the position and velocity of a test object relative to a sensor, the sensor and the test object being arranged such that they can be displaced relative to one another. In one embodiment, the sensor has a measuring coil with one or more voltage tap(s) and has a target that is placed on the test object while being electromagnetically coupled to the measuring coil. An electronic component for adding the voltages tapped on the sensor is assigned to the sensor. The invention is, with regard to a simplest possible design of the sensor, characterized in that for simultaneously measuring position and velocity, the target comprises two parts, one part being made of an electrically conductive material and the other part being provided in the form of a magnet, and in that an evaluation circuit determines, based on the output signal of the electronic component for adding the tapped voltages, a voltage component Uthat is proportional to the position of the target, and a voltage component Uthat is proportional to the velocity of the target.

Device and method for detecting the position and the velocity of a test object

A method and a device for determining motion parameters of a conductive, profiled surface () relative to a sensor (), with the sensor () comprising at least one coil for generating an electromagnetic alternating field, which is subjected, because of the feedback resulting from position changes between the surface () and the sensor (), to a variation, which is determined by means of the coil (). The position change is derived from the coupling impedance (Z) of the coil (), and the real component (R) and the imaginary component (X) of the complex coupling impedance (Z) of the coil () are determined, with a distance d between the sensor () and the surface () being computed based on the determined values while using an algorithm as a basis.

Method and device for determining motion parameters of a conductive, profiled surface

A circuit for measuring distances and which has at least two inputs (), at least one measuring coil (), and at least one signal source, wherein at least two input signals (e, e) are generated by means of the signal source, and the inputs () are activatable by means of the input signals (e, e). The input signals (e, e) are applied, preferably preprocessed, to the inputs of the measuring coil (). The circuit is designed for use where little space is available for the circuit, with the input signals (e, e) being applied to a preferably timed SC network, which generates a measuring output signal that is dependent on temperature. A corresponding method is also described.

Circuit and method for measuring distances

A circuit and method for demodulating at least one modulated signal (e), such as a measuring signal of a sensor. The circuit comprises at least one input (), with the signal (e) being applied to the input (), and the input is connected to at least one switched-capacitor network which is configured to demodulate the signal. The circuit permits use even in a small available space.

Demodulation circuit

A circuit arrangement () for activating a sensor and evaluating its signals, in particular for parametric sensors with complex impedances. The circuit arrangement comprises at least one sensor () for acquiring mechanical data. In order to minimize or largely prevent temperature caused disturbances in a constructionally simple layout, the measuring signal, the absolute temperature, and the gradient temperature of the sensor () are acquired simultaneously, preferably by means of a microprocessor or microcomputer (). A corresponding method for activating sensors and evaluating their signals is also described.

Circuit arrangement and method for controlling and evaluating signal detectors

A sensor (,) is proposed for noncontacting thickness gauging on films (,), in particular blown films, with a sensor head (,) and a mount (,) for the sensor head (,), which provides reliable measuring results despite transportation-caused movements of the film (,), and which is particularly suitable for a continuous quality control during the production process. In accordance with the invention, the sensor head (,) comprises at least one noncontacting sensor element for gauging the thickness in accordance with the physical properties of the film (,). Furthermore, the position of the sensor head (,) is adjustable such that the sensor head (,) is held during the entire measuring process at a predeterminable, at least largely constant distance from the film (,).

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Ortenburg, Germany

Martin Sellen