Universitat Basel

University of Basel

Marko Loparic

Marija Plodinec

Roderick Lim

Pascal Alexander Oehler

Ellen Obermann

Leon Camenzind

Roderick Y H Lim

Pascal Oehler

Roderick Yh Lim

Christian Raez

The invention relates to a sample holder () for holding a sample, particularly for use with an atomic force microscope. According to the invention, the sample holder () comprises: preferably a flexible support () having an upper side () and a lower side () facing away from said upper side (), a first and a second holding member (), wherein each holding member () comprises a first section () that is preferably connected to the upper side () of the flexible support (), as well as an opposing second section () forming a tip () of the respective holding member (), such that the holding members () are each movable from a first position, in which the tips () are positioned adjacent to one another, into a second position, in which the tips () are further apart from each other than in said first positions and are separated by a gap (G) for receiving at least a portion of the sample (S) to be held, and wherein said tips () are designed to penetrate the sample (S) or to press against it so as to hold it when the sample (S) is received by said gap (G) and the holding members () are moved back from the second positions into the first positions.

Sample holder for holding a sample for use with an atomic force microscope

The present invention relates to sample holders for holding a sample, particularly for an atomic force microscope. Such a sample holder comprising a sample dish () comprising a bottom (), and an opening () arranged in said bottom () for receiving and holding the sample (). Furthermore the present invention relates to a sample holder system and to a method for transferring an e.g. biological sample () from a biopsy tool () to a sample holder.

Sample holder for an atomic force microscope

The present invention relates to a method for controlling a scanning probe microscope having a probe () with a tip () for interacting with a sample (), and a nanoscanner () for retaining the sample () or the probe (), comprising the steps of monitoring the extension of the piezo element () along a first direction (R) along which the tip () is moved towards the sample (), and adjusting the level of the probe () along the first direction (R) by means of an additional actuator (), when the nanoscanner () exhibits an extension below or above a threshold value. The invention further relates to a device () for controlling a scanning probe microscope.

Method and device for controlling a scanning probe microscope

The present invention relates to a method for classifying a tissue biopsy sample obtained from a tumor, comprising determining a plurality of stiffness values for said sample by measuring a plurality of points on the sample with a spatial resolution of at least 100 &#x3bc;m and assigning the sample to a probability of malignancy. A sample showing a unimodal stiffness distribution is assigned to a high probability of being non-malignant, and a sample showing an at least bimodal stiffness distribution is assigned to a high probability of being malignant, wherein said stiffness distribution is characterized by a first peak exhibiting an at least two-fold higher stiffness value than a second peak. The present invention further relates to a system for classifying a tumor tissue biopsy sample.

Method for staging cancer progression by AFM

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Basel, Switzerland

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