Louisiana State University and Agricultural & Mechanical College

At&t Bell Laboratories

Bell Telephone Laboratories

Other

American Telephone & Telegraph Co., At&t Bell Laboratories

Martin Barry Feldman

Donald L White

Dooyoung Hah

Alan D White

Ahmed A El-Amawy

Ramachandran Vaidyanathan

Princess E Simpson

Henry Ignatius Smith

Michael Hong Lim

Martin P Lepselter

Joseph M Moran

Herbert A Waggener

Ken-Ichi Murooka

Peter A Heimann

David N Reece

John S Wagner

Li Jiang

Theodore F Retajczyk, Jr

William A Johnson

Chin-Chin Chen

Lynn O Wilson

Jacob Appelbaum

A contact-type endoscope surface enhanced Raman scattering (SERS) probe includes a gradient-index (GRIN) lens, a transparent substrate adhered to the GRIN lens, and a rough metallic layer adhered to an opposite side of the transparent substrate from the GRIN lens. The GRIN lens focuses light from a Raman spectrometer onto the rough metallic layer, and the rough metallic layer is positioned at the distal end of the contact-type endoscope SERS probe.

Contact-type endoscope SERS probe, and related methods

According to some embodiments of the present invention, a fine focus microscope includes an objective lens for collecting light from an object being imaged, and a tube lens for forming a first image from light received from the objective lens. The fine focus microscope further includes a fine focus lens for forming a second image from the first image, and an eyepiece for forming a third image from the second image, wherein the third image is viewable by a user. The fine focus microscope further includes a field lens for directing light from the second image to the eyepiece, and a positioning system mechanically coupled to the fine focus lens, the eyepiece, and the field lens. The positioning system changes a position of the fine focus lens, the eyepiece, and the field lens with respect to the objective lens to provide a change in focus of the object being imaged.

Fine focus microscope control

A forward-looking, optical coherence tomography, endoscopic probe is disclosed capable of high resolution with a small diameter. Light is focused and scanned during three passes through a lens. A light source supplies light to the proximal side of the lens. The light makes a first pass through the lens, and is reflected from a fixed mirror on the distal side. The reflected light makes a second pass from the distal side to the proximal side, and exits the lens at the proximal side, and is reflected by a scanning mirror. The light makes a third pass through the lens from the proximal side to the distal side to a sample to be imaged. The light is focused during each of the three passes through the lens. Light reflected from the sample passes back through and is focused by the same system.

Forward looking optical coherence tomography endoscope

An apparatus and method are disclosed for imaging a diffraction grating with a very high depth of focus, using a highly accurate code plate position measurement system. Positions may be measured to an accuracy of 1 nm or even smaller. The system may be used in fields such as manufacturing integrated circuits, and low- and very-low-frequency geophones, and other low- and very-low-frequency acoustic detectors.

High precision code plates and geophones

An optical system for the production of images, comprising an all optical system is disclosed. Said all optical system manipulates images directly by digital electronics without loss in the number of resolvable spots at higher magnifications.

Digital image pointing and digital zoom optical system

A head covering and insignia display assembly is structured in a sports helmet configuration and includes at least one insignia representative of a sports team. More in particular, the head covering assembly is constructed of a foldable material to facilitate transport and, additionally, the foldable material is structured to be weather resistant to at least partially protect the user from the elements, such as cold and/or precipitation. The head covering and insignia display assembly may include one or more auxiliary members such as, for example, a chin strap, a neckpiece, a face mask, and/or a visor. Further, an auxiliary accessory such as an audio or visual communication device and/or an illumination device may be incorporated in a cooperative and operational association with the head covering and insignia display assembly.

Head covering and insignia display assembly

A free space all-optical crossbar switches light from a plurality of sources onto a plurality of receivers, in any arbitrary permutation or combination (including one-to-one and many-to-one permutations). The sources and receivers may, for example, be single mode optical fibers. The polarization of the light from each source is controlled by a series of polarization control devices associated with the source so as to obtain desired angular deflections through a series of polarization-dependent angular deflectors in a first deflection unit. A lens may then direct the light from each source towards its desired receiver. An optional second deflection unit containing polarization control devices associated with individual receivers redirects the light so that it is incident normally on the receivers, an advantage if the receivers are single mode optical fibers. Alternative embodiments are described to reduce the number of optical components and to provide uninterrupted high speed data flow.

