International Business Machines Corporation

Hitachi Global Storage Technologies Netherlands B.v.

Martin Patrick O'Boyle

Hemantha Kumar Wickramasinghe

Hendrik F Hamann

James Andrew Lacey

Madhusudan K Iyengar

Roger R Schmidt

Theodore Gerard Van Kessel

Frederic Zenhausern

Yves Corfield Martin

Yurii A Vlasov

Richard John Lebel

Sharee Jane McNab

Vijay Narayanan

Michael Patrick Chudzik

Supratik Guha

David William Abraham

Robert J Von Gutfeld

Vamsi Krishna Paruchuri

Richard Alan Haight

Matthew Warren Copel

S Jay Chey

Alan Weger

Philip C Hobbs

Nestor Alexander Bojarczuk, Jr

Joachim Gerhard Clabes

Paul H Smith, Jr

Jamil A Wakil

Rock Nadeau

Philip Charles Danby Hobbs

Henri A Khoury

Thomas Edwin Sandwick

Laszlo Landstein

John Charles Panner

Calvin K Chi

Sandra K Wolterman

The present invention is a method and an apparatus for dynamic manipulation and dispersion in photonic crystal devices. In one embodiment, a photonic crystal structure comprises a substrate having a plurality of apertures formed therethrough, a waveguide formed by 'removing' a row of apertures, and a plurality of pairs of lateral electrical contacts, the lateral electrical contact pairs extending along the length of the waveguide in a spaced-apart manner. The lateral electrical contact pairs facilitate local manipulation of the photonic crystal structure's refractive index. Thus, optical signals of different wavelengths that propagate through the photonic crystal structure can be dynamically manipulated.

Method and apparatus for dynamic manipulation and dispersion in photonic crystal devices

A field effect transistor (FET) includes a body region and a source region disposed at least partially in the body region. The FET also includes a drain region disposed at least partially in the body region and a molybdenum oxynitride (MoNO) gate. The FET also includes a dielectric having a high dielectric constant (k) disposed between the body region and the MoNO gate.

Method of forming switching device having a molybdenum oxynitride metal gate

An apparatus and method for measuring the physical quantities of a data center during operation and method for servicing large-scale computing systems is disclosed. The apparatus includes a cart that supports a plurality of sensors. The cart is moveable within the data center. The sensors capture temperature or other physical parameters within the room. The sensor readings, along with position and orientation information pertaining to the cart are transmitted to a computer system where the data is analyzed to select the optimum temperature or other system environmental parameters for the data center.

Apparatus for three-dimensional measurements of physical characteristics within a data center

Method and apparatus for three-dimensional measurements of physical characteristics within a data center

Method and apparatus for three-dimensional measurements

A present invention provides real-time temperature and power mapping of fully operating electronic devices. The method utilizes infrared (IR) temperature imaging, while an IR-transparent coolant flows through a specially designed cell directly over the electronic device. In order to determine the chip power distributions the individual temperature fields for each heat source of a given power and size on the chip (as realized by a scanning focused laser beam) are measured under the same cooling conditions. Then the measured chip temperature distribution is represented as a superposition of the temperature fields of these individual heat sources and the corresponding power distribution is calculated with a set of linear equations.

Method and system for measuring temperature and power distribution of a device

An information processing assembly includes at least one heater suitable for information processing, and a controller for controlling the at least one heater by at least one of adjusting a power to the at least one heater to match a target power level, and changing a polarity of an electrical current supplied to the heater.

Assembly for thermal and/or thermally-assisted information processing

A memory cell includes a storage medium having a programmable thermal impedance, and a heater in thermal communication with the storage medium for programming the thermal impedance. In another aspect, a memory cell includes a storage medium having a programmable electrical impedance, and a heater in thermal communication with the storage medium for programming the electrical impedance. In a third aspect, a memory device includes a plurality of the memory cells in accordance with the first and/or second aspect of the present invention.

Thermal memory cell and memory device including the thermal memory cell

The present invention is a method and an apparatus for thermo-optic control of optical signals using photonic crystal structures. In one embodiment, a first portion of a split signal is modulated by propagating the signal through a photonic crystal waveguide in which two electrical contacts are laterally spaced from the waveguide region by a plurality of apertures formed through the photonic crystal substrate. A voltage applied across the electrical contacts causes resistive heating of the proximate photonic crystal waveguide through which the signal propagates, thereby modulating the temperature relative to an un-modulated second portion of the split signal that is used as a reference.

Method and apparatus for thermo-optic modulation of optical signals

An optical system includes a spectrometer and a multipass optical probe. The multipass optical probe includes a retroreflective element such that light propagating, in a first direction, from the probe to a sample under test and passing through or reflecting from the sample under test, is reflected back in a second direction opposite the first direction, so as to pass through the sample under test a total of at least two times.

System and multipass probe for optical interference measurements

A structure and method for polishing a device include oscillating a carrier over an abrasive surface (the carrier bringing a polished surface of the device into contact with the abrasive surface, the oscillating allowing a portion of the polished surface to periodically oscillate off the abrasive surface), optically determining a reflective measure of a plurality of locations of the polished surface as the portion of the device oscillates off the abrasive surface and calculating depths of the locations of the polished surface based of the reflective measure.

Chemical mechanical polishing in-situ end point system

A method for detecting and/or imaging a workpiece. In a detection aspect, the method comprises the steps of sampling an electromagnetic wave packet representative of workpiece properties and comprising encoded wave information derivable from a multi-pole interactive coupling between a probe tip and the workpiece; decoding said electromagnetic wave packet by interrogating at least one of its phase and amplitude information; and, using the decoding information as a means for detecting the presence of the workpiece. In an imaging aspect, the method includes incorporating the previous steps in a scanning operation for developing an image representative of the workpiece.

Interferometric detecting/imaging method based on multi-pole sensing

An assembly for making thickness measurements in a thin film structure. The assembly comprises a chemical-mechanical planarization (CMP) subassembly for effecting topographical changes in a thin film structure; and, a measuring subassembly for detecting the thickness of a thin film structure, the measuring subassembly interposed with the CMP subassembly so that a thickness measurement can be made during and independent of CMP process operations.

Assembly and method for making in process thin film thickness measurments

A method for deriving physical properties of a workpiece. The method comprises the steps of sampling an electromagnetic wave packet representative of workpiece properties and comprising encoded scattered wave information derivable from a multi-pole interactive coupling between a probe tip and the workpiece; decoding said electromagnetic wave packet by interrogating at least one of its phase and amplitude information; and, correlating this information to referent physical-chemical properties of the workpiece.

Interferometric measuring method based on multi-pole sensing

An apparatus suitable for providing near-field measurements of a workpiece. The apparatus comprises a source of electromagnetic radiation for generating an incident wave; means for directing at least a portion of the incident wave to the workpiece; a probe tip acting as an antenna and capable of re-radiating a signal wave, said signal wave developing as an interactive coupling between said workpiece and said probe tip; means for creating an interference signal based on the signal wave and a reference wave; and a detector for interrogating at least one of the phase and amplitude of the interference signal.

Interferometric near-field apparatus based on multi-pole sensing

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Cortlandt Manor, NY, United States of America

Martin Patrick O'Boyle