Dr. Johannes Heidenhain Gmbh

Other

Johannes Heidenhain Gmbh

Markus Kühler

Sebastian Tondorf

Wolfgang Holzapfel

Michael Hermann

Wolfgang Pucher

Giselher Schneider

Herbert Pronold

Alexander Gruber

A method for mounting a substrate of a measurement graduation and a scanning head of a position measuring system on a first machine part and a second machine part. The method including fastening a substrate of a measurement graduation and a scanning head on first and second portions, respectively, of a mounting aid. The method including adjusting a location of the first portion relative to the second portion in a first degree of freedom that differs from a measurement direction in which a relative position of the first machine part relative to the second machine part is to be measured. The method including fastening the substrate and the scanning head on the first and second machine parts, respectively, at the mounting position. The method further including removing the mounting aid.

Position measuring system and method for assembly

A scanning unit of a position measuring arrangement for scanning a measuring graduation of a scale. The scanning unit includes a base body including an interior space; wherein the base body can be installed, fixed in place, on an object to be measured, wherein the base body comes into contact with a first contact face at a first location of the object to be measured. The scanning unit includes a heat-generating electrical component in the interior and a contact element with a second contact face which, in the course of installing the base body, enters into contact at a second location of the object to be measured. The scanning unit further including a heat-conducting element, which is designed for transferring heat generated by an electrical component from the interior space to the contact element.

Scanning unit of a position measuring arrangement

A mounting aid for the alignment of a first graduation support in relation to a second graduation support of a position measuring system, the mounting aid including a spacer, which specifies a preset scanning distance between a first measuring graduation of the first graduation support and a second measuring graduation of the second graduation support. The mounting aid further including a connector having a structure to positively engage the first graduation support, wherein the connector is released from engagement with the first graduation support by displacing the connector with respect to the first graduation support and a protective cover that covers the measuring graduation.

Mounting aid for a position measuring system, as well as a scale and position measuring system with this mounting aid

A position measuring device having a scanning device and a scale, wherein the scanning device is movable in relation to the scale in a measuring direction. The scale including a measuring graduation, wherein periodic measuring signals are generated when the scanning device scans the measuring graduation and a reference marking, wherein a reference marking signal is generated when the scanning device scans the reference marking with a scanning beam bundle. The scale further includes a first optically scannable area marking next to the reference marking and a second optically scannable area marking next to the reference marking and which has a different optical deflection property than the first optically scannable area marking, wherein photoelectric scanning of the first and second optically scannable area markings with the scanning beam bundle from the scanning device generates an area signal that differentiates characteristics of the first and second optically scannable area markings. A first photo-receiver receives light from the first optically scannable area marking and a second photo-receiver receives light from the second optically scannable area marking.

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Nuβdorf/Sondermoning, Germany

Markus Kühler