Freescale Semiconductor,inc.

Nxp Usa, Inc.

Mark Stachew

Douglas Alan Garrity

Xiankun Jin

Mariam Hoseini

Jeffrey Thomas Loeliger

Analog-to-digital conversion is tested in-field using an on-chip built-in self-test (BIST) sub-circuit formed within an underlying integrated circuit. Processing cycles may be conscripted during an idle state when the analog-to-digital conversion is not needed. The BIST requires a test time which may be compared to an idle time. If the idle time exceeds the test time, then the BIST may be entirely performed. However, if the idle time is unknown or less than the test time, the BIST may be paused and resumed between subsequent idle states.

Built-in self test for A/D converter

A sigma-delta (&#x3a3;&#x394;) analog-to-digital converter (ADC) comprises a main &#x3a3;&#x394; modulator configured to receive an analog input signal at a main &#x3a3;&#x394; modulator input and to provide a main digital output signal representative of the analog input signal and an auxiliary &#x3a3;&#x394; modulator configured to receive an auxiliary input signal at an auxiliary &#x3a3;&#x394; modulator input and to provide an auxiliary digital output signal, wherein the &#x3a3;&#x394; ADC comprises a shared integrator stage, the shared integrator stage is configured to be used by the main &#x3a3;&#x394; modulator and the auxiliary &#x3a3;&#x394; modulator, wherein, alternatingly, the shared integrator stage is selectively communicatively coupled to receive the analog input signal when configured to be used by the main &#x3a3;&#x394; modulator and selectively communicatively coupled to receive the auxiliary input signal when configured to be used by the auxiliary &#x3a3;&#x394; modulator.

Dual sigma-delta analog-to-digital converter

A method and apparatus are configured to receive at a control input of an analog to digital converter (ADC) circuit, from a control output of a control circuit, a first instance of control information that indicates a conversion characteristic of the ADC, wherein the conversion characteristic is one of a first conversion rate and a first conversion resolution, to provide at a status output of the ADC status information regarding the conversion of a first analog signal by the ADC circuit, to receive at the control input of the ADC a second instance of the control information that adjusts the conversion characteristic to allocate a first portion of an ADC circuit bandwidth of the ADC circuit to continuing receiving the first analog signal and to allocate a second portion of the ADC circuit bandwidth to receiving a second analog signal.

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Austin, TX, United States of America

Mark Stachew