Oclaro (north America Inc.)

Corning Incorporated

Mark Summa

Peter Gerard Wigley

Timothy Kent Zahnley

Douglas Llewellyn Butler

Aravanan Gurusami

Ghang-Ho Lee

Robert David Paul Ridding

Martin Richard Williams

Christopher Lin

Gregory E Williams

Seungcheol Yang

Marlene A Marro

Jiaxiang Zhang

Souma Chaudhury

Lan Sheng

Aaron Zilkie

William E Schmitt

Douglas Lleweilyn Butler

Apparatuses and methods are described for detecting inclusions in glass. The apparatuses and methods employ a laser that is configured to project a laser sheet at a first angle from one side of a glass sheet, and a camera configured to capture images from a second angle from another side of the glass sheet. The glass sheet is moved thorough the laser sheet while the camera captures images. One or more processing devices execute image processing algorithms to identify areas of the glass sheet containing inclusions based on the captured images. In some examples, the identified areas of the glass sheet are revisited to confirm they contain inclusions.

Laser based inclusion detection system and methods

A tunable dispersion compensator (TDC) is tuned from a first dispersion setpoint to a second dispersion setpoint while maintaining continuity of the dispersion. The dispersion tuning follows a pre-determined trajectory in the time domain, so that continuity of the optical dispersion across the channel optical bandwidth is maintained while minimizing all other TDC-induced optical impairments during a tuning period.

Tunable dispersion compensator configured for continuous setpoint control

Described is a method for designing individual stages of a multiple cascaded etalon TDC device to allow continuous thermo-optic tuning over a desired range without inducing incremental signal distortion due to uncontrolled and unpredictable dispersion of the TDC during tuning. This allows the signal to transmit without encountering periods of incremental distortion or dark spots. The method includes prior knowledge of each etalon stage, after full assembly, for spectral group delay profile as a function of temperature through modeling and/or characterization. Characterization can account for performance variations that are due to allowed manufacturing tolerances.

Continuously tunable optical dispersion compensation synthesizers using cascaded etalons

One embodiment sets forth a technique for measuring chromatic dispersion using reference signals within the operational range of amplifiers used to refresh data signals. One red/blue laser pair in the transmission node is used for measuring dispersion and chromatic dispersion compensation is added at each line node in the system. Since reference and data signals propagate through each amplifier, the reference signals used to measure chromatic dispersion receive the same dispersion compensation (and will have the same residual dispersion) as the data signals. Therefore, any residual dispersion in the data signals will manifest itself in downstream dispersion measurements and, thus, can be corrected. The tunable dispersion compensator in each line node may be set to compensate for the measured dispersion, thereby compensating for both the chromatic dispersion of the link connecting the current node to the prior node and any uncorrected residual dispersion from prior nodes.

System and method for tunable chromatic dispersion compensation

An apparatus for measuring polarization dependent loss is disclosed featuring several fiber optic couplers combined in tandem and oriented such that the PDL noise of the measurement system is reduced to a negligible level. By matching the PDLs of the couplers and vectorally subtracting opposite phases of polarization, the PDL of the measurement system is virtually eliminated. Thus, the PDL noise floor is lowered to near zero and the PDL of the optical device-under-test (DUT) can be accurately measured. The system is relatively inexpensive to implement and offers needed versatility because it measures the PDL of optical devices that operate in a reflection mode or in a forward transmission mode. Thus, it provides one PDL measurement solution for both types of devices.

Apparatus and method for measuring polarization dependent loss

Growing community of inventors

Painted Post, NY, United States of America

Mark Summa