Ams Ag

Martin Münzer

Peter Trattler

An emitter of electromagnetic radiation is configured for modes of operation providing fields of illumination of different widths, and a photodetector is configured for time-of-flight and proximity measurements by detecting electromagnetic radiation that is emitted by the emitter and reflected to the photodetector. The emitter is operated by a driver, which is configured for an alternation between the modes of operation. A time-of-flight measurement is performed when the field of illumination is narrow, and a proximity or ambient light measurement is performed when the field of illumination is wide.

Semiconductor devices and methods for time-of-flight and proximity measurements

The semiconductor device comprises an emitter of electromagnetic radiation, a photodetector enabling a detection of electromagnetic radiation of a specific wavelength, a filter having a passband including the specific wavelength, the filter being arranged on the photodetector, the emitter and/or the filter being electrically tunable to the specific wavelength, and a circuit configured to determine a time elapsed between emission and reception of a signal that is emitted by the emitter and then received by the photodetector.

Semiconductor devices with an electrically tunable emitter and methods for time-of-flight measurements using an electrically tunable emitter

A fluorescence lifetime sensor module comprises an opaque housing having a first chamber and a second chamber which are separated by a light barrier. An optical emitter is arranged in the first chamber and configured to emit through a first aperture. Emission of pulses of light of a specified wavelength is arranged to optically excite a fluorescent probe to be positioned in front of the sensor module. A detector is arranged in the second chamber and configured to detect through a second aperture received photons from the fluorescent probe. A measurement block is configured to determine respective difference values representative of an arrival time of one of the received photons with respect to the emission pulses. A histogram block is configured to accumulate the difference values in a histogram. A processing circuit is configured to compute time-of-flight values based on an evaluation of the histogram, compute a fluorescence lifetime from the time-of-flight values and generate an output signal being indicative of the fluorescence lifetime of the fluorescent probe. A control unit is configured to initiate pulsed emission of the optical emitter.

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St. Katharein, Austria

Martin Münzer