National Instruments Corporation

Technische Universitát Dresden

Technische Universitat Dortmund

Altavo Gmbh

Martin Laabs

Dirk Plettemeier

Marc Vanden Bossche

Thomas Deckert

Johannes Dietmar Herbert Lange

Vincent Kotzsch

Martin Obermaier

Niels Neumann

A system and method for testing devices such as integrated circuits (IC) with integrated antenna arrays configured for wireless signal reception. The method performs a calibration operation on a reference device under test (DUT). During the calibration operation, the DUT receives a series of first signals from a first far-field (FF) location and a series of array transmissions from a second near-field (NF) location using different beamforming settings, and determines therefrom a set of calibration parameters. The calibration parameters may be used by a probe antenna system (PAS) to transmit an array transmission to the DUT from the second NF location to emulate a single probe or multi-probe transmission from the first FF location.

Over-the-air testing of millimeter wave antenna receiver arrays

A radar assembly and a method for operating the radar assembly is disclosed, where a first frequency comb generator is arranged in the transmitting unit between the first oscillator and the transmitting antenna and a second frequency comb generator is arranged in the receiving unit between the second oscillator and the first mixer. On the transmitter side a first frequency comb generator is controlled with the first oscillator frequency in order to generate a primary signal containing a plurality of frequency components, on the receiver side a second frequency comb generator is controlled with a second oscillator frequency in order to generate an output signal containing a plurality of frequency components, the output signal generated in such a way is mixed with a third oscillator frequency, and the intermediate frequency is generated by mixing the received reflected signal with the mixed signal.

Radar assembly and method for operating a radar assembly

A system and method for testing (e.g., rapidly and inexpensively) devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave transmission and/or reception. The method may first perform a calibration operation on a reference device under test (DUT). The calibration operation may determine a set of reference DUT FF base functions and may also generate a set of calibration coefficients. After the calibration step using the reference DUT, the resulting reference DUT FF base functions and the calibration coefficients (or reconstruction matrix) may be used in determining far-field patterns of DUTs based on other field measurements, e.g., measurements taken in the near field of the DUT.

Over-the-air testing of millimeter wave antenna arrays

Growing community of inventors

Dresden, Germany

Martin Laabs