Nxp Usa, Inc.

Freescale Semiconductor,inc.

Nxp B.v.

Markus Regner

Stefan Doll

Heiko Ahrens

Vladimir Vorisek

Hubert Martin Bode

Michael Rohleder

Thomas Henry Luedeke

Sandeep Jain

Vladimir Litovtchenko

Harald Luepken

Florian Frank Ebert

Harald Michael Lüpken

Jürgen W Frank

Tobias Thiel

Peter Seibold

A System-on-Chip (SoC) includes first and second voltage supply pins configured to receive first and second supply voltages, respectively, a first supply path beginning at the first supply pin, and a supply proportion checker. The first supply path includes a first plurality of voltage supply nodes and a supply switch coupled between adjacent voltage supply nodes, wherein each node is configured to provide a corresponding internal voltage supply to a corresponding portion of the SoC. The supply proportion checker is coupled to receive the corresponding internal voltage supply from each voltage supply node, and configured to determine whether a first internal voltage supply supplied by a first supply node of the first plurality of nodes has a legitimate proportion to a second internal voltage supply supplied by a second supply node of the first plurality of nodes, wherein the legitimacy is checked using only resistors which do not require trimming.

Supply voltage proportionality monitoring in a system-on-chip (SOC)

A process identifier transition monitor captures and assesses activities associated with a microprocessor or a microcontroller. Monitoring and assessment is performed by detection of process identifier transitions, which may be driven by an occurrence of one or more activities, such as execution of application software, system hardware mechanisms, or processor-internal mechanisms. Process identifier transitions are assessed to determine whether such transitions were expected. If a detected process identifier transition was not expected, then a system alert may be transmitted or some other appropriate response taken within the system.

Process identifier transition monitoring and assessment

A method, system, and apparatus are provided for preventing glitch attacks by using a glitch processing hardware unit (1) to deactivate a glitch filter connected between the monitored line and a reset processing unit in response to detecting a voltage glitch on a monitored line during a specified security system sequence and (2) to automatically drive a requested reaction in response to the voltage glitch by driving one of a plurality of configurable reactions comprising a device reset reaction and a process restart request, thereby preventing the voltage glitch from maliciously influencing the specified security system sequence.

Automatic reset filter deactivation during critical security processes

Various embodiments relate to a circuit, including: a first secure circuit configured to receive an input and to produce a first output; a first delay circuit configured to receive the first output and to produce a first delayed output delayed by a time N; a second delay circuit configured to receive the input and to produce a delayed input delayed by a time N; a second secure circuit configured to receive the delayed input and to produce a second delayed output; and a comparator configured to compare the first delayed output to the second delayed output and to produce a result, wherein the result is one of the first delayed output or second delayed output when the first delayed output matches the second delayed output and the result is an error value when the first delayed output does not match the second delayed output.

Fault attack protection against synchronized fault injections

Transistor-based semiconductor devices, such as systems on chips, may be supplemented with a reset request mechanism to prevent a reset from causing the semiconductor device to enter into an uncertain, or fail, state. More particularly, a method or mechanism may modify a requested reset for a semiconductor device based on a state of the semiconductor device to prevent the semiconductor device from entering an uncertain, an undesired, or a failed state when the reset is effected with regard to the semiconductor device.

Method and device for reset modification based on system state

A processing apparatus, comprising at least a first processing unit and a second processing unit, is proposed. The first processing unit comprises a set of first stateful elements, the second processing unit comprises a set of second stateful elements. A set of synchronization data lines may connect the first stateful elements to the second stateful elements in a pairwise manner. A control unit may control the first processing unit, the second processing unit and the synchronization data lines so as to copy the states of the first stateful elements in parallel via the synchronization data lines to the second stateful elements in response to a synchronization request. A method of synchronizing the processing units is also proposed.

Processing apparatus and method of synchronizing a first processing unit and a second processing unit

IC device comprising a plurality of functional components arranged into self-test cells. The IC device is configurable into a first self-test configuration comprising a first set of self-test partitions. Each self-test partition within the first set comprising at least one self-test cell. Functional components of the self-test cell(s) of each self-test partition within the first set are arranged to be configured into at least one scan-chain for said self-test partition when the IC device is configured into the first self-test configuration. The IC device is configurable into a second self-test configuration comprising a second set of self-test partitions. Each self-test partition within the second set comprising at least one self-test cell. Functional components of the self-test cell(s) of each self-test partition within the second set are arranged to be configured into at least one scan-chain for said self-test partition when the IC device is configured into the second self-test configuration.

Integrated circuit device and method of performing self-testing within an integrated circuit device

The present application relates to a method and a processing system for automated managing of the usage of alternative code. Code sections including original code and alternative code are retrieved from a code basis and the retrieved code is analyzed to detect an alternative code section. A condition definition associated with the identified alternative code section is further retrieved and the condition of the retrieved condition definition is evaluated. The identified alternative code section is activated in accordance with the evaluation result.

Method for automated managing of the usage of alternative code and a processing system of operating thereof

An integrated circuit (IC) device, and method therefor, the IC device comprising a plurality of self-test components arranged to execute self-tests in parallel during a self-test execution phase of the IC device, and at least one clock control component arranged to provide at least one clock signal to the plurality of self-test components at least during the self-test execution phase of the IC device. The at least one clock control component is further arranged to receive at least one indication that self-testing has ceased within at least a first self-test component, and dynamically modulate the at least one clock signal provided to at least one further self-test component for which self-testing has not ceased to increase a clock rate of the at least one clock signal upon receipt of an indication that self-test execution has ceased within the at least first self-test component.

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Munich, Germany

Markus Regner