Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.v.

Friedrich-Alexander-Universitat Erlangen-Nürnberg

Technishe Universitaet Darmstadt

Markus Firsching

Daniel Niederlöhner

Gisela Anton

Thilo Michel

Jürgen Durst

Johannes Leisner

Michael Böhnel

Alexander Ennen

Alexander Korn

Wladislaw Benner

Malte Vogelgesang

Steffen Rüger

Christoph Speier

Matthias Habl

A processing device for obtaining gap-filler sinogram information is adapted to obtain first sinogram information associated with a first spectral parameter, and second sinogram information associated with a second spectral parameter, and is adapted to obtain the gap-filler sinogram information which is associated with the second spectral parameter and which fills the one gap in the second sinogram information, on the basis of the first sinogram information and the second sinogram information. A computer program, a method, and a computer implementation are also described.

Processing device for obtaining gap filler sinogram information, computer tomograph, method and computer program

Apparatus and method for assigning a material value score to a waste printed circuit board or a portion thereof and system for sorting waste printed circuit boards.

Apparatus and method for assigning a material value score to a waste printed circuit board or a portion thereof and system for sorting waste printed circuit boards

The present invention relates to a device and method for determining one or more characteristics of radiation using a sensor comprising one or more detector units capable of counting the number of photon or charged particle of said radiation impinging on said sensor in or above a determined energy range.

Method and apparatus for determining one or more characteristics of radiation

Growing community of inventors

Erlangen, Germany

Markus Firsching