Cirrus Logic Inc.

Silicon Laboratories Inc.

Martin Joseph Gabriel, Iii

Justin Dougherty

Jason Hwang

David H Griffin

Vu N Do

Systems and methods for multi-site placement of singulated semiconductor devices are presented. The systems and methods for multi-site placement may facilitate multi-site testing of the singulated semiconductor devices. A method may include determining a quantity of singulated semiconductor devices to be arranged in a test configuration. The method may also include determining, using a data processing device, a test configuration in response to the quantity. In further embodiments, the method may include placing the singulated semiconductor devices in a test frame according to the test configuration.

Systems and methods for placement of singulated semiconductor devices for multi-site testing

A test socket () includes first () and second () test leads and a first electrically conductive member (). The first test lead is adapted to contact a first external inductor terminal of an integrated circuit (). The second test lead () is adapted to contact a second external inductor terminal of the integrated circuit (). The first electrically conductive member () extends between the first test lead () and the second test lead (), thereby forming an inductance loop between the first external inductor terminal and the second external inductor terminal.

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Austin, TX, United States of America

Martin Joseph Gabriel, Iii