Siemens Aktiengesellschaft

Simage Oy

Icare Finland Oy

Goldpower Limited

Medinoa Oy

Markku Eräluoto

Konstantinos E Spartiotis

Stefan Jurthe

Hanna Kuusisto

The ophthalmic apparatus is aligned to an eye to be examined. The apparatus is used to examine the eye. It has two or more infrared or near infrared light sources for emitting light beams and a detector sensitive to infrared or near-infrared light with the capability of detecting the light reflected from the examinee's face. It registers the examination result of the eye examined. The ophthalmic apparatus is aligned to an eye to be examined. The light beam of one infrared or near infrared light source is directed to the face. The light beam of another infrared or near infrared light source is directed to pass the examinee. The direction of the light reflected from the examinee's face is detected and the examination result and the examined eye are registered to know whether the examined eye was the right eye or the left eye.

Ophthalmic apparatus and method for measuring an eye

An imaging device () for scan-imaging radiation includes an imaging cell array () comprising an array of detector cells generating charge in response to incident radiation () and an array of pixel circuits each pixel circuit associated with a respective detector cell. The pixel circuit includes circuitry for accumulating plural radiation hit on an associated detector cell and transfer circuitry shifting upon command the accumulated value of all pixels by one step in one dimension (e.g., row by row). The imaged object () moves at a speed V() with respect to the radiation source and the imaging detector (or source and detector move at &#x2212;Vwith respect to the object) on which the accumulated values are shifted are with V(). Vmay equal Vin value and direction. Thus, a value is accumulated in a moving information package using multiple pixels () and referring directly to a location on the moving object. The accumulated values are read out along one edge of the pixel array. An image is reconstructed in () and displayed in ().

Imaging device

An imaging system for high energy radiation direct conversion scan imaging includes a high energy radiation source and a semiconductor high energy radiation direct conversion imaging device arranged around an object position. The imaging device includes a plurality of imaging cells, each imaging cell comprising a detector cell and a readout cell for producing imaging cell output values representative of high energy radiation incident on the detector cell. The source member and/or the imaging device were arranged to move substantially continuously relative to each other for scanning an object at the object position. The readout cells are operated to read out the imaging cell output values at time intervals which substantially correspond to an object image point traversing half the distance of a detector region or cell in the scanning direction. Such a configuration provides for pixel level resolution during the scanning operation.

Radiation imaging system, device and method for scan imaging

A radiation imaging assembly includes a radiation imaging detector (160) including a plurality of image elements from which respective signals may be produced and a plurality of contacts for outputting said signals. A first substrate (154) is provided which comprises first and second major surfaces, said first major surface supporting said radiation imaging detector and providing support contacts for cooperating with respective contacts of said radiation imaging detector when mounted on said first surface. A second substrate for supporting electronic circuitry operable for said imaging device tile is also provided, said second substrate (158) disposed opposing said first substrate, and preferably disposed within the footprint of the first substrate.

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Espoo, Finland

Markku Eräluoto