Anton Paar Gmbh

Anton Paar Optotec Gmbh

Martin Ostermeyer

Gerhard Pfeifer

Thomas Brandl

Optical measuring system for determining polarization-optical properties of a sample, which comprises a polarization state generator (PSG) which is configured for preparing a measuring light which is propagating along an analysis beam path with a defined polarization state; a sample receptacle which is arranged downstream of the PSG in the analysis beam path and which is adapted for receiving the sample; a polarization state analyzer (PSA) which is arranged downstream of the sample receptacle in the analysis beam path; a detector which is arranged downstream of the PSA in the analysis beam path for detecting the measuring light, wherein the PSA and the detector are configured for capturing a polarization rotation &#x3b1;(&#x3bb;) of the measuring light which is caused by the sample; and an evaluation and control unit for evaluating measuring signals from the detector and/or PSA and/or PSG, wherein a wavelength-spectrum of the measuring light contains at least a first wavelength &#x3bb;and a second wavelength &#x3bb;, wherein the detector is configured for detecting measuring light with the first wavelength separated from measuring light with the second wavelength, and wherein the evaluation and control unit is configured for calculating a polarization rotation &#x3b1;(&#x3bb;) of the measuring light which is caused by the sample at a standardized wavelength &#x3bb;in dependency from (a) a first polarization rotation &#x3b1;(&#x3bb;) at the first wavelength &#x3bb;, (b) a second polarization rotation &#x3b1;(&#x3bb;) at the second wavelength &#x3bb;, (c) a first transmission T(&#x3bb;) at the first wavelength &#x3bb;, and (d) a second transmission T(&#x3bb;) at the second wavelength &#x3bb;.

Determining polarization rotation characteristics of a sample taking into consideration a transmission dispersion

Measuring apparatus-calibration device for calibrating a measuring apparatus-temperature sensor of a, in particular optical, measuring apparatus, wherein the measuring apparatus-calibration device comprises a, preferably measuring apparatus-external, calibration-temperature sensor, which is traceably calibratable itself, for determining a calibration temperature in the region of a measuring surface of the measuring apparatus and a determination unit which is adapted for determining an information which is indicative for a discrepancy between a measuring apparatus-temperature which is captured by the measuring apparatus-temperature sensor in the region of the measuring surface and the calibration temperature, on whose basis the measuring apparatus-temperature sensor is calibratable.

Temperature calibration for a measuring apparatus

Calibration device for calibrating an operation wavelength characteristic of a refractometer for determining an information which is indicative for a refractive index of the sample, wherein the calibration device comprises an itself traceably calibratable determination unit, which is preferably at least partially external of the refractometer, which is adapted for determining an information which is indicative for a discrepancy between a pre-givable set-point-operation wavelength characteristic and an actual-operation wavelength characteristic of the refractometer, on whose basis the refractometer is calibratable.

Wavelength calibration for refractometers

An optical measuring system measures polarization optical properties of a sample. The system includes (a) a light source that emits measuring light along an optical axis of an analysis beam path, (b) a polarization state generator, arranged downstream with respect to the light source in the analysis beam path which provides light with a defined polarization state, (c) a sample holder, arranged downstream with respect to the polarization state generator in the analysis beam path which accommodates the sample, (d) a polarization state analyzer, arranged downstream with respect to the sample holder in the analysis beam path which measures the polarization state of the measuring light after passing through the sample, and (e) a mechanical support structure, at which at least the polarization state generator, the sample holder and the polarization state analyzer are directly attached. Also described is a method for producing such an optical measuring system.

Optical measuring system for measuring optical polarization properties of a sample

An optical device, particularly a polarimeter, is provided for analyzing a liquid sample, having: a light-generating system for generating light for the surface irradiation of the sample; a detection system which is set up for the spatially resolved detection of light which originates from the transmission of the light provided for the surface irradiation through the sample; a telecentric optical system with a lens between the sample and the detection system and with an aperture diaphragm in the focal plane of the lens between the lens and the detection system.

Optical device, particularly a polarimeter, for detecting inhomogeneities in a sample

A cuvette comprising a cuvette wall for limiting a sample reception space for receiving a fluid sample is disclosed. The cuvette wall is adapted to allow a traversal of measurement radiation through the fluid sample situated within the sample reception space. An information presenter is fixed at the cuvette wall. The information presenter wirelessly provides data to be transferred to an external data reception module. The data to be transferred relates to the cuvette. Further, an optical measurement apparatus is described.

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Gehrden, Germany

Martin Ostermeyer