Next Biometrics Group Asa

Mark William Naumann

King Hong Kwan

Tian Xiao

Sheng-Hsiang Hung

Jamie Lyn Shaffer

Systems and methods for manufacturing flexible electronics are described herein. Methods in accordance with embodiments of the present technology can include disposing electrical features, such as thin film circuits, on a first side of a glass substrate, applying a first protective material over the electronic features, and exposing a second side of the glass substrate to a chemical etching tank to thin the glass substrate to a predetermined thickness. The thinning process can remove cracks and other defects from the second side of the glass substrate and enhance the flexibility of the electronic assembly. A second protective material can be disposed on the second side of the thinned glass substrate to maintain the enhanced backside surface of the glass substrate. In some embodiments, the method also includes singulating the plurality of electronic features into individual electronic components by submerging the electronic assembly into a chemical etching tank.

Systems and methods for manufacturing flexible electronics

Systems and methods for detecting replay attacks on a biometric-based authentication system are disclosed herein. In some embodiments, the method includes generating a command set causing a fingerprint sensor to sequentially conduct a scan of pixels in the fingerprint sensor, wherein the command set includes one or more replay attack detection commands causing the fingerprint sensor to capture replay attack detection data, sending the commands to the fingerprint sensor, receiving fingerprint data, and evaluating the fingerprint data for the replay attack detection data. In some embodiments, the one or more replay attack detection commands include repeating the scan of a selected row of pixels, providing insufficient bias to a selected row of pixels, and/or providing too much bias to a selected row of pixels. In some embodiments, the replay attack detection commands are randomly generated for each scan. Various other aspects of the technology are described herein.

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Los Gatos, CA, United States of America

Mark William Naumann