Atmel Germany Gmbh

Atmel Corporation

Atmel Automotive Gmbh

Advantest Test Solutions, Inc.

Adv Antest Corporation

Advantest (singapore) Pte Ltd

Martin Fischer

Ulrich Friedrich

Dirk Ziebertz

Michael Pangels

Jens Masuch

Samer Kabbani

Karthik Ranganathan

Gregory Cruzan

Paul Ferrari

Udo Karthaus

Werner Blatz

Daniel Moser

Thomas Janz

Michael Camp

Michael Sagebiel

Jan Knopf

Domenico Chindamo

Franz Rottner

Rudi Bauer

Kim Kueter

Volkhard Flassnoecker

Jurgen Serrer

Alois Thalmaier

Placing a first side of an active thermal interposer device of a thermal management head against a device under test (DUT). Disposing a cold plate against a second side of the active thermal interposer. The DUT includes a die and the active thermal interposer device includes a plurality of zones, each zone of the plurality of zones corresponding to a respective module of the plurality of modules and operable to be selectively heated. Receiving a respective set of inputs corresponding to each zone of the plurality of zones. Performing thermal management of the plurality of modules of the DUT by separately controlling temperature of each zone of the plurality of zones by controlling a supply of coolant to the cold plate, and individually controlling heating of each zone of the plurality of zones.

Multi-input multi-zone thermal control for device testing

Placing a first side of an active thermal interposer device of a thermal management head against a device under test (DUT). Disposing a cold plate against a second side of the active thermal interposer. The DUT includes a plurality of modules and the active thermal interposer device includes a plurality of zones, each zone of the plurality of zones corresponding to a respective module of the plurality of modules and operable to be selectively heated. Receiving a respective set of inputs corresponding to each zone of the plurality of zones. Performing thermal management of the plurality of modules of the DUT by separately controlling temperature of each zone of the plurality of zones by controlling a supply of coolant to the cold plate, and individually controlling heating of each zone of the plurality of zones.

Disposing a DUT between a cold plate and an active thermal interposer device of the thermal management head. The DUT includes a plurality of modules and the active thermal interposer device includes a plurality of zones, each zone of the plurality of zones corresponding to a respective module of the plurality of modules and operable to be selectively heated. Receiving a respective set of inputs corresponding to each zone of the plurality of zones. Performing thermal management of the plurality of modules of the DUT by separately controlling temperature of each zone of the plurality zones by controlling a supply of coolant to a cold plate, and individually controlling heating of each zone of the plurality zones.

A power supply is configured to perform an at least partial compensation of a voltage variation caused by a load change using a voltage variation compensation mechanism which is triggered in response to an expected load change. An Automated test equipment for testing a device under test comprises a power supply, which is configured to supply the device under test. The automated test equipment comprises a pattern generator configured to provide one or more stimulus signals for the device under test. The power supply is configured to perform an at least partial compensation of a voltage variation caused by a load change using a voltage variation compensation mechanism which is activated in synchronism with one or more of the stimulus signals and/or in response to one or more response data signals from the device under test. Corresponding methods and a computer program are also described.

Power supply, automated test equipment, method for operating a power supply, method for operating an automated test equipment and computer program using a voltage variation

In some implementations, an automatic gain control (AGC) circuit comprises: a pre-divider circuit operable to pre-divide an input signal according to a pre-divider circuit setting and output a pre-divided signal; a pre-amplifier operable to pre-amplify the pre-divided signal and output a pre-amplified signal; a post-divider circuit operable to post-divide the pre-amplified signal according to a post-divider circuit setting; an analog-to-digital converter (ADC) operable to generate a digital data stream from the post-divided signal; logic operable to sample the digital data stream; determine a pre-divider circuit setting and a post-divider circuit setting based on the sampled data stream; set the pre-divider circuit and the post-divider circuit based on the determined settings; and generate a received signal strength value based on the pre-divider circuit setting and the post-divider circuit setting.

Automatic gain control for received signal strength indication

Disclosed herein is a scan optimizer system and method designed to generate optimal ATE input/output timing with small margin but yielding stable results. Therefore the scan test time is greatly improved.

Scan speed optimization of input and output paths

A method and apparatus for locating a transponder is provided. A carrier signal is transmitted by a base station and a transponder transmits a locating signal that is generated through phase modulation and backscattering of the carrier signal sent by the base station when the transponder is within a transmission range of the base station, whereby the transponder is located on the basis of the locating signal.

Locating a backscatter-based transponder

A device under test&#x2014;DUT&#x2014;, comprising the steps of receiving a first data sequence from the DUT in response to a first stimulus signal, wherein the data of a plurality of internal data sequences of the DUT is compressed into the first data sequence, comparing the first data sequence with expected data and for detecting errors in the first data sequence, and providing a second stimulus signal to the DUT in order to instruct the DUT to generate a second data sequence that comprises uncompressed data of the plurality of the internal data sequences at the positions where the errors have been detected.

Error detection in compressed data

A method includes transmitting, from a base station, a first request and receiving, from a transponder, a first code transmitted responsive to the first request. The method includes transmitting, from the base station, first encoded transmission information comprising a base station code encoded using the first code and a first identification. The base station transmits a second request, and a second code, transmitted by the transponder responsive to receiving the second request and encoded using a base station code extracted from the first encoded transmission information using the first code and the first identification, is received. Second encoded transmission information, including a second identification encoded using the second code, is transmitted from the base station. The second identification information may be extracted using the second code, access to a transponder memory region provided based on comparing the extracted second identification information to a stored version of the second identification.

Secure data exchange with a transponder

An antenna for a backscatter-based RFID transponder is provided that has an integrated receive circuit having a capacitive input impedance for receiving a radio signal spectrally located in an operating frequency range. The antenna includes two antenna branches that extend outward from a connecting region in which the antenna branches can be connected to the integrated receive circuit, and a yoke-shaped first trace segment that is designed to connect the two antenna branches together. Each antenna branch can have a U-shaped second trace segment connected to the connecting region, and a U-shaped third trace segment connected to the second trace segment and extending parallel to the second trace segment. The invention further relates to a backscatter-based RFID transponder with such an antenna.

Antenna for a backscatter-based RFID transponder

In certain embodiments, an apparatus includes a rectifier and a switch. The rectifier is configured to modulate a received carrier signal. The switch is coupled to at least one node of the rectifier. The switch is configured to modify an impedance of the rectifier to modulate the received carrier signal by providing a potential to the at least one node of the rectifier based on a field strength of the received carrier signal and a modulation-control signal.

Modulator and modulation method for a wireless data transmission device

A method and a device are provided, in particular a transponder, for generating a random number by a linear feedback shift register, wherein a first seed is generated by means of a first automaton, a second seed is generated by means of a second automaton, the first and second automata operate using different functional principles, so that the first and second seeds have different properties, and the shift register is reloaded with the first and/or second seed.

Device and method for generating a random number

A method for wireless data transmission between a base station and a transponder is provided, whereby a message, comprising at least one command and one data sequence, is transmitted by the base station, the message is received and evaluated by the transponder, at least one key is provided in the transponder after receipt of the command and before complete receipt of the message and the key is transmitted to the base station, the key is detected by the base station, and parts of the message, still to be transmitted, and/or subsequent messages are encoded by the base station with the key.

Growing community of inventors

Pfedelbach, Germany

Martin Fischer