Altasens, Inc.

United States of America As Represented by the Administrator of Nasa

Rockwell Scientific Licensing LLC

Innovative Technology Licensing LLC

Markus Loose

Lester Joseph Kozlowski

Atul Joshi

Edward S Cheng

Greg T Alkire

Brian S Smith

Daniel P Kelly

A custom application-specific integrated circuit (ASIC) may provide strong signal integrity while reducing the load to a thermal system. Control and analog-to-digital conversion may be pushed into components close to the detector to maximize signal integrity. Processing functions may be performed at relatively high temperature, or the highest allowable temperatures, simplifying the system-level thermal design by not cooling components that do not require such cooling to function.

Detector control and data acquisition with custom application specific integrated circuit (ASIC)

Multiple scanning modes are provided for an array of electromagnetic radiation sensors. In the preferred implementation both selectable subarrays and the overall array can be read out and reset in any desired order, including interrupting a full array scan for a subarray scan and then resuming the full array scan.

Image sensor and method with multiple scanning modes

A column amplifier architecture having automatic gain selection for CMOS image sensors, which reduces the effect of analog noise, while maintaining a system's dynamic range. A comparator compares an amplified column buffer output signal to a reference voltage. The output of the comparator controls the gain of the amplifier based on the result of the comparison. Initially, a high column buffer gain is selected. For small signals, the output of the column buffer stays below the reference voltage and the output signal stays within the system's dynamic range. For larger signals, the column buffer output will exceed the reference voltage (and also the system's dynamic range) and therefore the comparator output switches states, which selects the low-gain setting. Multiple gain levels may be implemented, if desired.

Column amplifier with automatic gain selection for CMOS image sensors

An image sensing system includes an image sensor and a black clamping circuit which reside on the same substrate. Particular embodiments use common components for both imaging and black clamping, and digital control of an analog black clamp function.

On-chip black clamp system and method

A CMOS imager system including an active pixel sensor having an access supply which provides distributed feedback, a column buffer (having gain and FPN suppression), and an A/D converter co-located with the sensor such that the effective transmission path between the column buffer (or optional analog PGA) and the A/D converter acts as a resistor, rather than a reactance. The system may further include both an analog gain amplifier stage and a digital programmable amplifier stage.

CMOS imaging system with low fixed pattern noise

A photodetector array includes a plurality of photodetectors, preferably photodiodes, coupled to a respective plurality of addressable interface circuits. At each pixel, a switching circuit configures neighboring ones of the photodetectors into pixels by summing multiple photodetector signals into an aggregated pixel output signal. The switching circuit is electronically switchable to aggregate said photodetector signals according to at least two different selectable pixellization schemes with differing resolution.

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Thousand Oaks, CA, United States of America

Markus Loose