Average Co-Inventor Count = 2.80
ph-index = 12
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. J.a. Woollam Co. (113 from 209 patents)
2. University of Nebraska (5 from 707 patents)
3. Other (2 from 831,952 patents)
4. J.a. Woollan Co., Inc. (2 from 2 patents)
5. J.a. Wooliam Co., Inc. (2 from 2 patents)
6. J.a. Woqllam Co., Inc. (1 from 1 patent)
7. James D. Welch (1 from 1 patent)
121 patents:
1. 12405210 - System for, and calibration and testing of directed beam ellipsometer systems
2. 12332163 - System for, and calibration and testing of directed beam ellipsometer systems
3. 11885738 - Reflectometer, spectrophotometer, ellipsometer or polarimeter system including sample imaging system that simultaneously meet the scheimpflug condition and overcomes keystone error
4. 11821833 - Fast and accurate Mueller matrix infrared ellipsometer
5. 11740176 - Fast and accurate mueller matrix infrared spectroscopic ellipsometer
6. 11675208 - Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system
7. 11391666 - Snapshot ellipsometer
8. 11035729 - Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system
9. 10989601 - Beam focusing and reflective optics
10. 10627288 - Systems and methods for producing a more uniform intensity wavelength dispersed beam of electromagnetic radiation entering a multielement detector, while maintaining information content therein
11. 10612976 - Systems and methods for producing a more uniform intensity wavelength dispersed beam of electromagnetic radiation entering a multi-element detector, while maintaining information content therein
12. 10444140 - Theta-theta sample positioning stage with application to sample mapping using reflectometer, spectrophotometer or ellipsometer system
13. 10422739 - Reflectometer, spectrophotometer, ellipsometer and polarimeter systems with a super continuum laser source of a beam of electromagnetism, and improved detector system
14. 10338362 - Beam focusing and reflecting optics with enhanced detector system
15. 10247611 - Enhanced detector operation made possible by application of a functional plurality of gratings and combination dichroic beam splitter-prisms