Optical crossbar switch

Techniques are disclosed to compensate for distortions in lithography by locally heating the membrane in a lithographic mask. The techniques may be used both to shrink and to expand areas of the mask locally, in order to adjust for varying magnitudes and signs of distortion. In one embodiment the correction method comprises two steps: (1) A send-ahead wafer is exposed and measured by conventional means to determine the overlay errors at several points throughout the field. (2) During exposure of subsequent wafers, calibrated beams of light are focused on the mask. The heating from the absorbed light produces displacements that compensate for the overlay errors measured with the send-ahead wafer. Any source of distortion may be corrected&mdash;for example, distortion appearing on the mask initially, distortion that only develops on the mask over time, or distortion on the wafer. In another embodiment, a reference pattern is formed on the membrane as a means of measuring mask distortion, and the heat input distribution needed to correct distortion is determined by subsequent measurements of the reference pattern. In this alternative embodiment, any source of distortion in the mask may be corrected.

Method of distortion compensation by irradiation of adaptive lithography membrane masks

Techniques are disclosed to compensate for distortions in lithography by locally heating the membrane in a lithographic mask. The techniques may be used both to shrink and to expand areas of the mask locally, in order to adjust for varying magnitudes and signs of distortion. In one embodiment the correction method comprises two steps: (1) A send-ahead wafer is exposed and measured by conventional means to determine the overlay errors at several points throughout the field. ( ) During exposure of subsequent wafers, calibrated beams of light are focused on the mask. The heating from the absorbed light produces displacements that compensate for the overlay errors measured with the send-ahead wafer. Any source of distortion may be corrected&mdash;for example, distortion appearing on the mask initially, distortion that only develops on the mask over time, or distortion on the wafer. In another embodiment, a reference pattern is formed on the membrane as a means of measuring mask distortion, and the heat input distribution needed to correct distortion is determined by subsequent measurements of the reference pattern. In this alternative embodiment, any source of distortion in the mask may be corrected.

Adaptive lithography membrane masks

Optical slab waveguides are used as high-speed, high-capacity interconnects for parallel or other devices. Optical slab interconnects can connect to many more elements than can conventional electrical or fiber optic buses. A multiplexing scheme called &ldquo;mode division multiplexing&rdquo; greatly increases the number of independent channels that a single slab can support. Optical slab waveguides have a potential capacity of over one million independent channels, each channel operating at 1 GHz in a single physical medium, with each channel capable of receiving input from over 1000 ports and sustaining a load of over 1000.

Optical slab waveguide for massive, high-speed interconnects

A scanning microscope is disclosed that uses an optical phase shift technique for high optical resolution, without reducing either the depth of focus or the working distance. The technique minimizes, for example, error in the location of edges of features on lithographic masks or wafers. The technique also permits the accurate determination of edges on features that would otherwise be too narrow to be measured. The microscope is useful in any field where optical microscopes are employed, including for example both semiconductor and biological applications. It is also useful in optical data storage applications. In addition, a small numerical aperture in the optical system allows a high depth of focus, while maintaining the resolution. The microscopes use standard components to produce high intensity images with large working distances and large depths of focus, without substantial mechanical complexity.

High resolution scanning microscope

Methods are disclosed for making microstructures. In one method, the resist layer is reversibly deformed during exposure. When the resist is flattened and developed after exposure, non-vertical features result that are not obtainable through other existing means. One application of this method is to make nested cones suitable for use as a highly efficient x-ray lens. In another disclosed method, &ldquo;halftone&rdquo; lithography is used to generate microstructures having features whose height may vary continuously. One application of this method is to make a novel telescope array, a thin film having telescopic magnification properties.

Three-dimensional microstructures, and methods for making three-dimensional microstructures

Methods are disclosed for making microstructures. In one method, the resist layer is reversibly deformed during exposure. When the resist is flattened and developed after exposure, non-vertical features result that are not obtainable through other existing means. One application of this method is to make nested cones suitable for use as a highly efficient x-ray lens. In another disclosed method, 'halftone' lithography is used to generate microstructures having features whose height may vary continuously. One application of this method is to make a novel telescope array, a thin film having telescopic magnification properties.

Growing community of inventors

Miami, FL, United States of America

Martin Barry Feldman