Carl Zeiss Microscopy Gmbh

Carl Zeiss Ag

Carl Zeiss Nts Gmbh

Carl-zeiss-stiftung

Carl Zeiss Microimaging Gmbh

Ruprecht-karls-universitaet Heidelberg

Ruprecht-karls-universitat Heidelberg

Martin Edelmann

Bernd Spruck

Christian Thomas

Luyang Han

Josef Biberger

Uwe Wolf

Andreas Schmaunz

Christian Wojek

Martin Kühner

Robert George Taylor

Andreas Nolte

Andreas Schertel

Heino Heise

Ulrich Kohlhaas

Birgit Rottenkolber

Rasmus Schröder

Rasmus Schroeder

Simon Brattke

Norbert Wurscher

John Craven

Thomas Albrecht

Alexandra F Elli

Dmitry Lysenkov

Ruediger Landsinger

Thomas Ehrig

Alexandra F Dr Elli

Rüdiger Landsinger

Robert Taylor

A method of operating a particle beam device for imaging, analyzing and/or processing an object may be carried out, for example, by a particle beam device. The method may include: identifying at least one region of interest on the object; defining: (i) an analyzing sequence for analyzing the object, (ii) a processing sequence for processing the object by deformation and (iii) an adapting sequence for adapting the at least one region of interest depending on the processing sequence and/or on the analyzing sequence; processing the object by deformation according to the processing sequence and/or analyzing the object according to the analyzing sequence; adapting the at least one region of interest according to the adapting sequence; and after or while adapting the at least one region of interest, imaging and/or analyzing the at least one region of interest using a primary particle beam being generated by a particle beam generator.

Operating a particle beam device

A method of recording an image using a particle microscope includes recording of plural images of an object. Each of the recorded images is associated with image data including intensity values associated with locations in a coordinate system of the recorded image. The method further includes: determining displacements between the coordinate systems of the image data of the recorded images; determining a bounding box of a resulting image based on the determined displacements; and calculating image data of the resulting image based on the intensity values of the image data of the recorded images associated with those locations which are located within the determined bounding box associated with the resulting image based on the determined displacements of the recorded images.

Method of recording an image using a particle microscope and particle microscope

Methods and devices for magnified imaging of three-dimensional samples are disclosed. The methods include imaging sample sections of a sample section series using a first particle-optical device. Coordinates of the imaged sample point are acquired and stored in such a way that the coordinates of the imaged sample point can be associated with the respective image of this sample point. The method also includes selecting a volume of interest (VOI), and transmitting the coordinates of the selected VOI to a second particle-optical device. In addition, the method includes imaging the selected VOI by means of the second particle-optical device. A plurality of planes of a sample section are imaged in order to obtain a 3D image of the selected VOI.

FIB-SEM array tomography

An observation and analysis unit that magnifies an image of a sample and further accomplishes the evaluation and analysis thereof. The observation and analysis unit includes a light-microscopic device designed for the magnified imaging and optical evaluation of the sample and a sample analyzer that analyzes selected regions of the sample. The sample analyzer includes an electron source from which an electron beam can be directed to a region of the sample selected by use of the light-microscopic device. The sample analyzer further includes an X-ray detector designed to detect X-ray radiation generated by the interaction of the electron beam with the sample material. The unit further includes an actuation and evaluation unit that generates control commands for the light-microscopic device and the electron source and spectrally analyzes the X-ray radiation.

Observation and analysis unit

The invention provides a method for the magnified depiction of samples, wherein at least two sections from a sample, which are present on at least one sample carrier, are depicted in magnified form using an apparatus for the magnified depiction of samples, wherein the sample carrier is connected to the apparatus via a sample carrier holder, wherein the position of the depicted sample carrier regions in relation to the apparatus and the magnification stage used are recorded, at least one selected feature contained in the image information from the sections depicted in magnified form, particularly at least one suitable contour and/or structure, is/are used to define local coordinate systems, which are specific to the respective section, for the at least two sections depicted in magnified form, at least one region within at least one of the sections depicted in magnified form is/are selected (selection region) and the relative position of this at least one selection region in relation to the local coordinate system defined for the respective section, and the position of said selection region in relation to the apparatus, are ascertained, the relative position of this at least one selection region is transmitted to the local coordinate system of the at least one further section depicted in magnified form in order to stipulate at least one corresponding adjacent region on this section, the position of the adjacent region in relation to the apparatus is ascertained, and the at least one previously stipulated selection region and/or the at least one corresponding adjacent region is/are approached by the apparatus and depicted in magnified form, preferably at high magnification. In addition, the invention provides an apparatus&#x2014;that is set up to carry out the method&#x2014;for the magnified depiction of samples and also a computer program product which prompts an apparatus for the magnified depiction of samples to carry out the method.

Automated imaging of predetermined regions in series of slices

A beam device, in particular a particle beam device, for analyzing an object is provided, as well as a system comprising a particle beam device and an optical microscope for optically analyzing an object. The beam device simplifies the exchange and reduces the time of the exchange of objects to be examined. The beam device includes at least one beam generator that generates a beam, at least one objective lens that focuses the beam on an object arranged in a holding element. The objective lens comprises at least one connecting element. The holding element may be connected to the connecting element so that the holding element is removable from the connecting element for modification of the object. Alternatively, the holding element may be mounted to a beam column.

Beam device system comprising a particle beam device and an optical microscope

For the microscopy of an object or a specimen with a combination of optical microscopy and particle beam microscopy, an electrically conducting specimen carrier () is used which is configured for use in a particle beam microscope as well as in an optical microscope and has at least one alignment mark (). The alignment mark is configured as a pass-through structure and is detectable from the top and from the bottom of the specimen carrier.

Specimen holder having alignment marks

A method for improving vision of a low-vision person and a viewing aid therefore are disclosed. An image is recorded by means of an image recording device, the image being intermediately stored within an image memory and modified and presented to the eyes of the person by means of an image display device being mounted on the head of the person. An image is recorded within a recording mode and the modified image is transferred to the image display device within a display mode. The display mode is initiated in an interval in time with regard to the image recording mode, the interval in time being manually adjustable.

Method for improving vision of a low-vision person and viewing aid

Electronic device for visual impaired people

What is provided is an observation system, comprising a modulator which comprises a two-dimensional modulator region formed by a plurality of pixels; a control unit, which is connected to the modulator and by means of which the pixels are each independently switchable into first and second conditions; intermediate imaging optics which project an object to be viewed onto the two-dimensional modulator region, wherein, of the radiation incident on the pixels due to the projection by means of the intermediate imaging optics, only that radiation which impinges on the pixels being in the first condition passes into an optical observation path.

Observation system and method

An HMD device including an image-generating unit for generating a polychromatic image and deflection optics having first and second partial optics. The deflection optics project the image such tat it is perceivable by a user wearing the HMD device. The two partial optics each contain a diffractive optical unit for beam deflection, which are designed such that their dispersion errors compensate each other.

Compensating head mounted display device

Growing community of inventors

Aalen, Germany

Martin Edelmann