Infineon Technologies Ag

Infineon Technologies Richmond, LP

Markus Sickmoeller

Wolfgang Ruf

Reinhard Dueregger

Kapil Gupta

Joerg Schuntermann

Franz Brosi

Mareike Schlichting

A method for testing devices produced in front end lots involving loading a plurality of front end lots into a tester without requiring the tester to complete tests on a previous front end lot. A secondary lot of devices is unloaded from the tester, the secondary lot containing devices from a plurality of front end lots. The plurality of front-end lots may form a batch. In this case, a plurality of secondary lots unloaded from the tester could correspond to the front-end lots, and could be considered to be part of the same batch. All secondary lots of the batch, except for the last secondary lot of the batch, may contain only pass devices, such that all fail devices from the batch are unloaded and then tested together, in the last secondary lot. The loading of the front-end lots may be asynchronous with the unloading of the secondary lots.

Continuous test flow method and apparatus

A method for classifying semiconductor components by their performance characteristics includes reading an identifier associated with a component and storing, in conjunction with the identifier, first and second performances values for that component. These performance values represent the component's achieved operating speed at each of two different temperatures. The component is then allocated to a speed category on the basis of the first and second performance values.

Method for classifying components

Growing community of inventors

Dresden, Germany

Markus Sickmoeller