Merck Sharp + Dohme Corp.

Infineon Technologies Ag

Martin Meier

Peter A Basile

Sharad Gupta

Ari Tao Adler

Christin L O'Neill

Philip G Green

Robert Stianchi

Angela M Amend Kwasnik

Steven Carl Persak

Scott R Mackie

Jeffrey C Givand

Florian Kössler

Pernilla Danielsson

Florian Altmann

Thomas Junk

Benjamin R Bartfeld

Thorsten Bucksch

Benjamin R Bartfield

Martin Perner

Volker Kilian

Medical injector pen

The invention relates to a semi-conductor component test procedure, and a semiconductor component test device (), which comprise:

Semi-conductor component test device, in particular data buffer component with semi-conductor component test device, as well as semi-conductor component test procedure

The invention relates to a semi-conductor component, and a process for the in- and/or output of test data and/or semi-conductor component operating control data into or from a semi-conductor component, whereby the semi-conductor component comprises one or more useful data memory cells, and/or one or more test data and/or semi-conductor component operating control data registers for storing test data and/or semi-conductor component operating control data, and whereby the process comprises the steps of applying a control signal to the semi-conductor component, whereby the semi-conductor component is switched from a first to a second operating mode; and applying an address signal to the semi-conductor component, whereby one or more of the test data and/or semi-conductor component operating control data registers of the semi-conductor component is addressed by the address signal in the second operating mode, and one or more of the useful data memory cells in the first operating mode.

Semi-conductor component, as well as a process for the in-or output of test data

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Munich, Germany

Martin Meier