Anton Paar Gmbh

Markus Brandner

Daniel Koller

Alberto Gomez-Casado

Martin Godec-Schönbacher

A scanning probe microscope analyses a sample by moving a probe and the sample relative to one another. The scanning probe microscope includes a detection unit for detecting an image of a gap between the sample and the probe in a substantially horizontal side view.

Imaging a gap between sample and probe of a scanning probe microscope in a substantially horizontal side view

A scanning probe microscope, in particular an atomic force microscope, for analyzing a sample by moving a probe and the sample relative to one another, wherein the scanning probe microscope includes a detection unit with a side view camera arranged and configured for detecting an image of the sample in a substantially horizontal side view, and a determining unit for determining information indicative of a profile of at least part of a surface of the sample based on the detected image.

Growing community of inventors

Raaba-Grambach, Austria

Markus Brandner