Rohde and Schwarz Gmbh & Co. Kg

Markus Freidhof

Kurt Schmidt

Thomas Kuhwald

Johann Huber

Michael Reinhold

Wolfgang Herbordt

Nico Toender

Andrew Schaefer

Martin Peschke

Christian Evers

Johannes Steffens

Andreas Maier

Friedrich Reich

Georg Ortler

Hermann Boss

Felix Haberstroh

Ruben Villarino-Villa

Manfred Mueller

Markus Breunig

Rubén Villarino-Villa

Randy White

Stephan Neumann

Guido Schulze

Martina Wollinger

Nico Tönder

Johan Huber

Manfred MÜLLER

A FT circuit includes a distribution circuit, a number N of pipeline FT circuits, and a number M of parallel FT circuits, wherein N and M are integers greater than or equal to 2. The distribution circuit is configured to receive a plurality of samples, to divide the plurality of samples into N subsets of samples, and to forward each of the N subsets of samples to a dedicated one of the pipeline FT circuits. The pipeline FT circuits are arranged in parallel to each other and are configured to process M samples in parallel, thereby obtaining M intermediate samples per pipeline FT circuit. The pipeline FT circuits are configured to forward each of the M intermediate samples to a dedicated one of the M parallel FT circuits. Each parallel FT circuit is configured to process N intermediate samples in parallel, thereby obtaining N output samples per parallel FT circuit.

Fourier transform circuit, signal processing circuit, and signal processing method

A signal analyzer for analyzing an input signal comprises at least one input for receiving the input signal, at least one acquisition unit for acquiring data assigned to the input signal, an acquisition memory for storing the acquired data, the acquisition memory being adapted to store data in at least one ring buffer, and an acquisition memory controller to control at least one of writing the acquired data in the acquisition memory and reading the acquired data from the acquisition memory. The acquisition memory controller comprises a data read module for reading data of the at least one ring buffer. The acquisition memory controller comprises a copy write module which taps data read by the data read module. The acquisition memory comprises an additional memory section. The copy write module is configured to write the data tapped into the additional memory section. Further, a method of processing data from an input signal is described.

Signal analyzer and method of processing data from an input signal

The present invention provides to a processing of data samples by an arrangement comprising a signal processing chip for executing predetermined operations and a processor for executing any kind of software code. In particular, it is not only possible that the general purpose processor, which executes the software code can process results from the signal processing chip, but also the signal processing chip can receive the results of the general purpose processor for applying further operations. In this way, the flexibility and efficiency of the processing can be further improved.

Device and method for processing data samples

A measurement device is described that comprises a measurement unit configured to perform measurements on an electric signal of a device under test while applying at least one measurement parameter for performing the measurements. The measurement device has an integrated direct current source configured to power the device under test. The measurement device also comprises a monitoring unit configured to monitor at least one monitoring parameter of the direct current source. The measurement device has a control unit configured to control the measurement parameter. Further, a method for measuring a device under test is described.

Measurement device and method for measuring a device under test

A test and measurement device is described with at least one measurement channel, a measurement input, an analog to digital converter, and an acquisition unit. The test and measurement device has a trigger clock configured to generate repeated trigger clock timings, the trigger clock timings controlling the acquisition unit. In addition, a method for applying a trigger is described.

Test and measurement device as well as method for applying a trigger

Improved determination of a trigger time. For this purpose, an input signal is provided to multiple low pass filters having different bandwidths. A trigger event is detected in each of the low pass filtered signals and a corresponding trigger time is determined. The trigger time which is determined based on valid trigger detection and provided by the low pass filter with the highest bandwidth is used for further analysis.

Apparatus and method for determining a trigger time

A measurement device comprising a housing, a measurement channel, a trigger unit connected to the measurement channel, and an arbitrary waveform generator housed within the housing is disclosed. The measurement channel comprises an acquisition unit. The trigger unit is configured to detect a predetermined trigger event in a signal processed by the measurement channel. The trigger unit is configured to control the acquisition unit, and the trigger unit is configured to control the arbitrary waveform generator. Moreover, a measurement system and a method for operating a measurement device are disclosed.

