Danmarks Tekniske Universitet

Martin Dufva

Anders Kristensen

Christoph Vannahme

A surface refractive index acquisition system for characterization of a sample is provided. The system comprises a grating device configured to receive the sample, and first and second grating regions. First and second grating periods are selected to provide optical resonances for light respectively in first and second wavelength bands. A light source is configured to illuminate part of the first and second grating regions simultaneously. An imaging system is configured to image light from the grating device and comprises an optical element focusing light in a transverse direction and being invariant in an orthogonal transverse direction, the optical element being oriented such that the longitudinal direction of the grating device is oriented to coincide with the invariant direction of the optical element, and an imaging spectrometer comprising an entrance slit having a longitudinal direction oriented to coincide with the invariant direction of the optical element.

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Hornbæk, Denmark

Martin Dufva