Measurement device with arbitrary waveform generator and trigger unit

An electrical measurement device for measuring at least one electrical signal is described, the electrical measurement device comprising an electrical measurement unit for measuring the electrical signal and for deriving at least one measurement parameter from the measured electrical signal, an acoustic processing unit for processing a signal obtained from the electrical measurement unit, and a loudspeaker for outputting an acoustic signal representative of the signal obtained from the electrical measurement unit. The acoustic processing unit is configured to generate the acoustic signal to be outputted by the loudspeaker. The acoustic processing unit is further configured to modulate a predetermined acoustic signal by the at least one measurement parameter.

Electrical measurement device

A method for and apparatus processing a measurement signal of a dynamic physical quantity is provided which includes acquiring a measurement signal representing the dynamic physical quantity over time; comparing the acquired measurement signal with a predefined signal characteristic of the respective physical quantity or with a signal characteristic of another physical quantity being dependent from the respective physical quantity to provide a comparison result; and adjusting a waveform representing the acquired measurement signal based upon the comparison result. A digital oscilloscope is also provided.

Method and apparatus for processing a measurement signal

A digital sampling oscilloscope (DSO) includes a housing, an analog measurement input interface arranged in a housing wall of the housing and a measurement acquisition system having a digitizer and an acquisition memory coupled to the digitizer. The measurement acquisition system is integrated into the housing and coupled to the analog measurement input interface. The DSO further includes a signal generator integrated into the housing. An operation mode control signal output interface is arranged in a housing wall of the housing. The signal generator is coupled to the operation mode control signal output interface and is configured to output an operation mode control signal to a device under test (DUT) connected to both the operation mode control signal output interface and the analog measurement input interface for controlling a test operation mode of the DUT.

Oscilloscope and method for testing a device under test

A method for generating an output signal having predetermined jitter characteristics is disclosed. A first signal is generated via a first signal generator module. A second signal is generated via a second signal generator module. The first signal is pulse position modulated by the second signal, thereby generating a modulated signal having predetermined jitter characteristics. An output signal having predetermined jitter characteristics is generated based on the modulated signal. Moreover, a signal generator for generating an output signal having predetermined jitter characteristics is disclosed.

Method for generating an output signal having predetermined jitter characteristics

The present invention relates to a processing of digitally measured signals. When sampling a measurement signal with a predetermined sampling rate, aliasing effects may occur, if a Nyquist condition is violated. For this purpose, the present invention suggests to analyze a frequency spectrum of a signal and to compare the frequency components of the spectrum with the setting of a measurement apparatus, in particular a sampling rate of the measurement apparatus. If a measurement signal comprises frequency components which may violate the Nyquist condition, an alert may be generated to adapt the set of the measurement arrangement.

Measurement apparatus and measurement method

An oscilloscope comprises a number of analog signal inputs for receiving respective analog input signals, an analog-to-digital converter, ADC, for every analog signal input, each ADC comprising an analog input and a digital output, the analog inputs being coupled to the respective one of the analog signal inputs for receiving the respective analog input signal, and the digital outputs outputting respective digital signals, and a signal processor coupled to the digital outputs of the ADCs that performs predetermined signal processing functions based on at least one of the digital signals and outputs a number of respective digital output signals.

Oscilloscope and method

A measuring system has an analog-to-digital converter, an acquisition memory, a processing unit, and a display memory. The processing unit is adapted to decode a digital signal according to a protocol creating a decoded signal and to evaluate the decoded signal at a cursor position. The digital data generated by decoding the decoded signal at the cursor position is stored in the display memory. Further, a method for analyzing an analog signal according to a protocol is shown.

Measuring system as well as method for analyzing an analog signal

A measuring device comprises an interface, adapted to acquire a measuring signal, a triggering unit, adapted to determine at least one condition of the measuring signal based on an initial triggering condition, and a storage unit adapted to store data words, comprising changes of the at least one condition of the measuring signal and instances in time at which the changes of the at least one condition occur. Moreover, the measuring device comprises a parameter determination unit, adapted to determine at least one parameter from the data words and a parameter histogram unit, adapted to determine a parameter histogram of the at least one parameter.

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Kirchseeon, Germany

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